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Product
Confocal FLIM System
DCS-120
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*FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Product
PXI Source Measure Unit
Source Measure Unit
PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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Product
Bipolar/FET/Diode Dual Head Production Test System
36XX
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Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
8 Channel 250 MHz 12-bit ADC/Digitizer
SIS3320-250
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8 channel 6U VME digitizer/transient recorder with a sampling rate of up to 250 MHz (for the individual channel) and 12-bit resolution. The board has a width of one VME slot (4TE). The boards multi event and readout in parallel to acquisition functionality make the card the choice for many demanding digitizer applications.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,30 kg
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Product
Test Database Software Module
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The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Third Harmonic Filter
HBF-T
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Lifasa - International Capacitors, SA
HBF-T filters are designed to block the 3rd harmonic, reducing the neutral currents in three-phase installations where there are installed harmonic generating loads connected between phase and neutral. It is basically passive filters based on a parallel combination of inductance and capacitor.
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Product
Bidirectional AC Source / Sink With Regenerative Power Supply
EAC-4Q-GS
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Single system from 30kVA to 500kVA and in parallel up to 2MVA and more. Galvanic isolation from the network. TFT touch display with simple menu navigation. Emergency stop in the front door. Indicator lights for operating status. Bidirectional current flow, up to 100% of the nominal output power can be fed back into the grid. Output voltage and phase angle adjustable per phase.
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Product
PMC-Parallel-485
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The PMC compatible PMC-Parallel-485 design adds 32 [RS-485 /RS-422] differential IO lines to one slot of your carrier board. 2 additional differential pairs are available for a clock & clock enable. The signals can be used to capture data with an external reference or programmed to be references for the rest of the system.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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Product
0 Hz/DC to 14 GHz, Single-Pole, Four-Throw MEMS Switch With Integrated Driver
ADGM1304
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The ADGM1304 is a wideband, single-pole, four-throw (SP4T) switch, fabricated using Analog Devices, Inc., microelectro-mechanical system (MEMS) switch technology. This technology enables a small, wide bandwidth, highly linear, low insertion loss switch that is operational down to 0 Hz/dc, making it an ideal switching solution for a wide range of RF applications. An integrated control chip generates the high voltage necessary to electrostatically actuate the switch via a complementary metal-oxide semiconductor (CMOS)-/low voltage transistor-transistor logic (LVTTL)-compatible parallel interface. All four switches are independently controllable. The ADGM1304 is packaged in a 24-lead, 5 mm × 4 mm × 0.95 mm lead frame chip-scale package (LFCSP).
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Product
High Performance Strip Handler
Rasco Jaguar
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Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.
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Product
C012 Communication Board
MS 1728/29
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- Suitable for standard desktops- Four channel in single board- Up to 10 Mbits/sec operating speed- Low Cost solution- Standard INMOS link protocol- Communicates with transputers- Converts between serial link and parallel bus- Tristate bidirectional bus interface- Memory mapped registers- Interrupt capability- TTL compatibility
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Product
Power Supply, 300V, 17A, 5100W
N8761A
Power Supply
The Keysight N8761A is a 300V, 17A, 5100W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage respectively.
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Product
Microwave Power Amplifier 1/4 Watt, 10 MHz to 40 GHz
GT-1040A
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The Spanawave/Giga-tronics GT-1040A Microwave Power Amplifier incorporates broadband MMIC-based architecture. These state-of-the-art amplifiers are based on solid-state parallel MMIC design with exceptionally wide bandwidth and high power. The unique circuit topology is highly reliable, with performance that excels where extremes of bandwidth and power are demanded.
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Product
DC Power Supply
◎PW-4063R
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*Use Toroidal Transformer. Low EMI & High EMS.*Triple output, 0-32V/0-6A X2 and 5V/3A .Max. 400Watts*Tracking operation. Max. output 64V/6A on tracking series or 32V/12A on tracking parallel.*4 display, Green LED shows Voltage and Red LRD shows Current. Easy to read.*Compact design. G.W. 9Kgs only. Easy to handle.*The resolution of PW-4063R as high as 0.01v and 0.001A.*Provide 4Pcs 10turns micro adjust VR for Voltage and Current adjustment. Easy to operate.*Very low Ripple & Noise, less than 0.4mVrms. Very suit for precise measurement.
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Product
Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
Digital I/O
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Product
Micrometers - Depth
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Is used to find the distance between two parallel surfaces i.e. depth of holes, slots, shoulders and projections.
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Product
Software Solutions
ZAP MULTIRUN
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The ZAP MULTIRUN allows parallel or sequential execution of the same script on multiple work stations and mobile devices. Using ZAP MULTIRUN test automation teams expedite time to execution multiplied by number of devices per given test runs.
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Product
PXI 8/16-Channel Isolated D/A Converter
M9185A
Digital / Analog Converter
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
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Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
756W to 1512W - Single Output
PF-A Series
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*Low Profile (0.5")*0.95 Power Factor*EN61000-3-2 Compliant*Parallel Operation
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Product
RZ Family of 64-Bit & 32-Bit Arm-Based High-End MPUs
RZ/A
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The high-performance RZ/A Series MPUs retain the ease-of-use of Renesas microcontrollers (MCUs), while combining Renesas' proprietary technologies and the Arm® ecosystem. RZ/A devices offer up to 10 MB of on-chip SRAM, which can buffer up-to WXGA resolution graphics without the need for external SDRAM. This capability is married with the device’s ability to execute code in-place (XIP) from QSPI flash, which greatly simplifies board design. Coupled with its high-bandwidth 128-bit wide parallel data bus, the RZ/A supports faster graphics, digital audio signal processing, device control, and more.
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Product
Programmable Power Supplies
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TDK-Lambda is a global supplier of Programmable power supplies with the most comprehensive standard offering of DC Programmable Power Supplies from 200W to 15kW with parallel capability up to 60kW. Outputs up to 1500V are available and there are various remote interface options including LAN, USB, IEEE, RS-232, RS-485, EtherCAT and Modbus-TCP along with Remote Analog Program/Monitor/Control capability.
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Product
Vision Measuring Projector
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Sinowon Innovation Metrology Manufacture Ltd.
◆ The lifting system adopts linear guide rail and precision screw drive, which makes the lift drive more comfortable and stable;◆ With precision toothless rod and fast movement locking device, ensure return error is within 2um;◆ High accuracy A optical scale and precision working stage, ensure machine accuracy is within 3+L/200 um;◆ HD zoom lens and HD color digital camera, ensure clear image without distortion;◆ With programmable surface 4-ring 8-division LED cold light and contour LED parallel illumination, it can control the brightness of the 4-ring 8-division independently;◆ With powerful iMeasuring2.1 software system , to enhance the control quality;◆ Optional imported contact probes and 3D measuring software, it can help upgrade the machine to be coordinate measuring machine;◆ Optional FexQMS measurement data analysis and real-time monitor software, enhance process control, reduce material consumption;
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Product
Programmable DC Electronic Load - (Economical)
63200E Series
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The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.
