Stimulus
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Modulation Distortion Up To 50 GHz
S930705B
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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JTAG Boundary-Scan I/O Modules
SCANIO Family
The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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6U CPCI D/S, S/D, I/O & Comm Board
78CS2
NAI’s 78CS2 is a 6U cPCI Multifunction I/O and Communication Board designed for applications requiring Digital-to-Synchro/Resolver (D/S) stimulus output, as well as I/O and communication functions. This board contains five independent function module slots. The board can be configured for 10 D/S channels, or for D/S in combination with I/O and communication modules. Additional enhancements include FIFO data buffering for select modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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RFP DC Low Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Frequency Response Analyzers
Frequency Response Analysis (also referred to as Transfer Function Analysis) measures the output spectrum of a system relative to a stimulus, and is used to characterize the dynamics of the system under test. The technique measures the magnitude and phase relationship between output and input waveforms as a function of frequency. The input signals may be from a wide range of sensors including acoustic (microphones/sonar), mechanical (accelerometers/displacement transducers), optical (photodetectors), and electrical (amplifiers).
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Digital Stimulus Response PXI Card
GX5152 Series
The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.
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Thermal Sensitivity Tester
NTE-2A
The NTE-2A Thermal Probe is a sophisticated, non-invasive device for the clinical evaluation of neuropathy and the assessment of short fiber neurological function. Individual thresholds are compared to normals to statistical normals. These results provide an accurate means of tracking chronic changes in small fiber nerve function. It can be used for pain studies and in any application were a variable, accurately-controlled temperature stimulus is required. The NTE-2A is often used in conjunction with the Vibratron II to assess peripheral neuropathies.
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Frequency Response Analyser
DP-cPCI-7554
DP-cPCI-7554 is a cPCI module capable of analyzing the phase and gain characteristics of a system. The system under test is stimulated by the user defined waveform. The obtained response is correlated with the applied stimulus by the on-board DSP processor to determine the phase difference and the gain.Gain and the face analysis is carried out only at sine waveform.
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RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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64-Channel 1MSa/s USB Modular Multifunction Data Acquisition
U2331A
The U2331A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2331A to simulate simultaneous analog input acquisition.
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USB Controlled Multi-Function DAQ For ATE Education And ATEasy Training
GT98901 Series
The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users with a simple yet complete vehicle that replicates many of the stimulus and measurement functions associated with ATE systems. When combined with Marvin Test Solutions' ATEasy® Test Executive and Test Development environment, the GT98901 is the ideal product for creating and supporting ATE training and education applications.
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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6U VME D/S, S/D, I/O & Comm Board
64CS4
NAI’s 64CS4 is a 6U VME multifunction I/O board designed for applications requiring Digital-to-Synchro/Resolver (D/S) stimulus output, as well as I/O and communication functions. This board contains five intelligent, function module slots. The board can be configured for 10 D/S channels, or for D/S in combination with I/O and communication modules. Additional enhancements include FIFO data buffering for select modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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Stimulus Test Cell
HA7200
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Battery Analyzers
BA6010 Series
The BA6010 Series battery analyzers measure voltage and resistance of modern battery technologies with high accuracy, resolution, and speed. Additionally, these instruments provide auxiliary measurement parameters inductance, capacitance, dissipation factor, impedance, quality factor, reactance, and phase angle in degrees and radians. The BA6010 Series is suitable for characterizing battery chemistries that are responsive to a 1 kHz AC stimulus signal including lead acid, lithium and alkaline type batteries used in consumer products, electric vehicles, power backup, security, and fire alarm systems.
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Nodal Impedance Analyser
QT-Hi1
Qmax Test Technologies Pvt. Ltd.
QT-Hi1 is an innovative Nodal Impedance Analyzer, which uses the industry’s proven V-I trace techniques of learn and compare of nodal impedances which are represented as VI Curves. It uses innovative Auto Best Curve fit technique an intelligent software alogorithm which enables automatic selection of the best fit value of Voltage, Source Impedance and Frequency of the stimulus waveform. The compact size with re-chargeable battery makes it an ideal companion for on-field applications. The wide 8” touch screen graphical display makes this tool more valuable in test and repair industry at all times.
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Protocol Analyzer and Exerciser
Keysight's protocol test solutions for each technology typically consists of both protocol analyzer application as well as a stimulus solution, such as an exerciser or traffic generator. Keysight's protocol test solutions combine multi-protocol analysis, traffic generation, performance and conformance verification to debug, validate and optimize your designs using high speed protocol standards.
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PCI / PMC / CompactPCI Test System
PCITS
The CPCI850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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PMC and PMC-X Bus Analyzer / Exerciser
PMC850
The PMC850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Modulation Distortion Up To 13.5 GHz
S930701B
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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16-Channel 250kSa/s USB Modular Multifunction Data Acquisition
U2351A
The U2351A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2351A to simulate simultaneous analog input acquisition.
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Accessories: Test Hardware
Copernicus Technology supply test hardware accessories to support Intermittent Fault Detection testing using VIFD™ and IFDIS™ test equipment, such as Interface Test Adapters (ITA). We also supply and repair general purpose and customer-spec test hardware accessories: ITAs, Break-Out Boxes (shown below) and Mobile Vibration Systems. The Mobile Vibration System can be quickly set up in repair bays for applying environmental stimulus to components and wiring harnesses during testing.
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Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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Digital Wideband Transceiver Analysis
S94610B
Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
