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RF-Antenna Communication Links Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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High-performance multifunctional AC Power Supplies (CV/CF)
PCR-LE Series
The PCR-LE Series is a new line of advanced multifunctional AC power supply that has been developed from our PCR-L/LA Series (linear amplifier type). The PCR-LE Series provides high reliability and can be applied to various applications, by taking advantage of the features that can control broadband waveform freely. Moreover, the PCR-LE Series can be configured as a core device of a test system combined with E-loads and Power Analyzers for “Grid Connection Testing” in regard to dispersed power generation, such as Solar Power, Wind Power, Fuel Cell, and Gas Engine referred to as “New Energy Field”. With various options, the low frequency immunity test and various power enviroment tests are supported. The options for parallel operation and three-phase operation enable you to expand a single-phase system up-to 27kVA, single-phase three wires up-to 54kVA, and a three-phase system up to 81kVA. The system can be applied to a large-scale EMC site for testing of industrial high-capacity air conditioners.
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Codeless Test Automation
Run automated end-to-end test scenarios directly on a Smart TV, set-top box or Xbox. Works with any retail infrared based device. Suitest can utilize devices located anywhere in the world for interactive sessions or automated parallel test execution. Enjoy test automation with our state-of-the-art visual test editor. Utilize JavaScript snippets for complex automation scenarios.
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Multi-Channel UT
Pilot
Pilot is a next generation multi-channel UT device. Its one-of-a-kind specifications make the Pilot capable to perform advanced ultrasound inspections. Pilot is unique in its capacity to meet the most demanding needs of various industries, from aeronautics (employing composite and honeycomb structures) to in-line, as well as TOFD and many other applications with stringent requirements. Compact and powerful, this 8-channel full parallel, or up to 64 multiplexed, unit pushes the boundaries of the UT benchmark as it is more efficient than any other conventional UT system in the NDT market.
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6/12/24/36V Conductance Battery Tester
MBT300
Tests 6/12/24V lead acid batteries individually or in parallel and series battery packs. Displays battery or battery pack condition as % available capacity, rated capacity (CCAs), state of charge voltage, and good or replace status. Tests 6/12/24/36V starter and charging systems including starter draw, alternator and regulator output (loaded/unloaded), and diode ripple.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Low-Temperature Impact Device
DWC-1
This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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Thyristor Surge Suppressor (TSS)
When protecting parallel (double) circuit transmission lines, devices have two main functions in transient mode: clipping the voltage and drifting the current due to overload.
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FPGA-Based Ultra-Fast Flash Programmer
XJFlash
XJFlash is an FPGA-based advanced and innovative method that uses JTAG for high-speed in-system programming (ISP) of flash memories – all serial and parallel flash devices are supported. The most common use of XJFlash is programming the SPI/QSPI NOR flash used to configure an FPGA.
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Voltage Output D/A Converters
Analog Devices offers a large family of resistor string and R-2R voltage output (VOUT) D/A converters (DACs). From 8 bits up to 20 bits of resolution, single to 40 channels, integrated or external reference, parallel, LVDS, serial SPI or I2C interface, with high temperature operation, we have a D/A converter to suit your application. We provide precision, buffered, and unbuffered rail-to-rail VOUT D/A converters with up to ±1 LSB INL and DNL specifications and excellent offset and gain error. Our D/A converters work well in a wide variety of open-loop or closed-loop systems—adjusting gain, offset, and many other signals.
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6U VPX FPGA Cards
Curtiss-Wright Defense Solutions
FPGAs have revolutionized the way digital signal processing (DSP) subsystems are configured. With a large number of gates, hardware multipliers, and high-speed serial interfaces, FPGAs enable sophisticated applications, including radar, signal intelligence, and image processing, which rely on repetitive processing that can be expressed in highly parallel form. FPGAs perform exceptionally well in FFTs, pulse compression, filters, and digital up/down converters.
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Real Time Monitor Interface
ANALYSIS 4N
It supports a management on the on-site equipment, such as to add subnets, to add subnet equipment, or to config equipment parameters, etc. Subnet fulfills the following applications: parallel communication, interaction with equipment, batch logging, downloading, configuration, ending, timing synchronization and system status viewing.
