Memory Test Systems
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Product
Diagnostic Test Tools For Switching Systems
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You know that verification and diagnosis of complex switching operation in a test system has always been an issue. Two of our latest offerings in diagnostic test tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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Product
Alpha Particle Counting System
UltraLo-1800
Particle Counting System
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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Product
Dynamic and Fatigue Testing Systems
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Instron offers an extensive range of fully-integrated dynamic and fatigue testing systems from 1000 N up to 5000 kN. Incorporating servohydraulic, servo-electric and linear motor technologies, these test instruments cover a broad range of fatigue, dynamic, and static testing applications. These applications include high-cycle fatigue, low-cycle fatigue, thermo-mechanical fatigue, fracture mechanics, crack propagation and growth studies, fracture toughness, bi-axial, axial-torsional, multi-axial, high strain rate, quasi-static, creep, stress-relaxation, and other types of dynamic and static tests.
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Product
Circuit Breaker Endurance Test System
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Endurance testing involves operating – closing and opening – the circuit breaker repeatedly for a set number of cycles. This test is necessary to stabilize the circuit breaker mechanism and to identify “Early Infant Mortality” failures in the switchgear assembly.
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Product
Modular Test System
DMT
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The DMT Tester is a modular test system that allows rapid measurement of electrical and non-electrical parameters of functional units. The system also allows basic ICT measurement with optional accessories. It is conceived as modular, with the possibility of integrating a wide range of own and external instruments. The DMT tester is controlled by its own SCADUS software.
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Product
Lamp Cap Temperature Rise Test System
CX-T1
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Shenzhen Chuangxin Instruments Co., Ltd.
Lamp Cap Temperature Rise Test System is according to IEC60360-1998 and GB2512-2001(Standard method of measurement of lampcap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards
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Product
Electric Vehicle Module Test System
FTV
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Drive simulations with standard Electric Vehicle tests: FUDS, SFUDS, GSFUDS, DST and ECE-15LBattery Module TestingStart/Stop TestingTraction Battery TestingSupercapacitor / Ultracapacitor TestingDrive Cycle Testing
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Product
Semiconductor Test System
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Product
CDM Test System
1100-CDM series
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Tokyo Electronics Trading Co., Ltd.
Model 1100-CDM is the latest model developed as a successor to the conventional CDM-550, and supports testing methods (Field-Induced CDM) that conform to international standards. In addition, a camera and a high-accuracy robot can apply CDM stress to a precise position.
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Product
Automotive Test System
LABCAR
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The LABCAR product family comprises software, hardware, and models suitable for integration into tailor-made testing systems that fit perfectly into existing processes. Deployable from the earliest to the latest phases of development, the LABCAR family provides for efficient verification and validation of embedded systems and software.
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Product
Haptic Testing System
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The Air Ventilator Haptic Test System performs automatic functional tests on air ventilation components to measure the force necessary for the execution of movements in the different components of the part. The movements are performed by a 6-axis robot that forces the components of the part to follow the desired routes while storing data on the force expended. This particular machine tests movable fins and knurled wheels by performing four test motions on each fin and two on each wheel.
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Product
System Level Test
SLT
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As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.
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Product
PIM Test Systems
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AWT's Portable PIM testers are powerful yet compact tools for testing and analyzing telecommunications network infrastructure. These testers are ruggedized and can withstand harsh environmental conditions. they are accurate, reliable and easy to operate and they provide a wealth of features ideal for work in the field. Built-in Distance-to-PIM option.
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Product
HEV / EV / Grid Emulators and Test Systems
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With Scienlab test systems and test software, Keysight offers customized test environments for the development and testing of electronic components according to hybrid and electric vehicle testing standards. Our solutions help you to accelerate your e-mobility applications from the battery, Battery Management System (BMS), inverter, the charging interfaces of Electric Vehicle (EV), and Electric Vehicle Supply Equipment (EVSE).
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Product
H+W (Pylon) 1280 Point Test System
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H+W (Pylon) 1280 Point Test SystemUp to eight positions for 160 Point Wiring Blocks.
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Product
Modular Laser Diode Test System (PXI/PXIe)
LTS8620
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The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Brake Test Systems
GIANT 9000 Series
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The major test target is to detect noise and vibrations generated by the vehicles brake. Our intention was to build a dynamometer that can operate either with brakes mounted to the complete vehicle, or with just the axle module mounted to a universal adaptor system or wheel suspensions.
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Product
Mezzanine System
5235
System
The 5235 ECM provides 16 bits of simple digital I/O. The digital I/O is connected directly to the digital I/O on the carrier card. Inputs are clamped to about 3V by FET buffer ICs, and are 5V tolerant.
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Product
Dayton Audio Test System
DATS V2
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Highly accurate measurement of loudspeaker impedance and T/S parametersEasy-to-use, fully-featured measurement software with intuitive interfaceCompact USB measurement module with molded test leads and alligator clipsSoftware includes signal generator, scope, and measurement of inductors and capacitorsData can be saved to create a driver parameter library or exported to popular box design programsNew V2 hardware and software simplify setup and eliminate warm-up/cool-down times
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Product
The All-In-One Noise Test System
NXA Series
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Noise eXtended Technologies S.A.S.
The NXA is a fully automated Phase Noise analyzer. Its dual channel architecture allows the system to use a cross-correlation process to cancel its internal noise floor. This reliable technique provides access to the unique noise floor performance of the DCNTS.
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Product
Macro-Vickers Hardness Testing System
LV Series
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LECO's LV Series Macro-Vickers Hardness Testing Systems offer an affordable testing system suitable for larger, heavier samples used in welding and other demanding applications. Models include analog and digital, with options to upgrade to automatic configurations.
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Product
Test Automation Systems
iTest
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Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Product
Manufacturing Test Only System
MTO
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The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Product
LT-300A Aging-Life Test System For LED Luminaires
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-300A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Product
Shock Test System
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Labtone Test Equipment Co., LTD
Products are inevitably affected by impact, bump, free fall, tumbling etc. during production, transportation, loading and unloading as well as during the use of the products. All of these are transient excitation on the object, causing the object to produce mechanical characteristics of high speed, acceleration, strain rate instantly. These kind of characteristics are completely different from that in static load, and may cause problems to the object in terms of structural strength and stability and sometimes the object may fail. Therefore, it's necessary to study the effect of impact and reproduce the shock environment, to assess the structural strenghth and performance of the object under shock environment.
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Product
Partial Discharge Testing Of Transformer & Localization System
AE-150™
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The is designed to detect and localize Partial Discharge activity by correlating acoustic and electric sensors' data. The AE-150™ has many acquisition modes, each used for detecting and locating Partial Discharge activity in a transformer. The AE-150™ unit is mounted on the transformer tank using its powerful magnets that also hold four acoustic sensors.
