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Product
EM Solver System Level Solver
EMA3D
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Electro Magnetic Applications, Inc.
MA3D is a powerful 3D numerical solution of Maxwell’s curl equations based on the time-domain finite-difference method in rectangular coordinates. The code has application to nearly any EM coupling, radiating, or interaction problem. EMA3D’s FDTD approach is the only EM tool capable of capturing the detail of entire aerospace or ground systems down to individual electronics interfaces in a computationally accessible manner. Computational advances and parallelization allow for fidelity once only dreamed possible.
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Product
Serial Parallel Interface
Model 2313
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* Provides 128 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Separate headers for RS-232 and RS-485 signals. * Optional 2313 Flat Ribbon Cables mount DE-9 male or female connectors on the rear panel. * Optional Relay Driver boards with 64 or 128 Relay Drivers.
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Product
Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
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Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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Product
256 Channel Power Supply
IDPS750
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Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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Product
Room Temperature Sample Holders
12962A
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The 12962A sample holder is designed to allow accurate impedance tests of solid materials to be performed at room temperature. The sample holder consists of two parallel electrodes, one of which is fixed in position and the other which can be moved into contact with the sample by adjustment of a micrometer. The sample holder makes use of guard ring and reference techniques in order to improve accuracy by reducing “fringing” effects at the edge of the sample. The standard electrode provided is 20mm diameter.
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Product
Programmable DC Electronic Load - (Economical)
63200E Series
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The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.
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Product
Power Supply, 80 V, 42 A, 3360 W
N8738A
Power Supply
Keysight's basic DC power supplies offer essential features for a tight budget. The Keysight N8738A is a 80 V, 42 A, 3360 W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage.
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Product
Automatic Span Gasgenerator Unit
ASGU-370 Series
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The multi point calibration units ASGU-370 series is designed for simultaneous (parallel) or step by step (serial) checking of gas analyzers. It is primarily installed in laboratories for quality assurance and is also used for the production of gas analyzers.Furthermore are the calibration units as a Transfer standard in portable suitcase available. Here we have for ongoing quality control in field the versions all in one aluminum suitcase and for a flexible and back-friendly wearing comfort the ASGU-370TS SPLIT.
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Product
LCR Meter, Hand Held, 100 kHz, 2 kH, 20000 µF, 0.2 Gohm
72-10465
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The 72-10465 from Tenma is a LCR meter in orange and grey colour. It features an easy to read dual LCD (40mm x 63mm) display measurement of 19999/1999 (main/auxiliary). It also has series and parallel measurement modes which can be used to select quality factor, loss factor, phase location angle and equivalent resistance of measure articles. Intelligent detection and five different test frequencies enable accurate readings for all sizes of capacitors and inductors. The user can also access the stored data on a PC with the included USB connection and interface software. The compact size and case make this unit far more portable than a benchtop meter.
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Product
Pattern Generator
PI-2005
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As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Product
96/48-CH Opto-22 Compatible PCI Express Digital I/O Cards
PCIe-7248/7296
Digital I/O Module
ADLINK"s PCIe-7248/7296 are high-density parallel digital I/O boards with 96/48 I/O channels. The header connectors are fully compatible with industry Opto-22 standard. Thus, PCIe-7248/7296 can utilize the Opto-22 external devices. The PCIe-7248/7296 devices emulate mode 0 of the industry standard 8255 programmable peripheral interface (PPI) chips. The PCIe-7248/7296 provides 4/2 PPI chips respectively. Each PPI offers three 8-bit ports: Port A, Port B and Port C. The Port C is divided into 2 nibble-wide (4-bit) ports. The PCIe-7248/7296 devices have programmable timer/counters. One 16-bit counter is available for event counting, while the other 32-bit timer is available for timed interrupt generation. The PCIe-7248/7296 devices provide multiple programmable interrupt sources from DIO channels, as well as the output of the timer.
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Product
6/12/24/36V Conductance Battery Tester
MBT300
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Tests 6/12/24V lead acid batteries individually or in parallel and series battery packs. Displays battery or battery pack condition as % available capacity, rated capacity (CCAs), state of charge voltage, and good or replace status. Tests 6/12/24/36V starter and charging systems including starter draw, alternator and regulator output (loaded/unloaded), and diode ripple.
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Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
Bidirectional AC Source / Sink With Regenerative Power Supply
EAC-4Q-KS
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*Single system from 15 kVA to 90 kVA and in parallel up to 500 kVA*Seamless transition between source and sink mode*Output: AC, DC, AC + DC*Output up to 2000 Hz (-HF option)*Add single-phase output (option -1P)*Up to 750 V LN output*Modular construction
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Product
Integrated Test Facility
ITF
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The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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Product
0 Hz/DC to 14 GHz, Single-Pole, Four-Throw MEMS Switch With Integrated Driver
ADGM1304
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The ADGM1304 is a wideband, single-pole, four-throw (SP4T) switch, fabricated using Analog Devices, Inc., microelectro-mechanical system (MEMS) switch technology. This technology enables a small, wide bandwidth, highly linear, low insertion loss switch that is operational down to 0 Hz/dc, making it an ideal switching solution for a wide range of RF applications. An integrated control chip generates the high voltage necessary to electrostatically actuate the switch via a complementary metal-oxide semiconductor (CMOS)-/low voltage transistor-transistor logic (LVTTL)-compatible parallel interface. All four switches are independently controllable. The ADGM1304 is packaged in a 24-lead, 5 mm × 4 mm × 0.95 mm lead frame chip-scale package (LFCSP).
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Product
Wafer Chucks
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ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
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Product
Serial To Digital Interface MiniBox™
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ICS's 2363 Serial Digital Interface provides a fully enclosed parallel interface that is suitable for benchtop or rack mount applications. OEM board versions available for inclusion in test chassis.
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Product
1.3 MP Custom Lens NIR Camera Module (Monochrome)
e-CAM10_CU0130_MOD
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The e-CAM10_CU0130_MOD is a 1.3 MP NIR Camera module (Monochrome) based on the Aptina / ON Semiconductor AR0130CS CMOS image sensor with S-mount lens holder attached to it. The AR0130 is a 1/3” Optical Form factor, Electronic Rolling Shutter CMOS sensor with enhanced sensitivity in the Near Infrared region and superior low light performance. The e-CAM10_CU0130_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM10_CU0130_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Product
Stand-Alone Test Fixture
MA 2012/D/H/VPC-G12x-18
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,50 kg
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 11,30 kg
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Product
Power Supply, 150 V, 34 A, 5100 W
N8760A
Power Supply
The Keysight N8760A power supply is a single output power supply in a small 2U package that offers essential features to fit your budget. The N8760A power supply offers flexible AC input options, analog / resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage.
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Product
Dual Surge Current Generator
MIG0624T-K12
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Designed for testing telecom surge protection devices according to ITU-T K12. The generator has two indepedent impulse outputs which allow testing of two and three terminal protection devices such as gas discharge tubes (GDT). The generator can be configured for two terminal devices or with the outputs in parallel to increase the current impulse for two terminal devices.
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Product
Camera Link Translators
CLT-303
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The CLT-303R and CLT-303L Camera Link Translators convert RS-422 & LVDS to Camera Link, enabling the use of cameras incorporating traditional RS-422 and LVDS parallel digital interfaces with Camera Link frame grabbers. The “R” and “L” versions support RS-422 and LVDS cameras, respectively. These Camera Link converters are extremely flexible and can convert a wide range of cameras from parallel digital output to Camera Link base configuration with up-to 24-bit data.
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Product
PXI Resistor Module Dual 16 Bit With 16XSPDT Relays
40-290-121
Programmable Resistor Modules
The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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Product
Battery Testing Machine
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Dongguan Kejian Instrument Co., Ltd.
Test method is to use test sample cell on a plane, a diameter of 15.8 mm (5/8 inch) rods on the cross placed in the center of the sample.one 9.1 kg or 10 kg weight from a certain height (610 mm or 1000 mm) fell to the samples.Cylindrical or square battery in accepting the impact test, the vertical axis parallel to the plane, vertical steel column longitudinal axis.The longest axis vertical steel column square battery, the bedding face perpendicular to the direction of impact, each battery only accept an impact test.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Digital Control Step Attenuator
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Digital control attenuators with TTL parallel control offering fast switching speed and high attenuation accuracy
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
LCR Meter
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*Rs, Rp, Cs, Cp, Ls, Lp, phase angle, Dissipation factor, Quality factor *Auto select series or parallel test mode *Auto select 100Hz/1kHz/10kHz test frequency, 0.5V rms approx. *Calibration
