Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Sensor Scene Modeling and Analysis Software
INSSITE
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INSSITE is a sensor scene modeling and analysis environment. Different sensor types and modalities, spanning radar (synthetic aperture radar [SAR], ground moving target indicator [GMTI], detection and ranging, radio frequency [RF] communications), visible/infrared (passive electro-optical/infrared [EO/IR], laser radar [ladar], thermal IR), can be evaluated against high fidelity scenarios constructed by the user.
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Impedance Analysis
S96041B
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Make impedance analysis measurements of Surface Mount Device (SMD) components on the E5080B vector network analyzer with 16198A-010 10 GHz SMD test fixture.
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Fat Analysis
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Unlike standard x-ray systems which use a single x-ray energy spectrum to scan products, DEXA technology uses two energy spectrums to discriminate between high and low energy x-rays. A patented software algorithm uses the differential x-ray energy absorbance of these two energies by the meat to determine the fat content.
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Environmental And Analysis
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We make products and technologies for analysis in safety, life sciences and environmental markets. We operate in three principal markets.Spectroscopy and PhotonicsWe create world-class spectrometers and spectral imaging systems that are used to determine the nature of a target. Our products are used to both transport and characterise light.
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Gas Analysis
Si-CA 130
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The Si-CA 130 features a touch-screen display and comes with PC-based management software (in addition to the smartphone app) for more in-depth combustion gas analysis. The three field-replaceable cells and sensors offer expanded measurement capability.
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3D Surface Texture Analysis Software
TrueMap 6
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Rendering styles: solid, wireframe, wireframe + pointsFull control of surface lighting, including direction, and ambient shadingRendering options including side walls, grid lines, and countour linesEdit the z exaggeration to help visualize surface deviationsRender the axes labels relative to the surface mean, maximum, minimum, or unchanged from the values stored in the fileRender the surface using a gradient to represent the surface heights, or use a solid color, or even use the true color values from the data file if they are availableMultiple options for gradients and even an optimization feature to use the height distribution
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In-depth Execution Time Analysis For Critical Software
RapiTime
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*Timing analysis (inc. WCET) for Ada, C & C++ on-target & host**Identify code to optimize for worst-case behavior*Debug rare timing events*Simplify verification through integration with your CI tool*Produce evidence for DO-178 and ISO 26262 certification
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Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Wafer Sort
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TestEdge offers complete wafer sort solutions. Our range of wafer sort capabilities demonstrates our ability to handle a wide range of devices and device characteristics. State of the art Electroglas probers Sort experience with high probe count Less than 4 mil pitch on probes Experience with C4 Bump and Aluminum pad Experience on Bipolar, CMOS, GaAs, & SiGe Overhead sort or cable harness sort Microsite testing capability
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Safety Analysis
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Ensure System Safety and Cybersecurity. Dramatically decrease analysis efforts with efficient application of quality, safety, reliability and cybersecurity analysis methods at the system, item, software, hardware and PCB levels.
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Spectrum Analysis For P50xxB Up To 20 GHz
S970904B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Seismic Analysis and Monitoring
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Seismic analysis and monitoring have been designed on the base of the contemporary seismic studies. We can offer you a wide range of tools for geophysical surveys, seismic tomography, automated monitoring of bearing structures (structural health monitoring), seismic monitoring of oil piping systems.
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Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
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*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
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Signal Analysis
FFT Analysis
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The program FFT (Fast Fourier Transform) Analysis is used for narrow-band spectral processing of signals coming from the input channels of ADC modules and FFT spectrum analyzers (in real-time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Field Portable NIR Spectrometers For Mineral Identification And Analysis In Mining Exploration
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With Spectral Evolution field portable NIR spectrometers and EZ-ID mineral identification software, geologists can measure and identify minerals within seconds and cover more ground than by using traditional methods. They can identify different mineral phases, create mineral alteration maps and more accurately identify mineral pathfinders for vectoring to ore deposits. Spectral Evolution's field portable, battery-operated oreXpress, oreXplorer and oreXpert ultra-high resolution NIR spectrometers are designed for mineral identification in mining exploration. The oreXpress, oreXplorer and oreXpert provide quick payback with faster, more accurate mineral identification in exploration for gold, silver, diamonds, iron, nickel, copper, uranium, aluminum - in the field, core shack, or in the lab, and provide:
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Spectrum Analysis For P50xxB Up To 9 GHz
S970902B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Component Test and Analysis Laboratories
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The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Complete Power Quality Analysis System
PK4564-PRO
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This system contains the all recommended equipment for almost any power quality study in the world. Other tiers in the PK4564 class include the base PK4564 and PK4564-PRO+ systems.
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Fully Automatic 4 Point Probe System for Silicon Wafer
WS-8800
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*Measurement of resistivity, thickness, conductivity(P/N) and temperature*Tester self-test function, wide measuring range*Thickness, measurement position and temperature correction function for silicon resistivity*Number of cassette station can be changed by customers request*Host (CIM) communication and SMIF or FOUP compatible
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Recording and Analysis Software
DataVu-PC
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DataVu-PC analysis software is specifically designed for record and playback applications and makes short work of searching through large datasets for any signal of interest. You can use triggers to start recording, minimize storage requirements using windowing, and automate your signal search with tools like frequency mask, pulse descriptor words and smart markets.
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Log Analysis Reporting Suite
Cyfin
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Cyfin is a customizable employee Web-use forensic log file analyzer and reporting solution. It is used by a variety of business and government organizations around the world. Scalability - Most scalable commercial log data analysis tool. Forensics - Capable of generating extremely detailed user audit reports. Comprehensive - Dashboard charting and trending system. Compatibility - Palo Alto, IronPort, SonicWall, WatchGuard, and many others. Regulatory Compliance - Covers requirements such as CIPA, HIPAA, & others.
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Error Distribution Analysis Package For M8000 Series BER Test Solutions
M8070EDAB
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The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070EDAB Error Distribution Analysis package offers features like burst mechanism detection and analysis, frame loss ratio estimation and error mapping.For instance, you can easily estimate your FEC decoder margin or find the root cause of systematic errors by exploring the error map. The plugin also supports the use of real-time scopes as error detector.
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Audio Analysis
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The MCD AudioAnalyzer is used to test and calibrate analog and digital sound systems, or it can be used to convert analogue audio signals into digital form and vice versa. Also, the conversion of optical to electrical S / PDIF signals and vice versa can be done. The MCD AudioAnalyzer combines software (Toolmonitor MCD AudioAnalyzer) and hardware for the analysis and generation of analog and digital signals in the audio area.
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Cross-Spectrum CPB (Constant Percentage Bandwidth) Analysis
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CPB analysis is used for fractional octave spectral processing of signals coming from the input channels of FFT spectrum analyzers (in real time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals. CPB analysis is used for separating signals into basic constituents in the frequency area in 1/3-, 1/12-, 1/24-octave spectral bands. The software is used for noise spectral analysis within the scope of acoustic and vibrational measurements.
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Surface Analysis
Dimension AFP
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The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Rotating Machinery Analysis
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The Rotate software package is part of the m+p Analyzer Software for noise & vibration measurements and analysis. It provides a wide range of data acquisition and analysis tools for capturing and understanding noise and vibration induced in rotating and reciprocating machines by their motion. Fixed and variable speed machines are accommodated as are both structural vibration and condition monitoring diagnostics. Multiple tacho inputs can be processed for accurate speed tracking during analysis. Spectral mapping, order tracking, time history and orbit data analysis are all available.
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Spectrum Analysis, Up To 50 GHz
S930905B
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The S930905B spectrum analysis adds high-performance microwave spectrum analysis to the N522xB/N523xB/N524xB PNA network analyzer family up to 50 GHz.
