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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Dual Surge Current Generator
MIG0624T-K12
Designed for testing telecom surge protection devices according to ITU-T K12. The generator has two indepedent impulse outputs which allow testing of two and three terminal protection devices such as gas discharge tubes (GDT). The generator can be configured for two terminal devices or with the outputs in parallel to increase the current impulse for two terminal devices.
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Power Supply, 30V, 170A, 5100W
N8755A
Keysight basic DC power supplies offer essential features for a tight budget. The Keysight N8755A is a 30V, 170A, 5100W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage respectively.
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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FPGA-Based Ultra-Fast Flash Programmer
XJFlash
XJFlash is an FPGA-based advanced and innovative method that uses JTAG for high-speed in-system programming (ISP) of flash memories – all serial and parallel flash devices are supported. The most common use of XJFlash is programming the SPI/QSPI NOR flash used to configure an FPGA.
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Inverter
INV 500VA to 10kVA
*19 "inverter up to 4000VA*Efficiency> 88%*Can be connected in parallel*Without 50Hz transformer*robust IGBT output stage
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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LCR Meter, Hand Held, 100 kHz, 2 kH, 20000 µF, 0.2 Gohm
72-10465
The 72-10465 from Tenma is a LCR meter in orange and grey colour. It features an easy to read dual LCD (40mm x 63mm) display measurement of 19999/1999 (main/auxiliary). It also has series and parallel measurement modes which can be used to select quality factor, loss factor, phase location angle and equivalent resistance of measure articles. Intelligent detection and five different test frequencies enable accurate readings for all sizes of capacitors and inductors. The user can also access the stored data on a PC with the included USB connection and interface software. The compact size and case make this unit far more portable than a benchtop meter.
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1.3 MP Custom Lens NIR Camera Module (Monochrome)
e-CAM10_CU0130_MOD
The e-CAM10_CU0130_MOD is a 1.3 MP NIR Camera module (Monochrome) based on the Aptina / ON Semiconductor AR0130CS CMOS image sensor with S-mount lens holder attached to it. The AR0130 is a 1/3” Optical Form factor, Electronic Rolling Shutter CMOS sensor with enhanced sensitivity in the Near Infrared region and superior low light performance. The e-CAM10_CU0130_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM10_CU0130_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Capacitors - Binary Chip
Macom Technology Solutions Holdings Inc.
MACOM’s BOO and BSP Series Capacitors are designed to facilitate bread-boarding or to use where a trimming capability is required. These devices feature the same dielectric layer and bonding surfaces as our 9000 and 9100 Series chip capacitors. By connecting the pads in parallel, the capacitance values are additive, so many combinations are possible.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Step Height, Parallelism and Flushness Finish
stepCHECK
8tree's stepCHECK delivers accurate 3D measurement and instant analysis of step height, parallelism, and flushness finish between adjacent surfaces. Using the augmented reality reprojection of results, operators can visualize surface alignment non-conformity and identify corrective actions, right on the shop floor. With stepCHECK, inspection of surface alignment GD&T requirements becomes easier (Geometrical Dimensioning & Tolerancing).
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Manual Test Adapters
Manual test adapters (MA) from INGUN are available in several series and series, which differ in terms of use, maximum permitted contact force, parallel stroke, size and service life.
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Multi-Parallel Bioreactors
Small-scale, multi-parallel bioreactors provide more process information for culture comparison in less time. Multiple experiments can assess different clones or cell lines, as well as the effects of pH, temperature, feeding, media, gassing rates and inoculation densities.
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Ultra-High Stability DC Power Supply
62075H-30N
The 62075H-30N output power has maximum 7.5kW/30V/250A power module designed with 4U height that can be connected easily as master or slave with three units to 22.5kW/30V/750A in parallel or two units to 15kW/60V/250A in series and operated as a standalone unit via system bus. The 62075H-30N provides stable DC output cur rent sour ce and powe r for pre c i s ion measurement. It offers an advanced 250A/30V ultra high-stable ±10 ppm (current stability ±1.25 mA) with high eciency and high power factor in compliance with energy savings. In addition it has a 20 bit digital control with bright vacuum fluorescent display readout.
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Current Probe
DCP-BTA
Vernier Software & Technology, LLC
The Current Probe measures DC and low-frequency AC currents up to 600 mA. Use Current Probes in combination with Differential Voltage Probes to investigate Ohm's Law and explore series and parallel circuits. The 0.1 shunt resistor minimizes changes to your circuit. If currents will exceed 1 A, use the High Current Sensor.
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SAS (Serial Attached SCSI)
Serial Attached SCSI (SAS) is a data transfer technology designed to move data to and from storage devices such as disk drives, host bus adapters (HBA), and expanders. SAS is a serialized enhancement and replacement to parallel SCSI. Since SAS ratification in 2004, and it’s move to 6Gbps in 2008, Teledyne LeCroy has continued to support and innovate with it’s industry leading protocol analysis and traffic generation capabilities.
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Battery Pack/Module Test Solution
Regenerative battery energy dischargeEnergy savingEnvironment protectionLow heat generateChannels paralleled for higher currentsCharge / discharge mode (CC, CV, CP) Constant current Constant voltage Constant powerDriving cycle simulationHigh precision measurement accuracyFast current conversionSmooth current without over shootTesting data analysis functionData recovery protection (after power failure)Independent protection of multi-channelBMS data recordingThermal chamber control integration
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Programmable DC Electronic Load - (Economical)
63200E Series
The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.
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PXI-2576, 64‐Channel, 2-Wire, Multibank PXI Multiplexer Switch Module
778572-76
64‐Channel, 2-Wire, Multibank PXI Multiplexer Switch Module —The PXI‑2576 is a multibank PXI multiplexer switch module with 16 banks of 4x1 2‑wire multiplexers. With the flexible architecture of the PXI‐2576, you can configure it in a variety of topologies that make it suitable for parallel measurement operations requiring low‐channel counts, or you can combine all multiplexer banks to form a single high‐channel‐count multiplexer featuring 64 2‑wire channels. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Parallel Testing of Multiple DUTs with High RF Channel Count
Test Rack UTP 7033 RF for validation
Our basic test rack UTP 7033 (33 rack units) is intended for equipping with various products and therefore for various application areas.The rack shown here as an example is prepared with products and measurement instruments to test automotive devices with high channel count.
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96/48/24-CH Opto-22 Compatible Digital I/O PCI Cards
PCI-7296/7248/7224
ADLINK"s PCI-7296/7248/7224 are high-density parallel digital I/O boards with 96/48/24 I/O channels. The header connectors are fully compatible with industry Opto-22 standard. Thus, PCI-7296/48/24 can utilize the Opto-22 external devices. The PCI-7296/7248/7224 devices emulate mode 0 of the industry standard 8255 programmable peripheral interface (PPI) chips. The PCI-7296/7248/7224 provides 4/2/1 PPI chips respectively. Each PPI offers three 8-bit ports: Port A, Port B and Port C. The Port C is divided into 2 nibble-wide (4-bit) ports. The PCI-7296/7248/7224 devices have programmable timer/counters. One 16-bit counter is available for event counting, while the other 32-bit timer is available for timed interrupt generation. The PCI-7296/7248/7224 devices provide multiple programmable interrupt sources from DIO channels, as well as the output of the timer.
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Closed-Loop Servohydraulic Test Bench Control System
Closed-loop servohydraulic test bench control system is based on digital devices of ZETSENSOR series with CAN interface. This system has fast response characteristics, high precision, and compact dimensions. The system enables comprehensive control of the servo drive in automated mode in compliance with the set test parameters such as pressure (force), displacement, along with the parallel control of other system parameters such as temperature, pressure, filter plugging, oil pressure, etc.
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GPIB Parallel Interface
Model 4813
* Provides 128 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Optional Relay Driver boards add 64 or 128 Relay Drivers.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Extreme Rugged Cold Plate Mount System with Intel® Xeon® Processor and MIL-DTL-38999 Connectors
HPERC-KBL-MC
Inside the tiny footprint of ADLINK’s HPERC lives the power of Intel® Xeon® processor and optional GPGPU parallel processing engine based on a NVIDIA Quadro MXM module. Dual removable secure erase RAID-0 SSDs provide 12Gb/s throughput and security for deployment in hostile environments.
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Automatic Span Gasgenerator Unit
ASGU-370 Series
The multi point calibration units ASGU-370 series is designed for simultaneous (parallel) or step by step (serial) checking of gas analyzers. It is primarily installed in laboratories for quality assurance and is also used for the production of gas analyzers.Furthermore are the calibration units as a Transfer standard in portable suitcase available. Here we have for ongoing quality control in field the versions all in one aluminum suitcase and for a flexible and back-friendly wearing comfort the ASGU-370TS SPLIT.
