Kelvin Probes
Quantify changes in contact surface potential or work function difference of the Kelvin 'Junction' measuring the flow of charge from one material to another.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) Bead Probe
BTP-1C-4
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe
K-50L
High Frequency Probe
Current Rating (Amps): 5Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 1.90Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T1-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4F
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Probe Systems
Mini-PS4L
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The mini-PS4L series of probe systems are built using a similar concept as our patented Probe System for Life (PS4L) Architecture. The base system is built on a 300 mm x 300 mm metric breadboard and that allows the user to configure the system to meet the application and budget.
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Product
Probing Machines
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Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
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Product
Active Probe
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This probe is designed to help auto-technicians in troubleshooting electrical circuits. Apart from using the normal multi-tester, this probe can be used in conjunction with it by providing additional functions to assist in diagnosing electrical or components faults or failures in the vehicle.
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Product
Standard 0.70 (2.00) - 1.70 (4.80) General Purpose Probe
P2262AG-1C1S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Product
Kelvin Test Contactor
cCruiser
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cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.
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Product
High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-J100-3
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50B-QG-75
High Frequency Probe
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00
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Product
Optical Probe
1038
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TESCO’s Optical Probe provides easy, two-way communication between a PC and a meter.
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Product
HPC High Current Probes, 100 – 187 mil (2.54 – 4.75 mm)
HPC
High Current Probe
100 – 187 mil (2.54 – 4.75 mm)
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25J-4
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1J-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72I40-7
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Irradiance Probe
LPRAD01
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The LPRAD01 probe measures irradiance (W/m2) defined as the ratio between the radiantflux (W) passing through a surface and the surface area (m2) in the VIS-NIR (400 nm…1050 nm) spectral range.
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Product
Current Probe
PA-659
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*Maximum Current Value: +/- 150ADC, 100A RMS*1mA = 5mA, 50mA (switchable)*Rising Time: 0.7uS*Bandwidth: DC ~ 500kHz*Over Range Indicator*Battery, AC Power Supply Adaptor (free), dual usages
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Product
Test Probe
UE
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Qosmotec Software Solutions GmbH
Qosmotec UE Test Probe offers more flexibility to testers of mobile networks. It is a compact plug & play multi-UE test probe that allows for tests in UMTS, HSPA+ and LTE standards from any location. It can hold a custom set of up to 8 UEs.
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Product
Voltage Probes
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An oscilloscope is only as good as its probes. Our range includes high voltage, differential, active, low capacitance, and passive types, with ranges to 30kV and frequency bandwidths to 5 GHz.
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Product
Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-F180-2
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Differential Probe
DP-50
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*This is the first detachable design (patent for 15 years)*4 range attenuation selection, easy for operation.*For big power using. Max. Measuring is 7KVp-p.I*t is capable for any brand of digital and analog oscilloscopes.*16MΩ high input impedance.
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Product
Probe
Net-EXP
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The NET-EXP Probe is an expandable probe that can be purchased with an initial amount of bandwidth of as little as 0.5 Gbps and expanded up to 5 Gbps by merely additional software license.
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Product
Probe Cards
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PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.
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Product
Elevated 1.68 (4.00) - 7.00 (198.00) Bead Probe
BTP-1C-7
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3J-1
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type G, Ø1.50mm, 305gf
K100-G150305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style G, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
