Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Conformance Calibration Standard Test Card for ISO/IEC Data Matrix and GS1 DataMatrix Symbol Verifiers
AI-CCS-DM-G Rev A
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This precision 2D barcode Conformance Calibration Standard Test Card is the first 2D test card to provide ALL 12 of the Primary Reference Symbols specified by ISO 15426-2 for barcode verifiers. They are sized from 0.5mm to 0.2mm so that all the symbol sizes specified in Annex A.3.1 can be tested. Symbols 1-4 are GS1 DataMatrix symbols, while symbols 5-12 are ISO/IEC Data Matrix symbols consistent with the ISO/IEC 16022 standard. The card also includes four calibrated reflectance patches.
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Product
PXI Switching Instrumentation
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Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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Product
PXI Switching Instrumentation
3U PXI
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Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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Product
PCI Card
EXC-1394PCI
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The EXC-1394PCI card for the PCI bus is an intelligent test and simulation card for interfacing to an IEEE-1394 data bus. It implements a 1394b PHY layer, operating at 100, 200, or 400 Mbps.
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Product
Development
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Our JTAG Switch Modules (JSMs) are flexible testing and diagnostic cards to accelerate the design, prototyping and operation of your embedded computing system. We have a range of AMC modules for IPMI software development, power load testing and monitoring or to provide a telco/fabric clock. Also, our single slot backplane for AMC modules is ideal for low-cost development and testing.
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Product
Type 39 CompacFrame Development Platform, 6 And 8 Slot 3U OpenVPX Aligned To SOSA
39S0xBWX94Y3VCC0
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Elma’s SOSA aligned CompacFrame is the next generation portable test platform designed to accelerate development and test of plug-in cards (PICs) aligned to the Open Group® SOSA™ Technical Standard. Accommodates up to 8-slot OpenVPX backplane.
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Product
Advanced Circuit Card Automated Test
ACCAT
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The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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Product
SD Express
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SCHILLER AUTOMATION GmbH & Co. KG
The Standard SD Express Memory Card Test Adapters support PCIe® 16 GT/s (Gen4) and PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD8.0 and SD7.1. Minimal crosstalk, short trace lengths. The Micro SD Express Memory Card Test Adapters supports PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD7.1. Minimal crosstalk, short trace lengths. They all support SDHC, SDXC, and SDUC operation modes Data collection via Lab Standard SSMP Test Cables and hard gold mating surface allow for high cycle count insertions and reliable performance.
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Product
TestCentre
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ARC has experience with complex, commercially available test executives that are available for high volume production needs. Often times, when you don’t need the horsepower of a full featured executive, you are left with creating a specifically defined test program or crafting your own test sequencer. Rather than go down this path and spending your time on architecture, TestCentre brings a simple, yet elegant solution to this all-common problem. Used in many of ARC’s standard test stations, the robust, sequence based architecture of TestCentre, allows you to focus on the testing task at hand. While having some of the more advanced features found in high-end test executives, TestCentre, when mixed with RF analyzers and PXI based test solutions are a great, low cost solution to help solve your everyday testing requirements. Along with TestCentre and an ARC supplied rack-based test platform, your test challenges can be solved in doing circuit card testing, assembly/module level testing, or depot repair troubleshooting tasks.
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Product
Creepage Distances Test Card
CX-P27
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Shenzhen Chuangxin Instruments Co., Ltd.
Creepage Distances Test Card Brief DescriptionCreepage Distances Test Card, Refer to GB4706.1-2005 the 29th Item Atc
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Product
Test Fixtures & Jigs
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A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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Product
Tx/Rx BenchBlade
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This ATCA compatible test card offers the flexibility to verify the performance of Advanced TCA fabric and base channels. The set of four Transmit pairs and four Receive pairs allows access to a full channel's eight pairs for logic card characterization.The card includes a HM-ZD male right angle connector segment for access to the Zone 2 connectors of a switch fabric or node card. Edge-launch SMA connectors are utilized for ease of test cable attachment. SMT pads are included on the receive pairs.
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Product
ISO, SWP/HCI, USB Card Tester
Spectro 2
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# SO/SWP terminal simulator for Smart Card testing# Test Cases for ISO, SWP and HCI# ISO/SWP/HCI/USB trace function for ensuring interoperability between a real Smart Card and a handset
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Product
Magnetic Stripe Test Cards
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Test Limit Cards (and tickets) are nominally encoded to ISO standards BUT WITH specific parameters deliberately set to predetermined levels, which can be inside or outside the ISO limits. The Test Limit Cards are designed for use by Test\Inspection Departments, Field Service Engineers, Reader \ Encoder Development Engineers to check and confirm proper operation of magnetic stripe reading equipment (e.g. ATMs and POS).
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Product
Type 39 CompacFrame Development Platform, 2 And 4 Slot 3U OpenVPX Aligned To SOSA
39S0xBWX9ZY2VCC0
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Elma’s CompacFrame is the next generation portable test platform designed to accelerate development and test of plug-in cards (PICs) aligned to the Open Group® SOSA™ Technical Standard. Accommodates up to 4-slot OpenVPX backplane.
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Product
PCIe 5.0 Test Platform
PXP-500A
Test Platform
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Product
CCD/CPA Level 1 Card Testing
EMVeriCard
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EMVeriCard is an EMVCo qualified tool to test contact smart cards. The tool helps to enhance global interoperability of smart cards and prepare for certification testing for Level 1 electrical and protocol requirements according to EMVCo Common Core Definition (CCD) test plan.
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Product
High Current Switches
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Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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Product
Back Plane Tester
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This machine is used to test back planes used in telecommunications central stations. An operator loads a completed point to point wired back plane onto a retractable shelf on the front of the tester. Table continues and the disk falls through a hole into the bin. The shelf is pushed back into the machine where it is held in place by pneumatic operated clamps. Then a series of pneumatic cylinders sequentially insert a test card into each location in the back plane. A remote instrument performs a complete point to point continuity, short and hi pot test on all connections in the back plane.
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Product
RWR ATE MKII
MS 1111
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Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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Product
Multi-Function PXI Card
GX3788
Digital / Analog Converter
The GX3788 is a user configurable, FPGA-based, 3U PXI multi-function card which supports digital and analog test capabilities. The card employs the Altera Stratix III FPGA which features over 45,000 logic elements and 1.836 Kb of memory. The GX3788 is based on the GX3700 FPGA card and includes an integral daughter board which provides (8) differential input, 16-bit, 250 MS/s A to D converters and (8), 16-bit, 1 MS/s, D to A converters. The module's FPGA is pre-programmed, providing access to all digital and analog functions. Alternatively, users can program or modify the FPGA , allowing user to adapt the module to their own specific test needs. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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Product
Type 39 CompacFrame Development Platform, 1 - 4 Slot 3U VPX Power And Ground Backplane
39P01BWX6ZY2VCC0-Tx
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Elma’s slimline CompacFrame is the next-generation platform designed to accelerate development and test of Plug-In Cards (PICs). The 3U card cage in the platform is tilted upward by 5º for easier card access and accommodates backplanes up to 4 slots.
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Product
PCIe 4.0 Test Platform
PXP-400A
Test Platform
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
Multi Protocol Boards
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The EXC-4000 carrier board series was developed to meet the needs of avionic testers for multi-protocol integrated, digital bus testing. Modules may be selected out of a growing list which currently includes MIL-STD-1553/1760, MMSI, H009, ARINC-429, ARINC-708/453, Serial (232/422/485), Discrete and CAN bus. Additionally, an IRIG B decoder implements a global time stamp relative to the IRIG B pulses. The need for higher density, different protocols, and multi-channel on one integrated test card has made the EXC-4000 series very successful.
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Product
PXI Switching Instrumentation
Matrix
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Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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Product
NomadLAB
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It is equally adapted to application testing in a lab or field environment, providing communication spy and analysis for NFC, ISO/IEC 14443 A/B card signals, FeliCa, ISO/IEC 7816, SWP (HCI/SHDLC), emulation of ISO/IEC 7816, and ISO/IEC 14443 card signals for active testing of card readers.
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Product
Conformance Calibration Standard Test Card for GS1-128 Symbol Verifiers
AI-CCS-128-E Rev B
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This test card is ideal for testing of verifiers, scanners, and other GS1-128 barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Product
Satellite ATE
MS 1123
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Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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Product
Backplane & Cable Test
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Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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Product
Resistor Simulation Card
SET-1210
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The card has two ranges of values that meet the requirements of most functional test systems.The SET card is designed for applications in which resistive sensors provide information about parameters such as temperature (e.g. when testing motor controls)Each channel of the SET-1210 resistor simulation card is able to simulate the common short-circuit and no-load conditions, which can occur in a system due to faulty wiring or sensors.
