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Product
Test Finger Probe
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Shenzhen Bonad Instrument Co., Ltd.
BONAD’s test fingers, test probes and test needles comply with IEC 60065, IEC 60238, IEC 60335, IEC 60529 and IEC 61032 standards and are essential instruments for the protection against electric shock of household and similar electrical appliances. For more information, please contact us and BONAD will provide you with professional technical advice and high-quality testing equipment.
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Product
Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25T30-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
3D Guidance®
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The 3D Guidance® electromagnetic tracking solution delivers exceptional performance and value for OEM image-guided interventional and therapy systems and medical trainers that require real-time navigation tracking capabilities. The 3D Guidance solution tracks 6DOF sensors that can be embedded into OEM instruments such as ultrasound probes, rigid and flexible scopes, and laparoscopic tools. Continuous in-vivo tracking is maintained through difficult anatomy, even when sensors are out of sight. Low latency and fast update rates ensure the most subtle tool movements are instantly tracked and visualized within the OEM host interface. The 3D Guidance solution is available in the driveBAY™ and trakSTAR™ configurations, as based on the Electronics Unit. The trakSTAR is a standalone desktop unit that connects to a direct power source. The smaller driveBAY fits inside the drive bay of a computer, OEM imaging cart, or medical trainer/simulator, using the host’s power supply. Both share the same tracking accuracy and reliability. The ready-to-use configuration facilitates cost-effective integration and speeds time to market.
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Product
Sampling Systems And Accessories
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Parker's selection of sampling systems and accessories features fuel-drip bunker samplers; mini-sample cylinder valves; ultral-seal constant pressure cylinders for gas or liquid applications; single-flow, dual-flow and hot-tap probes; spun end sample cylinders for sample transportation; heated-enclosure systems for use with natural gas samplers; and composite gas samplers, among other solutions.
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Product
Temperature Sensors and Temperature Controls
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KOBOLD manufactures a variety of instruments for temperature monitoring and temperature measurement, such as temperature switches, including thermal reed temperature switches and temperature switches for liquids, temperature gauges, temperature transmitters, temperature sensors and temperature probes.
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Product
IEC61032 Jointed Finger Probe
CX-2B
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Shenzhen Chuangxin Instruments Co., Ltd.
Jointed Finger Probe This is the "international" test finger required by most IEC, EN and CSA standards, in addition to many UL standards.
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Product
Temperature Logger for PT1000 Probe
TV-4204
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PT1000 probes are available with this logger and will record down to -200C making them suitable for cryogenic applications. The probes are of 3-wire construction and available probes are listed in the 'You will also need' section.
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Product
High-Voltage Differential Probe, 200 MHz
N2805A
High Current Probe
The N2805A is a 200-MHz differential probe designed to provide superior differential signal measurements with long cable length (5 m), making it ideal in an environment where extended cable length is required. The probe offers 50:1 attenuation ratio, allowing it to be used adequately for up to ±100V DC+peakAC of high voltage differential measurements with high CMRR. The differential probe has a differential input resistance of 4 MΩ and low input capacitance of 4 pF to minimize circuit loading. The probe is powered by Keysight’s oscilloscope AutoProbe interface.
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Product
Stand-Alone Test Fixture
MA 2012/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 15,50 kg
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1Z1-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Replacement Long Alligator Clips for High Voltage Differential Probe
PK-HVA-04
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Replacement Long Alligator Clips for High Voltage Differential Probe
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Product
Probes With Integral Connectors
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Used when quick and easy removal and installation are important requirements at the measuring device. Available in quick-connect, terminal block, m8, m12, and other popular connector styles.
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Product
DDR5 X4/x8 78-ball BGA Interposer For Use With U4164A Logic Analyzers
W5643A
Interposer
The W5643A DDR5 2-wing BGA interposer for DDR5 x4/x8 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A. The W5643A is the smallest BGA interposers for DDR5 x4/x8 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding up to 5GT/s for protocol analysis and up to 4Gb/s for DQ capture. U4208A and U4209A probe/cables connect any W5643A DDR5 BGA interposer directly into the U4164A logic analyzer module using 61-pin high density zero insertion force (ZIF) connectors that attach to the W5643A BGA interposer wings.
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Product
Measuring Device For Measuring Residual Magnetism
Teslameter M-Test LL
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Measure residual magnetism on ferromagnetic materials precisely and reliablyquick detection of residual magnetismreproducible measurement results through automatic storage of the maximum valuesdefined measuring distance of 0.5 mm from the Hall probe to the measuring surfacemeasuring static and alternating magnetic fieldsselectable units: A / cm, Gauss, mTwear-resistant test sample
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Product
DL-HCM Series High-Temperature Solder-In Tip
DL-HCM-HiTemp
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60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1P-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.55 (44.00) - 3.20 (91.00) General Purpose Probe
HPA-50U
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 590Overall Length (mm): 14.99
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1Z-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Cleaner for Test Probe
EQOmat
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We have developed EQOmat, a cleaner exclusively for test probes that removes dust such as flux and solder debris adhering to the tip of the test probe. The structure and thinness built with the user's convenience in mind are important items that have sufficient functionality and are indispensable for long-term use of the probe. * EQOmat is an abbreviation for Ecological Qualified Octopus Mat.
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Product
5 KV Voltage Probe (Single)
5KVP
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5KVP voltage probe allows direct connection between your PowerSight meter and 5,000 Vrms.
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Product
microRSP
M300
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The semi-automatic microRSP-M300 by CAPRES A/S is a unique R&D tool for sheet resistance measurements of conductive surfaces in micro scale. Like the automatic microRSP by CAPRES A/S the semi-automatic microRSP makes use of the micro 4 point probe characterised by having a probe pitch of 1000 times smaller pin spacing/pitch than that of conventional probes.
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Product
4.0mm Hazardous Live Parts Probe
CX-A4D
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Shenzhen Chuangxin Instruments Co., Ltd.
Used to verify protection against access to hazardous parts through top openings. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN61010-1, UL3101-1, and CSA 1010-1. The handle and stop face are made of Delrin. The rod is made of stainless steel.
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Product
50A, 50 MHz CURRENT PROBE, BNC, AC/DC, 50A rms, 75A Peak Pulse
T3CP50-50
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50A, 50 MHz CURRENT PROBE, BNC, AC/DC, 50A rms, 75A Peak Pulse.
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Product
Temperature and Humidity Regulator
H3431-2
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Relative humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy. Three two-state inputs.
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Product
Logic Analyzer
FS2352B
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The FS2352B is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR3 DIMMs. This logic analyzer probe has a CKE qualification circuit that allows for the use of older Keysight logic analysis modules when testing systems using power saving modes.
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Product
Adapters & Pin Converters
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Need to adapt your emulator's JTAG connection? We have a variety of pin converters to help connect your debug probe to your target board's JTAG connection, such as TI, MIPI, ARM, and Cortex.
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Product
Alternate 1.00 (28.00) - 2.00 (57.00) General Purpose Probe
P2663G-1R2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Product
Temperature and Humidity Regulator
H3021
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Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1P-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Complete Graphical Power Quality Analysis System
PK5064-PRO
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The PK5064-PRO is a recommended choice for comprehensive power quality studies, energy audits, load studies, harmonic analysis, and more. Wide-range flexible current probes allow you to get into tight and confined spaces, wrap around large conductors, and measure almost any AC circuit that comes your way.
