PXI Functional Test
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Product
Test Patterns
DisplayMate Multimedia Edition
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DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
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Product
Test Contactor
cDragon
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cDragon™ Test Contactor pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.The homogenous MEMS elastomer-free multi-beam pin delivers long life and high wear resistance. By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.
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Field Testing
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When Laserline delivers a customer-specific solution, it makes sure that it fulfills every demand in the practical field. And that is because every newly designed customer solution is extensively tested in our own application laboratory and has passed comprehensive stress tests. These tests are made in close consultation with our customer as well. In this way, it is guaranteed that the demands are correctly identified and addressed with respect to practice.
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Product
PXIe Multi-Channel Function Generator Module, 24-Channel
43-625-002
Function Generator
The 41-625-002 (PXI) and 43-625-002 (PXIe) are function generator modules that provide 24 channels in a single PXI/PXIe slot. They can generate sine waves to 300 kHz with 5.76 mHz frequency resolution referenced to the 10 MHz PXI clock. The output voltage range is up to +/-25 V in a 16-bit resolution. It also support PXI trigger functions allowing events from other instruments to initiate waveform generation or sweeps.
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Product
Pre-Certification Testing
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Gain confidence that your product passes certificationVerify your product qualityTest specific areas
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Product
Test systems
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MG Products can supply a variety of test systems. These include the Extended Boundary Scan Test from JTAG Technologies, the functional test equipment integrated into a table or high configuration from Unites systems or the Cabinet Modular Test solution (CMT). We offer the right solution for every test setup.
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Product
EMC Testing
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Does your product send or receive electromagnetic data? This can be analyzed using various tests. We investigate the interference immunity and emitted interference of simple electrical devices and complex machinery. Our EMC measurements and tests conducted in accordance with standards recognize all activity in the electromagnetic field and ascertain how immune to interference a piece of equipment is. We will also offer guidance on optimizing the product in terms of its EMC properties during the development phase.
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Product
PXI Attenuator
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Keysight offers step attenuator modules that operate across a broad frequency range of DC to50 GHz.
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Product
Electrical Testing
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Board defects are never an option. Your customer expects perfect boards, each time, every time. Electrical testing is the key in ensuring that the connectivity of a PCB is precisely as specified and that there are no defects or flaws that may cause problems down the line.
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PXI Waveform Generators
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Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard.
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Product
Multi Function Coil Tester
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This device tests all ECU control, electronic control, or conventional distributor type ignition coils. The Tester comes with a range of connection cables with terminals to suit the majority of 2-wires, 3-wires, or 4-wires Ignition Coil of various car makes. The Ignition Coil Test is designed to detect the faults in the ignition system and whether there is any occurrence of misfire in a sluggish engine.
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Product
Impact Testing
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Educated Design & Development, Inc.
1250 g body includes release mechanism and striking element guide.250 g striking element comes with cocking knob and hammer head, polyamide face, is hemispherical with a radius of 10 mm, has a hardness of HR85-100.60 g release cone with a 10N release force.Single Impact Force models range from a 0.2 J Hammer to a 2.0 J Hammer.Custom padded carrying case included.
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Product
Test Enclosures
Enclosure
The HV test hood, developed by us in accordance with EN50191 standard (erection and operation of fixed and temporary electrical test installations), is designed for testing large quantities in ongoing production. The ergonomic design ensures fatigue-free operation even during repetitive work sequences. Equipped with all safety-relevant functions, such as safety switch and locking of the hood cover during the test sequence, the operator is optimally protected at all times.The interchangeable adapter plate within the test cell allows quick adaptation for different test conditions and test situations.
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Product
Functional Testing
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We are flexible to match your approach, whether you are using Agile or traditional development methodologies. We can work with your requirements and test cases, or perform exploratory testing. We can provide 100% of your software testing, or supplement your internal team. Independence and creativity are key elements to find issues to help your software developers create high quality software.
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Product
8-Channel, 200 kS/s, 16-Bit DAC Function Card
ProDAQ 3511
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The ProDAQ 3511 DAC function card is a high-density card that fits into ProDAQ VXIbus motherboards and LXI function card carriers. This high-density card contains eight independent 16-bit DAC channels. Each channel is equipped with its own DAC. Users can update the output of each DAC with up to 200 kS per second either directly via software command or from an onboard FIFO.
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Product
P-GW Functional Tester
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The LTE PGW Functional Tester provides a wrap-around test solution for the Packet Date Network Gateway by emulating all the LTE network elements surrounding the PDN-GW (System Under Test). The P-GW Functional Tester emulates LTE Core Network entities such as the S-GW, PCRF, OCS and OFCS. It tests the S5/S8, S7/Gx, Gy and Gz interfaces of the P-GW.
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Product
Safety Testing
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KTL Safety Group is fully accredited to meet the growing needs for worldwide safety testing and compliance and provides: Safety testing and certification of electrical and electronic equipment to international and European safety standards, Pre-compliance evaluations that identify problem areas early in the design stage, to reduce the need for potentially expensive modifications.
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Pressure Testing
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Types of Pressure Testing Performed at GTS:*Hydrostatic Pressure Testing*Leak Pressure Testing*Burst Pressure Testing*External Pressure Testing*Pressure Testing at Temperature Extremes*Vacuum Pressure Testing*Differential Pressure Testing*Cyclic Pressure Testing
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Product
Testing Services
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DTB is the largest independent testing laboratory in the United States with a full spectrum of testing services all under one roof. We provide a wide range of environmental, dynamics and vibration, EMI/EMC, ballistics, optical, ordnance release, and safety and survival testing.
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Product
FAult Detector and OScilloscope 7 Functions in 1 Device
FADOS7F1
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Prot-Ar-Ge Industrial Project Design R&D Ltd. Co.
Usage of FADOS7F1: Determining faults of all types of electronic cards such as electronic cards of medical devices, textile and any other machines; automobile electronics; computer, monitor, TV, etc. Electronic Components Test: IC, transistor, FET, IGBT, resistor, capacitor, indicator, ect. This device is used to determine the faults at all these electronic components.
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Vibration Testing
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Automobiles, electronics, heavy equipment, home appliances and more…consumers want dependability and manufacturers need to deliver quality. The need to comprehensively test components and systems for shock and vibration resistance can often be the key to long-term product success. Trialon’s experienced team will be your partner to provide complete satisfaction throughout the product validation process.
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Test Prods
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Test prod with 4mm plug, test prod with 2mm pin, safety test prod, test prod 2mm, test prod 4mm, miniature test prod.
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Product
Pack Testing
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PEC offers a 600V-600A and a 1000V-500A system with either 1 or 2 channels. The systems are programmable using the standard PEC LifeTest application, offering a user-friendly environment for configuring and analyzing drive cycles and other energy storage simulations.
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Application Testing
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Applications have become a critical component of our daily work and personal lives. From office productivity software to mobile and other consumer applications that enrich our lives, we have become increasingly dependent on their on-demand availability. Creating and deploying a robust application architecture requires extensive planning and testing.
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Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
Reliability Testing
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ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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Product
3 Function Slot MOSA Nano Data Concentrator Unit (DCU)
NIU3A-DCU-01
Data Concentrator Unit
NIU3A-RDC-01 is a Modular Open Systems Approach (MOSA) Data Concentrator with low power high performance ARM Cortex -A53 processing. 8 GB RAM, 32 GB SATA Flash, 2 x 10/100/1000Base-T Ethernet.
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Product
6U PXI Multi-Channel Analog I/O PXI Card
GX3348 Series
Digital I/O
The GX3348 is a multi-channel analog I/O 6U PXI card which provides (3) programmable sources, a ground source connection, a pulse / square wave generator (A version only) and a 4 x 48 or 4 x 64 matrix - allowing the user to route the 3 sources, or ground to any of the 48 or 64 I/O channels. In addition, each I/O channel can be connected to a 16-bit A to D converter, providing DC voltage measurement capability for each channel. The module also offers (8) static digital I/O for controlling / monitoring a UUT's digital signals.
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Microwave Testing
170
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The PICOPROBE® MODEL 170, a high performance microwave probe which incorporates a WR-6 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
