Static Code Analysis
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Product
Live-Cell Analysis System
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Analyze your cells for days, weeks or even months as they sit stationary in the stable environment of your tissue culture incubator.
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Product
Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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System Grounding & Earthing Analysis
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ETAP's system grounding & earthing foundation automatically detects the system earthing configuration based on source and transformer grounding or earthing type selection. The resulting earthing types are displayed both on the one line diagram and for the various connected cables.
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Complete Power Quality Analysis System
PK4564-PRO+
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This system contains the essentials for almost any power quality study in the world. Other tiers in the PK4564 class include the standard PK4564 and PK4564-PRO systems.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Time Code Translators
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A universal SMPTE longitudinal time code processor that provides a variety of needed time code processing functions to keep up with the changes and requirements of dealing with multi format longitudinal time code.
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Dynamic Signal Acquisition and Analysis
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m+p Analyzer systems are available for field and laboratory use from 4 to many hundreds of measurement channels. From gathering simple time history data to narrowband (FFT) spectra, fractional octaves, wavelets, shock response spectra and much more, m+p Analyzer real time analyzers can be used with a wide range of instrumentation hardware including our own m+p VibPilot, m+p VibRunner and m+p VibMobile systems, National Instruments (CompactDAQ USB, PCI, PXI) and VTI Instruments (PCI). Low cost portable instruments to systems for distributed measurements can be configured for maximum flexibility. Measurement data from all sources are stored in a common format so it is easy to compare and handle results from any measurement source.
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Portable Bar Code Verifier
Inspector Model D4000 CR2 Scanner
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The Model D4000 CR2 Scanner provide a Point-and-Shoot Traditional Method that also includes the ISO 15416 and ANSI X3.182 Decodability parameter grade. This unique portable bar code verifier can interface with either the patented RJS Auto-Optic scan head or a CR2 scanner (either in a single piece or connected with a cable). Store and print capability, multiple scan averaging and subsymbology choices are easily accessed through a simple four-button user interface. The scanners are easily installed by the user, which makes the unit quickly adaptable to practically any verification requirement.
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ESPI Analysis Application
TP601010
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First released by Intel in June 2013, the Enhanced Serial Peripheral Interface (“eSPI”) is designed as a replacement for the Low Pin Count (“LPC”) bus. eSPI supports communication between Embedded Controller (EC), Baseboard Management Controller (BMC), Super-I/O (SIO) and Port-80 debug cards. eSPI was available in the Sky Lake chipset (2015) and is available in the Kaby Lake [current] chipset. Cannonlake will support eSPI and is slated for release the second half of 2017. Icelake is scheduled for release in 2019 and it will mark the first chipset when eSPI becomes mandatory.
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Product
Signal Analysis
Modal Analysis
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Modal Analysis is used for analyzing pulse and transition characteristics of signals coming from the input channels of FFT spectrum analyzers and seismic stations in real time or recorded time realization view mode.
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Gas Analysis
Si-CA 130
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The Si-CA 130 features a touch-screen display and comes with PC-based management software (in addition to the smartphone app) for more in-depth combustion gas analysis. The three field-replaceable cells and sensors offer expanded measurement capability.
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Component Test and Analysis Laboratories
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The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Product
Shock Response Spectrum (SRS) Analysis Solution
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Shock Response Spectrum (SRS) Analysis SolutionMechanical shock pulses are often analyzed in terms of the shock response spectrum. The shock response spectrum assumes that the shock pulse is applied as a base input to an array of independent single-degree-of-freedom systems. SDOF system assumes that each system hat its own natural frequency.
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Product
OC-3/STM-1 And OC-12/STM-4 Analysis And Emulation Card(w/ GigE And USB 2.0)
LightSpeed1000™
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Voice, data, and video traffic is exploding as smartphones, IP TV, video streaming, and "cloud" based services takeoff. A majority of the backbone transport for these applications continues to be SONET and SDH optical transmission networks. A dominant protocol for IP transport is PoS (Packet over SONET) and another is ATM (Asynchronous Transfer Mode). Both schemes are packet based, with ATM using fixed size packets of 53 bytes called "cells", and PoS using variable packet sizes closely matching to Ethernet frames. GL's LightSpeed1000™ hardware platform (PCIe Card and USB Pod) is capable of OC-3/12 and STM-1/4 wire-speed processing on quad optical ports for functions such as wire-speed recording and wire-speed playback of Unchannelized and Channelized ATM, PoS, and RAW Traffic.
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Tracking Analysis Software
DS-0322
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This software enables tracking analysis with high-speed (calculation speed: approx. at 20ms/4-ch), high-resolution (1000 blocks max.) and high-accuracy (more than 100dB dynamic range). It can plot rotation-tracking diagram during calculation, and also can set and plot the diagram of intended order or frequency after the calculation. *DS-0321 series FFT analysis software is required.
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Industrial ATX Motherboard with 6th/7th Gen Intel® Core™ i7/i5/i3 Processor (Code name: Skylake/Kabylake)
IMB-M43
Motherboard
The ADLINK IMB-M43 is industry's first 6th/7th Gen Intel Core i7/i5/i3 Processor (formerly codenamed Skylake/Kabylake) based industrial ATX motherboard in the LGA1151 package with Intel Q170 Express chipset. The ADLINK IMB-M43 supports high-speed data transfer interfaces such as PCIe3.0, USB 3.0, and SATA 6 Gb/s (SATA III), with dual-channel DDR4 2133/2400 MHz memory up to 64 GB in four DIMM slots.
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Transient Stability Analysis
I*SIM
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PTW I*SIM is a program for transient stability analysis. It is designed to simulate system response during and after transient disturbances such as faults, load changes, switching, motor starting, loss of utility, loss of generation, loss of excitation, and blocked governor events. I*SIM is designed to study today's most challenging simulation problems in one convenient and easy-to-use program.
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Sensing Analysis Software
ENLIGHT
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A single suite of tools for data acquisition, computation, and analysis of optical sensor networks based on the HYPERION system.
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Microwave Furnace for Ash, Bone Content & Carbohydrate Analysis
Phoenix
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The Phoenix line of microwave muffle furnaces offers unmatched versatility and speed in a rugged, easy-to-use system. Choose from two configurations and a variety of options!
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Microscopy Image Analysis Software
analySIS FIVE
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The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
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Product
Code Name: Twin Lake
MIO-5854
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DDR5-4800 up to 16GB4x LAN, 4x USB, 4x UART, 2x CAN-FD, 16bit GPIO, I2C/SMBus2x M.2 Expansions: E-Key 2230, B-Key 2280Support EdgeBMC for OOB(Out-of-Band) remote control
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Failure Analysis – Materials
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Failure analysis – materials is the investigation into the background or history of a sample, or an event, to determine why a particular failure occurred. A product failure may include premature breakage, discoloration or even an unexpected odor. It is useful to know if this failure is a new, unique occurrence or if it has been an ongoing issue. The investigation can involve analyzing the sample as it currently exists and extrapolating from that data what may have caused the failure. A sample of the “good” vs. “bad” product may also be useful for comparison purposes.
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Spectroscopy, Elemental & Isotope Analysis
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Research, production and analytical laboratories worldwide rely on us for rapid, efficient qualitative and quantitative analysis. Our innovative instruments and user-friendly software serve a range of industrial, educational, environmental and health markets. We offer a comprehensive portfolio for the quantification and identification of trace elemental species at ppm to sub-ppt levels in addition to isotopes. We also provide a wide range of lab-based and handheld instruments employing analytical techniques including XRF, FTIR, NIR, Raman spectroscopy, IRMS, ICP-MS and more.
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Time-Series Data Analysis Software
OS-2000 Series
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OS-2000 series have been received well as time-series data analysis software which can perform flexible data-edit from huge amount of time-series data. The OS-2000 series can handle original format of other company's recorder and general-purpose formats of CSV and WAVE. In addition, simultaneous display, layout and overlapping can be performed smoothly without restrictions by the kind of data format or the number of sampling frequency.
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Device Parameter Analysis
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bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Complete Power Analysis System
PK3564-PRO+
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PK3564-PRO+ complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, CASW Weather-Resistant Carrying/Operating Case, and 2-year deluxe warranty.
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Product
IC Side Channel Analysis
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These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
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Product
Packet Analysis Probe for PCI Express
N4220A/B
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When purchased with a logic analyzer, the application software you order is installed on the instrument hard drive. If you need to add application support after your initial logic analyzer purchase or are controlling a logic analyzer from a host PC, you must install the appropriate software before you can make measurements.
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Product
2D Code Reader
LP-ABR10
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Panasonic Industrial Devices Sales Company of America
Code Reading, together with Laser Marking, is widely used to enhance production management and traceability. This is possible because the Code Readers from Panasonic are able to read 2D codes marked directly on products.Now users can combine a Panasonic Laser Marker with the new sensitive 2D Code Reader LP-ABR10 for higher-quality management.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
