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Force
exerts an influence.
See Also: Compression, Crimp Force, Pull Force, Pull off Force, Push Pull Force, Peeling, Tension, Gravity, Electrical, Magnetic
- Virginia Panel Corporation
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50/75 Ohm Micro Coax Contacts
Rated to 3 GHz using RG 316 or RG 178 Max of 10.5 GHz using RG 316 Double Shield.Rated to 10,000 cycles.50 and 75 Ohm impedance.Mating force of 1.5 lb.High density I/O Crimp contact designed for RG 316, RG 178, and RG 179 wire.
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Ultra High Productivity Solution
Universal Encoder 3
*Compatibility - UE3 is 100% compatible with the Force 3 system. Boards can be used as spares for the Force 3 system*Reference Flexibility - Multiple Digital and Analog References*GPS Discipline - GPS timing and assures starts on even sample boundaries for all continuous recording systems*Multiple Radio Support - UE3 can connect simultaneously to 4 High Speed TDMA radios. These multiple high speed radios assure reliable and efficient communication to all of the vibrator units used in High Production Vibroseis Mode*Digital Radio Support - UE3 supports the latest Digital Radios*Analog Radio Support - UE3 also supports legacy analog radios*Ethernet Radios Support - The UE3 includes support for low-power VHF-Ethernet radios. These radios have good speed and work well in many applications*Digital Radio Sims - Digital Radio Similarities are now available for UE3 and Force 3 or VibPro HD vibrator controllers*External USB Port - Use USB thumb drive to offload data from remotely operated UE3 units
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Quartz ICP® Force Rings
Ring-style sensor configurations measure dynamic compression. Tension measurements are also possible if the unit has been installed with proper pre-load. The through-hole mounting supports platform, integrated link, and support style installations using either a through-bolt or the supplied stud.
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Air-bath Film Heat Shrinkability Tester
DRK166
Shandong Drick Instruments Co., Ltd.
DRK166Air-bath film heat shrinkage performance tester, according to ISO14616 air heating principle test method to test the shrinkage performance of heat shrinkable films of different materials, to study the relationship between heat shrinkage force and cold shrinkage force of heat shrinkable films of different materials, and to determine the direction of the test when shrinking.
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Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Mini Power, Contact, ITA, 65 Amp, 8 AWG
610115124
Primary mating contact 610116112. (May mate with other Receiver contacts, as well.)Mini Power contacts carry up to 65 amps continuous current, 480 VAC. Maximum resistance is 1 Milliohms.Specifications Operating Voltage & Current 65 Amps Max. Continuous – 8 AWG40 Amp Max. Continuous – 12 AWG30 Amp Max. Continuous – 14 AWG25 Amp Max. Continuous – 16 AWGContact Resistance 1 mOhms Max.Dielectric WithstandingVoltage (DWV) 1500 VDC Min.Insulation Resistance 1000 MOhms Min.Contact Body BeCuContact Plating 50µ" Au over 100µ" NiContact Termination SolderCycle Life 20,000 CyclesRoHS Directive 2011/65/EU Status CompliantREACH Article 33 Status CompliantECHA Article 59 of Reach Regulation CompliantAVG Mating Force (lbs) 3.37
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1B-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Vehicle Testing Technology
Maschinenbau Haldenwang GmbH & Co. KG.
Vehicle testing technology includes products for testing axle damping, wheel arches and axle and joint play. Diagnostic devices for eg the sound level or clamping force also make their contribution to the targeted assessment of the vehicle condition.
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Scanning Probe Microscopes
SpectraView 2500
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Sensors
YUEQING WINSTON ELECTRIC CO., LTD
Expansion sleeve is a keyless connection device, its principle and use is through the action of high strength tensile bolt, between the inner ring and shaft, between the outer ring and the hub of a huge holding force, in order to achieve the keyless connection between the parts and the shaft.
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Desktop Test Interface Station
2210
TESCO’s new Desktop Test Interface Station (Catalog No. 2210) provides metering professionals with exceptional testing flexibility. The Test Interface Station is ergonomically designed for meter technicians working in a lab or a desktop, yet still rugged for field use. The Test Interface Station includes a zero insertion force (ZIF) meter socket, voltage selection, form selection, open/closed-link selection and bi-directional cabling to power a load box/test kit & connect test standard potentials. When combined with a test kit/test standard and powered via 120 VAC, the Test Interface Station creates a single position, stand-alone, meter accuracy testing device for various socket based meters (both mechanical & solid-state).
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Sauter Force Gauges
Force gauges provide a quick and reliable way to obtain a measure of force in tension and compression. DMV UK offer a comprehensive range of mechanical and digital force gauges with selectable units and peak force capture with capacities from 2 N to 100,000 N. All gauges are supplied with standard accessories, a 2 year warranty, and can be used for force testing in hand held or test stand applications.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1T1-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Force Sensor Elements
TE Connectivity (TE) enables OEMs to measure force using MEMS-based technology load cells. The same proprietary piezoresistive silicon strain gage technology used to measure pressure can also be configured into a reliable, low-cost package to measure force.
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Wire Crimp Pull Sensor
Model MR06-200
The MR06-200 wire crimp pull sensor is a hand-operated solution for measuring wire crimp pull-off forces. The ergonomic handles and convenient tensioning mechanism make field measurements a breeze for applications up to 200 lbF (1,000 N). Squeeze the handles together to increase tension on the sample until a break occurs. The peak force is recorded by a Mark-10 indicator. A rotating turret with slots of multiple sizes accommodates a wide range of wire diameters, up to 0.25 in. (6.4 mm).
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 305gf
K100-H080305-SKAU
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Level Measurement
Displacer level gauge for liquids from KOBOLD Instruments operates on the Archimedes principle. The level gauge's displacer tube rests inside the tank and is connected to the measuring unit via a spring. As liquid level increases, the buoyant forces of the liquid act on the displacer tube to reduce spring tension, allowing the spring to expand. The spring connects to a magnetic actuator, and the motion of the actuator is picked up by a magnetically linked indicator to yield the tank level measurement. The displacer level gauge is calibrated at the factory for the user's specified liquid density. Special designs with higher pressure or temperature ratings, as well as those made of exotic materials, are always available on request.
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1V-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 3.83 (109.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-72J-10
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,700Overall Length (mm): 43.18
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Axial Force And Torsion Testing Machine
Evaluation Testing That Approximates Operating Conditions of Materials and Parts - Loading methods similar to actual usage - Allows simultaneous application of axial and torsional loads to samples
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6-Component Wheel Force Transducer
Whether vehicle dynamics tests, brake tests or determination of load spectra - the new 6-component Wheel Force Transducer WFT-Cx measures all forces and torques acting on the vehicle with high precision. The robust housing reliably protects against dirt, water and snow and allows applications in any weather.
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Nanolattice Standards for Analytical Instruments
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of Electron and Atomic Force Microscopes (AFM). Make the grade, with the highest quality pitch standard of its kind available.
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1B-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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DDR5 X4/x8 78-ball BGA Interposer For Use With U4164A Logic Analyzers
W5643A
The W5643A DDR5 2-wing BGA interposer for DDR5 x4/x8 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A. The W5643A is the smallest BGA interposers for DDR5 x4/x8 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding up to 5GT/s for protocol analysis and up to 4Gb/s for DQ capture. U4208A and U4209A probe/cables connect any W5643A DDR5 BGA interposer directly into the U4164A logic analyzer module using 61-pin high density zero insertion force (ZIF) connectors that attach to the W5643A BGA interposer wings.
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Pressure / Force Sensors
Panasonic Industrial Devices Sales Company of America
Panasonic offers high precision Pressure Sensors for industrial, medical, clean room and other gauge equipment uses. Some include a built-in amplifier and compensating circuit in a compact, low and high pressure Sensor with high accuracy and reliability.
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The Nanoworkbench
In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.
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900 Micron Buffer Fiber Thermal Stripper - TFS-900-250
Shanghai Fibretool Technology Co.,Ltd.
TFS-900 900um buffer thermal stripper design small, lightweight, easy to use and reliable, longitudinal peel, peel force is small, the high quality of stripped fiber; blade durable and easy to replace, using linear bearing guide and thermal stripping to ensure no damage to the fiber, easy to strip coating, stripping speed and other characteristics. With the fixture using the strip dual core optical fiber
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 155gf
K100-K150155-SKAU
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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Custom Testing Solutions
Test and MeasurementEnable increases the robustness of your test and measurement solutions, thereby reducing errors and associated costs. Data Acquisition (DAQ)Enable defines and builds custom DAQ systems for automated measurements of any process or manufactured part. Control and AutomationEngineeringEnable ensures that your processes are programmed to be safe, effective and optimized for both speed and quality. Real-Time and Mission CriticalSystemsEnable develops dependable real-time systems and Hardware in the Loop (HIL) simulations for high-speed applications. Motion ControlEnable creates software for synchronized multi-axis robotic control of velocity, position, force and action. Machine VisionEnable implements software and hardware-based solutions for precise image analysis, data extraction and vision-guided machine control. R&D Systems/Product DevelopmentEnable’s team of engineers and scientists works with you to address and solve problems containing technical challenges and uncertainties. Electronic Test SystemsEnable programs and builds software and hardware-based solutions for accurate measurements, from DC to RF. Mobile App DevelopmentEnable enhances your systems by integrating custom iOS and Android apps. Web DevelopmentEnable enhances your systems by integrating desktop and mobile web frameworks using PHP, CSS and HTML5. Database DevelopmentEnable decentralizes your data storage to be online, secure and accessible from anywhere.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1I40-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Atomic Force Microscope
3DM Serirs
Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
