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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Pulse Modulator IM-20
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*Wide Frequency Range: 10 MHz...20 GHz*High Pause Power Mitigation: ≥ 70 dB*Signal Radio Impulse < 10 ns*Parallel Data Input*Input/Output Modulator Ports
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Product
Ultra-High Resolution Spectrometers
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Fabry-Pérot interferometers are optical resonators used for high-resolution spectroscopy. They use the phenomenon of multiple-beam interference that results when light shines through a cavity bounded by two reflective parallel surfaces. When the light hits one of the surfaces, some is transmitted out, and the remaining part is reflected back. Fabry-Pérot produces a circular fringe pattern, similar to the Michelson pattern. However, the fringes are thinning, brighter, and more widely spaced. As a result, these instruments are able to detect and resolve the fine features of a transmission spectrum with high precision.
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Product
Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
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Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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Product
"Soft Grid" and Parallel Operation AC Generator Excitation Regulator
svrsp
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The Kinetics model SVRSP Exciter/Regulator rectifier is designed and rated in capacity and operating parameters for the application of exciting the DC fields on an AC generator operating in parallel with other AC generators and the power system is a "soft system" in relation to loading. A "soft system" is a generating system that may not be able to sustain the rated AC voltage under impulse/step loading conditions and results in voltage reduction when tan impulse/step load is applied.
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Product
OD And Light Transmittance Meter
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Shenzhen Linshang Technology Co., Ltd.
A series of light transmittance testing instruments provided by Linshang Technology include a light transmittance meter LS116 with a parallel light path design, a optical densitometer LS117 with a diffuse transmission principle, and a split type light transmittance meter LS110 that measures the car front windshield. The light sources used in these light transmittance meters comply with the CIE photopic luminosity function.
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Product
Digital LCD Display Drivers
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Analog Devices DecDriver® family of digital LCD display drivers helps meet the increasing demand for higher resolution displays in home entertainment and home theater. This portfolio of products offers improved power, enhanced image quality, and lower costs, and has been optimized for a wide range of displays and performance needs. Our digital LCD display drivers operate over the commercial temperature range of 0°C to 85°C and include features such as a flexible digital input format that allow the devices to be used in parallel in high resolution displays.
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Product
VITA 57.4 FMC+ HSPC Loopback Card
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Samtec's VITA 57.4 FMC+ HSPC Loopback Card provides FPGA designers an easy to use loopback option for testing low-speed and high-speed multi-gigabit transceivers on any FPGA development board or FPGA carrier card. It can run system data or BER testing on all channels in parallel. This makes evaluation and development with an FPGA much easier and is an ideal substitute for 28 Gbps test equipment.
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Product
Emulation of the Mobile Wireless Environment from 2G to 5G
Base Station Emulator sUTP 5018
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Bring a whole mobile network to your lab or production: NOFFZ Base Station Emulator (BSE) creates a customized cellular wireless environment. This makes testing wireless devices easier than ever before.Compact, cost-effective testing of multiple DUTs in parallel from 2G to 5G, including endurance testing for several days.
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Product
3D Measurement
PSD-Array
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The PSD array consists of 16 parallel one-dimensional PSD elements on the same chip. By utilizing the triangulation technique the reflection of a laser line or multiple laser spots onto the PSD array will provide information about the contour of the illuminated object. The possibility for simultaneous readout of the 16 elements together with the fast response of each element makes the PSD array suitable for applications like high speed 3D contour measurements and measurements of parallel, moving objects such as cantilevers.
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Product
PXI Resistor Module Quad 8 Bit
40-291-021
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The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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Product
Test & Measurement Platform
Konrad System Manager
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The Konrad System Manager is the central tool for the Konrad test and measurement platform. It combines execution, interactive supervision and documentation of the installed Konrad test modules.- Displays the live status of the module functions in parallel to running test executions- Easy debugging of the switch routes- Control the modules functions- Configure device Alias name for modules- Display alias naming for switching channels- Execute selftest functionality of the modules- Display device information and documentation of the installed modules- Simulate modules
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
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Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
Surface Resistance Meter
WL MIDGET
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WL MIDGET Surface Resistance Meter is an ultra-wide range, battery operated, portable instrument for measuring Surface Resistivity and Resistance to Ground of virtually any flat surface conforming to ASTM D-257 standard method by using recommended parallel bar sensing probe. Gives simple, repeatable measurements of conductive, static dissipative, and insulative surfaces. Ranging is automatic due to the use of high-speed OP-AMP Integrated circuits being linear, with changeover points +1/2 decade on a logarithmic scale. Repeatability equals + 5%.
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Product
Power Supply, 300 V, 11 A, 3300 W
N8741A
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Keysight's basic DC power supplies offer essential features for a tight budget. The Keysight N8741A is a 300 V, 11 A, 3300 W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage.
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Product
Personal Grounding Tester
PGT120
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Electronic test apparatus for checking personnel grounding systems such as electrostatic wrist straps and conductive footwear. The unit is equipped with two separate measuring circuits and is therefore capable of checking wrist straps and footwear separately or in parallel. The test result is signaled visually, acoustically (only if error is detected) and via contacts.
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Product
Parallel Seam Sealers
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It is an equipment to hermetically seal the packages, such as the crystal and SAW devices, optical devices, sensors, MEMS, etc., by seam welding. Hermetic sealing can be accomplished in both N2 and vacuum environment. Furthermore, we are offering a variety of products for research and development and production applications.
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Product
MEMS And Sensor Test Automation Platform
Sense+
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Sense+™ ultra-precise MEMS & sensor test automation platform allows for significant improvement in test accuracy, parallelism for a lower cost of test, and the ability to handle and inspect, small delicate sensors. Fully configured, Sense+ delivers a one-pass automated test, inspection, and metrology for the most complex MEMS devices including <1 mm WLCSP.
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Product
VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
High Power DC Electronic Load
63200A series
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The 63200A series high power DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more. The 63200A series have three operating voltage choices, 150V, 600V & 1,200V, with models covering power levels from 4kW to 24kW and up to 2,000A in a single unit. The DC loads have unique user defined waveform (UDW) capability and external analog modulating input for s imul a t ing re a l-wor ld, cus tom waveforms. Another distinct feature is the dynamic auto-frequency sweep function, which enables detecting a UUTs worst case output deviation across a wide range of current frequencies. In addition, a 255-set of data storage function has been built in for recall of the stored settings at any time. For automated testing, the save and recall functions can save a great deal of time.
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Product
192 Channel Power Supply
HDPMU
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Today cost efficiency is more important than ever. Many manufacturers are working on maximizing multi-site testing. Often maximization can’t be done because of limited tester resources. Salland’s HDPMU gives you up to 192 additional independent parametric measurement units (PMU) channels on a single board. Our solution will increase parallel testing without the need for creating complex device interface board (DIB). It can be used for continuity, functional or parametric tests or simply for device setup or loading. Full integration with the Teradyne IG-XL™ Software, easy set-up and high parallel measurement capability will reduce test costs significantly.
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Product
Digital Demultiplexers
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Advanced Science and Novel Technology, Co., Inc.
24:48 digital demultiplexer (DMUX) with SSTL1.5 input and output interfaces.Supports data rates from 1.0Mbps to 2.0Gbps.User-controllable independent internal delays for data and clock signals.1.5V I2C control interface with a user-defined 3-bit chip address.Preset function for synchronization of multiple parallel devices.Full-rate output copy of external high-speed clock input signal.Two pairs of clock divided-by-2 and synchronous clock enable outputs for supporting the tree-type demultiplexation structure.Additional synchronous clock divided-by-4 output.Dual power supply of +3.0V and +1.5V.Industrial temperature range.Low power consumption of 2.1W at 2.0Gbps.Available in custom 256-pin BGA package (13mm x 13mm x 2.5mm).
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Product
PXI-2576, 64‐Channel, 2-Wire, Multibank PXI Multiplexer Switch Module
778572-76
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64‐Channel, 2-Wire, Multibank PXI Multiplexer Switch Module —The PXI‑2576 is a multibank PXI multiplexer switch module with 16 banks of 4x1 2‑wire multiplexers. With the flexible architecture of the PXI‐2576, you can configure it in a variety of topologies that make it suitable for parallel measurement operations requiring low‐channel counts, or you can combine all multiplexer banks to form a single high‐channel‐count multiplexer featuring 64 2‑wire channels. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Product
CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Product
Test Database Software Module
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The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Product
FLIM Upgrades for Olympus
FV1000
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*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Detection Wavelength Range from 360 nm to 900 nm*Excitation by Ti:Sa Laser, OPO, or by bh ps Diode Lasers*Systems for Multiphoton FLIM and Confocal FLIM*Systems are Modular: More FLIM Channels can be Added
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Product
Digital Attenuators
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Macom Technology Solutions Holdings Inc.
Digital Step Attenuators (DSA)are offered in up to 6 Bit control with lowest step size of 0.5 dB covering DC to 40 GHz. MACOM's DSAs can be controlled with serial and parallel control allowing for best implementation for our customers. These products exhibit low insertion loss and high attenuation accuracy and are offered both GaAs and Silicon (SOI) processes and are offered in both packaged and bare die form factors.
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Product
AMIDA 3001XP Tester
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AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Product
Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
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The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Product
Wi-Fi / Bluetooth / IoT Tester
MP5000
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High speed, high throughput tester for mass production, Turn key automation test software, 4 sites in parallel.
