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DUT Matrix 32 DUT Matrix Channels
40-530-021
The 40-530-021 is a high density 32x8 1 pole reed relay matrix. Typical applications are signal routing in functional ATE and data acquisition systems. It consists of highly reliable sputtered ruthenium reed relays that offer >10e9 switching cycles to ensure maximum switching reliability with a long service life and stable contact resistance. Larger arrays can be built by daisy-chaining the common signals from multiple PXI modules
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DUT Boards
RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
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DUT Resistance Tester
AllWin Instrument Science and Technology Co., Ltd.
1. This test verfies the integrity of DUT2. The resistance is measured by measuring voltage3. Current is made by distribution
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iSocketTM - High Power DUT - HTOL System
8000 Series
iSocketTM Technology Open Rack-Room Temperature (RTBI) non chamber design High Power DUT Capability – 0-65W Individual DUT Temperature Measurement & Control DUT Monitoring with Auto shut down 28 BIB capacity – 14 trays 2 BIB’s per tray Multi DUT type HTOL Testing Remote System & HTOL Monitoring – Customer access via VPN
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DC Power Module, 8V, 12.5A, 100W
N6742B
The Keysight N6742B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Pump Test System
This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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DC Power Module, 35V, 1.5A, 50W
N6734B
The Keysight N6734B is a 52.5 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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PXI RF Multiplexer Switch Module
PXI RF Multiplexer Switch Modules are ideal for high-channel-count applications that need to connect measurement or signal generation instruments to various test points on devices or units under test(DUTs or UUTs). PXI RF Multiplexer Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor(FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a multiplexer that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NISwitch Executive provides additional software tools to help you design, build, and deploy your switching system.
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Low Noise Test Leads For N1413 With B2980 Series, 3m
N1425B
The N1425B is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425B is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425B enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425B to the B2985B/87B.
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±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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Precision Low-Loss Multiplexers
Maury’s line of diplexers (DP-series) and triplexers (TP-series) are designed for applications which require combining/ splitting signals at or around harmonic frequencies (nFo) and are connectorized for design-in and test and measurement applications.DP-series diplexers are designed using low-pass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.TP-series triplexers are designed using low-pass, bandpass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.Power handling is rated at 100W CW (average) and typical insertion loss is better than 0.5dB between the low-pass (Fo) and common ports.DP- and TP-series multiplexers are ideal accessories for passive, active and hybrid-active multi-harmonic load pull systems.
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High Flexibility VNA Cables
Our lines of high frequency VNA test cables display excellent electrical properties such as wonderful phase stability of +/- 6° at 50 GHz and +/- 8° at 67 GHz as well as VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz. The 50 GHz assemblies are terminated with 2.4mm connectors while the 67 GHz versions utilize 1.85mm connectors. The braided stainless steel armoring surrounding the coax provides a rugged, but flexible cable with a flex life exceeding 100,000 cycles, making these test cables ideal for use in semiconductor probe testing, precise bench top testing as well as lab/production testing where the need for a highly flexible, yet durable cable solution is required. The VNA test cables are also equipped with rugged stainless steel connectors that provide up to 5,000 mating cycles when attached with proper care. Additionally, the flexibility of these cables makes it easier and safer to test a Device Under Test (DUT). A swept right angle 2.4mm and 1.855mm connector option allows these cables to fit in tight spaces and can reduce the length of cable required in many applications.
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3U CPCI 32-bit Test Extender
Measurement and testing of CompactPCI® assemblies in the 3U Euro-board form factor is greatly facilitated by the use of this test adapter. Easy access to the DUT is guaranteed because the adapter has plug-in connections on 3 sides. The Modern BRIDGE design permits up to 3 CompactPCI® cards and one standard PCI® card to be inserted in one CompactPCI® slot. This allows system developers to implement a large number of tests with little effort and enables you to achieve vital time to market.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Vibration Shakers
Vibration Shakers and Modal ExcitersFull range of modal and inertial shakers with integrated and easy-to-use amplifiers. Our permanent magnet shakers are compact, lightweight, and powerful general-purpose shakers that can be used for modal and vibration testing. They have a high DUT capacity despite their small sizes.
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Tunable Non-Reflective Band-Reject Filter (700MHz-1GHz)
SPCL-00597
This device is placed after the DUT to protect the Spectrum Analyzer from high-power fundamentals and provide harmonic measurements. The non-reflective functionality prevents energy from bouncing back to the DUT and raising the noise floor level.Broadband matching improves dynamic range and reducesmeasurement uncertainty.
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Solar Array Simulator
G5.SAS
The G5.SAS series are unidirectional sources. It was developed specifically for testing inverters and simulating solar arrays and is suitable for use in laboratories and on test benches. The modular and finely graded G5.SAS series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies feature especially low capacitance values in the output filter stage and switchable earth leakage resistors for adaptation to the insulation measurement of the DUT.
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Precision Capacitance Meter
TH2638B
Changzhou Tonghui Electronic Co., Ltd.
TH2638 series is a new precision capacitance meter with higher test frequency. With small size and portable appearance, it is convenient for use on the shelves. With basic accuracy of ±0.07%, loss accuracy of 0.0005, test frequency up to 1MHz, 4.3-inch LCD screen, selectable Chinese-English operation interface, TH2638 series is easy to operate and provide fast and reliable test for ceramic capacitor production. Also, it can test all kinds of capacitors from low value to high value. The results of testing one capacitor for several times are quite stable and accurate, even for lower value capacitors. The tester is compatible with SCPI command set, and configured with manipulator and scanner interface, the scanner interface can scan the open/short/ load error calibration in each channel, 256 channels at most. In low frequency, there is signal level compensation function. When the impedance is very small, the internal resistance in signal source and test cable will cause the voltage on terminal of DUT lower than the set range, then this function will adjust the level to the set range.
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Function Tester with Low Number of Channels
UTP 6010 RF
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
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ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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P-Series Single Channel Power Meter
N1911A
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Scanner Box for STW Series
The aim of these scanner boxes is to allow multiple DUTs to be tested either concurrently or in sequence using the STW-9900/9800 safety testers. The scanner boxes are particularly well suited for multi-point safety testing as well for volume testing on factory floors.
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AC Ground Bond Testers
440 Series
The 440 Series provides advanced 4-in-1 test capability in a convenient one-box solution. This new series performs AC Hipot (448 - 500 VA), DC Hipot, Insulation Resistance and 40A AC Ground Bond tests while taking up minimal production line space. The 440 Series is simple and easy-to-use; reducing setup time and increasing production line throughput for your application. With multiple memories and an optional USB port for remote BUS communication so you can quickly perform tests on a variety of DUTs from the front panel or with a PC. Learn about our 5 Year Warranty.
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Bidirectional DC Power Supply + Regenerative Load
62000D
Chroma Systems Solutions, Inc.
Chroma 62000D programmable bidirectional DC power supplies have both power source and load characteristics, two quadrant operation, and allows feedback of the power from the DUT. They can be used for testing renewable energy power systems including PV/storage hybrid inverters, power conversion system (PCS) on charging/discharging, and as a battery simulator. The 62000D also is a fit for testing power components used in electric vehicles, such as bidirectional on-board chargers (BOBC), bidirectional DC convertors, and DC-AC motor drivers, and power conversion simulation tests of batteries in both directions.
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Power Module, 100V, 3A, 300W
N6776A
The Keysight N6776A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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RF Shield Box
CMW-Z10
The R&S®CMW-Z10 has excellent shielding effectiveness and superior coupling characteristics.The shield box can be used for frequencies up to 6 GHz.The antenna structure is optimized to enable excellent radio connections between the DUT and tester.The highly broadband spiral antenna allows a wide variety of applications.These outstanding features combined with modular options make the RF shield box indispensable for any radiocommunications tester.
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JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Vibration Testing
Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
