Stimulus
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True-Mode Stimulus
S96460B
S96460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port E5080B vector network analyzers.
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High Volume Manufacturing Handling, Stimulus
ULTRA P
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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True-Mode Stimulus
S93460B
The S93460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port PNA or PNA-X network analyzers.
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Modular Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, programmable power module system providing DC, AC and electronic load assets all under control of a single controller. ReFlex Power™ (RFP™) provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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VXI Precision Waveform Synthesizer
3151B
The Racal Instruments™ 3151B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a singleslot VXIbus format. The 3151B is a greatly improved version of a field-proveninstrument ideal for VXI test stimulus generation. It replaces the 3151A+ and other similar units which were standard on many military and commercial test platforms.
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DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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VXI Video Processor System
65VP1
NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Modulation Distortion Up To 8.5 GHz
S930700B
S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Synchro To Digital & Digital To Synchro Converter
DP-cPCI-5031
DP-cPCI-5031 is a Resolver to Digital and Digital to Resolver converter module. This module has four S/R to Digital converters(measurement channels) and two Digital to S/R converter(stimulus channels). This module is programmable for simultaneous acquisition and generation of the Resolver signal.
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Modulation Distortion Up To 90 GHz
S930709B
S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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NI-5741, 16-Bit, 1 MS/s, 16-Channel Signal Generator Adapter Module for FlexRIO
782864-01
The NI‑5741 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5741 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5741, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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High Speed Digital Analog
The Automatic Test Equipment is designed to provide R&D and the Production floor with a high quality, reliable and easy to use Test Station comprised of COTS equipment from industry leading instrument manufactures. The measurement switching has low thermal offset allowing for micro volt measurements. The switching also accommodates both stimulus and measurement up to 5 Amps. Also to provide High Speed and Static Digital Stimulus and Response that covers LVDS, 3.3V, TTL, CMOS and Industrial logic families. For Serial communications there are SPI, I2C, RS232/485, USB and Ethernet. The system has nine programmable DC power supplies that are capable of powering both the UUT and the UUT interface separately. The system can interface with a variety of UUT’s via an ITA. Each system comes with the Imperial Test Executive, National Instruments TestStand, CVI, LabView and .NET Runtime.
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Modular Power
RFP DC Load
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Graphical Debugging for Verilog, VHDL, and C++ Simulators
BugHunter Pro
BugHunter uses the SynaptiCAD graphical environment and supports all major HDL simulators. It has the ability to launch the simulator, provide single step debugging, unit-level test bench generation, streaming of waveform data, project management, and a hierarchy tree. The unit-level test bench generation is unique in that it lets the user draw stimulus waveforms and then generates the stimulus model and wrapper code and launches the code. It is one of the fastest ways to test a model and make sure that everything is working correctly. The debugger also has exceptional support for VCD waveform files.
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Portable Functional Near-Infrared Spectroscopy System For Research
LIGHTNIRS
Shimadzu Portable functional Near-Infrared Spectroscopy (fNIRS) System for Research* Near infrared light, which readily diffuses easily through biological tissue, can be used to measure localized blood oxygenation levels of the brain to monitor where activity occurs in response to a task of stimulus. The portability of LIGHTNIRS allows visualizing brain function activity in real time in a more natural state than other methods. Consequently, it is being used in a wide range of applications including medical research, developmental psychology, education, cognitive science and engineering.
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VXI 12-Channel, 3-Wire LVDT/RVDT Simulation
65DL2
NAI’s 65DL2 is a 12-channel, 3-wire, LVDT/RVDT Simulation Instrument on a VXI board. This single-slot, message-based board features up to 12 stimulus channels of 3-wire LVDT/RVDT, wraparound self-test, and onboard programmable excitation supply. The board is uniquely versatile, as each excitation input and output voltage is programmable. In addition, each channel can be programmed to be controlled by an external DC voltage. A replacement for the 5410C-83, the 65DL2 is ideally suited for defense, commercial aerospace, and industrial applications.
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Digital Pattern Generator
Wave Gen Xpress
A digital pattern generator is an essential stimulus source for almost every type of digital device: digital and mixed-signal ASIC, FPGA, microprocessors and microcontrollers. The digital pattern generator can be used early in the design cycle to substitute for system components that are not yet available.
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Fault Diagnostics in Power-Off State
QT55
Qmax Test Technologies Pvt. Ltd.
Signature Method of Testing is also known as VI Trace Characteristics, is a proven fault diagnostics technique in Power-Off state while testing a board. By applying known wave from signal with desired Voltage, Source impedance and Frequency of the stimulus signals, depending upon the test node and its characteristics, a Voltage (V) vs Current (I) graph is plotted and studied.
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Carbon Monoxide Detector Tester
Solo C3
Many multi-sensor fire detectors detect carbon monoxide (CO) as well as smoke and / or heat. Under international codes and standards the CO cell needs to be functionally tested with a CO stimulus from the protected area through the detector vents to the sensor.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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ARINC HSI / ADI Test Fixture
TA-2000
The TA-2000 test fixture is a combination panel that incorporates all the standard capabilities of the legacy CTS-11(ADI) and CTS-12(HSI) panels and much more. This panel is married to our model TA-1001 dual synchro transmitter/API panel thus allowing for local stimulus and alignment of the instruments synchros and resolvers. The panel provides for testing of both superflag(28v) and low level meters through a matrix of switching that will allow testing of all meters simultaneously or just individually. The low level meter drive circuit also incorporates an automatic mode that will continuously oscillate the L/R and Up/Dn pointers.
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Wafer Level Test Handler
Kronos
Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Motion Simulator For Test Systems
Metis
METIS is a motion simulator for sensor and end system level testing. Configurable design allows you to create system you need! - 1-axis rate table for gyro testing - 2-axis unit for 6DOF accelerometer and gyroscope testing - 3-axis Gimbal system for simultaneus Yaw, Pitch and Roll stimulus.
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Portable RF Signal Generator
ACE 5400
The ACE 5400 portable RF signal generator has four carriers that can be activated individually or in any combination. Each frequency and amplitude is adjustable by the user. The ACE 5400's basic and straight forward performance is perfect for applications that require a precise, stable RF stimulus. Applications: Testing and aligning CATV return bands; Great for institutional networks.
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Platforms
The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.
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MEMS Optical Sensor Test
For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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HV AC Hipot
The HV AC Hipot package is a hardware and software upgrade available for select Eclypse Analyzers. This package adds a High Voltage AC stimulus source CCA to the analyzer chassis and the HV AC Stimulus utility provides the software drives for ELITE to integrate AC Hipot into test programs.
