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Product
Geometrical Measurement Software
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PRÜFTECHNIK Condition Monitoring GmbH
Activate your machinery more quickly, and help it run longer. PRÜFTECHNIK geometric laser alignment tools and software enable you to easily check and adjust your machine geometries for: straightness, flatness, level, inclination, plumbness, parallelism, and right angle check. Our tools are powerful, precise, and easy to use on a vast range of machinery—they can measure for the most demanding alignment jobs, including a bore of almost any diameter, and/or any surface type or inclination. Find the right geometric measurement tool for your machines.
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Product
Multi-Axis Laser Interferometer
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The award-winning XD Laser is a multidimensional laser measurement system that simultaneously measures all 21 degrees of freedom including linear, angular, straightness and roll errors for rapid machine tool error assessment. Measurements Include:- Rotational accuracy- Geometric error- Angular error- Flatness- Squareness- Parallelism
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Product
Stand-Alone Test Fixture
MA 2013/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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Product
Probe Cards
Direct Dock
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Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Product
MEMS And Sensor Test Automation Platform
Sense+
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Sense+™ ultra-precise MEMS & sensor test automation platform allows for significant improvement in test accuracy, parallelism for a lower cost of test, and the ability to handle and inspect, small delicate sensors. Fully configured, Sense+ delivers a one-pass automated test, inspection, and metrology for the most complex MEMS devices including <1 mm WLCSP.
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Product
Portable PD Diagnostics System
PD-TaD 60
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The PD TaD 60 portable PD Diagnostics system is used in combination with a BAUR VLF generator frida for carrying out partial discharge measurement and location.* Comprehensive 360° cable analysis – with parallel partial discharge and dissipation factor measurement* Time-optimised and safe cable condition evaluation* The lightest and most compact PD measuring device up to 60 kVpeak* Developed for portable use on site
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Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
Integrated Test Facility
ITF
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The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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Product
HPERC VITA 75 COTS Computers
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Sealed Extreme Rugged COTS computing platform in a tiny VITA 75 footprint, ideal for ground, air, and sea deployments. Based on Intel® Core™ i7 or Xeon® processors and optional GPGPU parallel processing engine. Easily configured application-ready platform for fast integration of custom rugged embedded applications. A wide array of fast IO provided on uniquely-keyed MIL-DTL-38999 connectors.
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Product
FLIM Upgrades for Leica
SP2 / SP5 / SP8
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*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Identical Systems for Multiphoton FLIM and Confocal FLIM*Detectors can be Swapped Between RLD Port and X1 Port*Systems are Modular: More FLIM Channels can be Added
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Product
COMINT Monitoring System
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A modern COMINT system can handle thousands of parallel signals. With a reliable and intuitive management software, the increased situational awareness creates a firm base for any decision making
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Product
Stability Tester
Litos Lite
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Litos Lite is a platform to perform parallel JV and stability measurements on organic, perovskite solar cells, perovskite/silicon tandem solar cells, and minimodules.
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Product
High-power Programmable DC Laboratory Power Supply (5kW~180kW)
FTP9000 Series
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Shenzhen FaithTech Technology Co., Ltd.
FTP9000 series DC power supplies provide wider voltage and current output range at full power, this means both low voltage/high current and high voltage/low current devices can be tested using a single power supply. The FTP9000 series offer a high power density, with 15 kW in a 3U chassis. The standalone power ranges from 5 kW to 180 kW, voltage ranges from 80 V to 2250 V, and current up to 6120 A. For ultra-high-power applications, FTP9000 series allow for master-slave parallel up to 10 identical units, maximum output 1.8 MW, with current automatically shared.
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Product
Data Acquisition I/O Boards
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General Standards Corporation is a leading supplier in data acquisition I/O boards, provides a complete family of data acquisition cards for sonar, industrial, and embedded applications on several form factors/busses, and for many operating systems. Functions available include analog I/O, serial I/O, and high speed parallel I/O.
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Product
DC Electronic Loads
LSG Series
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*Operating Mode : C.V/C.C/C.R/C.P/C.C +C.V/C.R + C.V/C.P. + C.C.*High Precision, High Resolution (10 A),High Speed Variable Slew Rate (16A/ s).*Sequence Function for High Efficient Load Simulations.*Parallel Connection of Inputs for Higher Capacity. (With 4 Booster Units : Max 9.45kW or 4 Master Units)*External Channel Control/Monitoring via Analog Control Connector.*Program Mode to Create Work Routines for Repetitive Tests.*Multiple-Interface : USB 2.0 Device/Host and GPIB/RS-232C.*Adjustable OPP/OCP/OVP Setting.
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Product
Flat Field and Imaging Gratings - Type IV
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type IV aberration-corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors.These gratings are produced with grooves that are neither equis-paced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
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Product
Serial to Parallel Controller
E84 SPC
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300mm equipment manufacturers utilize this off-the-shelf E84 communications controller to provide SEMI E84 compliant communications for their products. With its built-in Load and Unload algorithms it is the perfect E84 communications solution for process tools, stockers, load ports, FOUP buffers, smart storage shelves and simulation load ports. The E84 SPC easily integrates with equipment controllers through a standard serial communications connection.
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Product
Ultra-High Stability DC Power Supply
62075H-30N
DC Power Supply
The 62075H-30N output power has maximum 7.5kW/30V/250A power module designed with 4U height that can be connected easily as master or slave with three units to 22.5kW/30V/750A in parallel or two units to 15kW/60V/250A in series and operated as a standalone unit via system bus. The 62075H-30N provides stable DC output cur rent sour ce and powe r for pre c i s ion measurement. It offers an advanced 250A/30V ultra high-stable ±10 ppm (current stability ±1.25 mA) with high eciency and high power factor in compliance with energy savings. In addition it has a 20 bit digital control with bright vacuum fluorescent display readout.
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Product
MEMS Device-Oriented Testers
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Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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Product
Integrating Spheres
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Integrating spheres are used especially for measuring divergent light sources such as LEDs. The light is introduced through the input port, then reflected many times by the highly reflective interior of the sphere until it illuminates the inner surface uniformly. A detector samples a small fraction of this light to measure the total power input. Ophir integrating spheres have a highly reflective diffuse white coating for measurements independent of beam size, position and divergence. There are several sphere sizes, apertures and wavelength regions available. The large IS6 series has 2 configurations for measuring divergent or parallel beams.
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Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
VITA 57.4 FMC+ HSPC Loopback Card
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Samtec's VITA 57.4 FMC+ HSPC Loopback Card provides FPGA designers an easy to use loopback option for testing low-speed and high-speed multi-gigabit transceivers on any FPGA development board or FPGA carrier card. It can run system data or BER testing on all channels in parallel. This makes evaluation and development with an FPGA much easier and is an ideal substitute for 28 Gbps test equipment.
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Product
USHIO Blue Violet Laser Diodes (375nm - 405nm)
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The Optoelectronics Company Ltd
The USHIO HL40071MG is a single transverse mode 405nm laser diode which offers 300mW optical output power in a 5.6mm package with typical optical and electrical characteristics, (Tc=25 degrees C, cw), of 50mA threshold current, operating current of 280mA, operating voltage 6.0V, 6 degrees beam divergence parallel to the junction, 15 degrees beam divergence perpendicular to the junction, laser diode reverse voltage of 2V and operating temperature of 0 to +70 degrees C.
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Product
DC Power Supply
PW-3063R
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*Use Toroidal Transformer. Low EMI & High EMS.*Triple output, 0-32V/0-6A X2 and 5V/3A .Max. 400Watts*Tracking operation. Max. output 64V/6A on tracking series or 32V/12A on tracking parallel.*4 display, Green LED shows Voltage and Red LRD shows Current. Easy to read.*Compact design. G.W. 9Kgs only. Easy to handle.*The resolution of PW-3063R as high as 0.1v and 0.01A.*Very low Ripple & Noise, less than 0.4mVrms. Very suit for precise measurement.
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Product
Wi-Fi / Bluetooth / IoT Tester
MP5000
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High speed, high throughput tester for mass production, Turn key automation test software, 4 sites in parallel.
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Product
MEMS Microphone Test
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The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation microphones require highly accurate precision testing with SNR tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.
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Product
Contactless Wafer Geometry Gauge
MX 20x series
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The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
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Product
Multi-Channel UT
Pilot
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Pilot is a next generation multi-channel UT device. Its one-of-a-kind specifications make the Pilot capable to perform advanced ultrasound inspections. Pilot is unique in its capacity to meet the most demanding needs of various industries, from aeronautics (employing composite and honeycomb structures) to in-line, as well as TOFD and many other applications with stringent requirements. Compact and powerful, this 8-channel full parallel, or up to 64 multiplexed, unit pushes the boundaries of the UT benchmark as it is more efficient than any other conventional UT system in the NDT market.
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Product
Software Solutions
ZAP MULTIRUN
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The ZAP MULTIRUN allows parallel or sequential execution of the same script on multiple work stations and mobile devices. Using ZAP MULTIRUN test automation teams expedite time to execution multiplied by number of devices per given test runs.
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Product
Beverage Analysis
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Analyze multiple quality control parameters of your beverages in parallel, within 3 to 5 minutes only. See all parameters on a bright, easily customized 10.4’’ touchscreen display. Anton Paar’s modular beverage analysis solutions are quickly adapted to your needs in a Plug and Play fashion. In any case, the sample filling and measurement process is completely transparent and traceable.
