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Wafer Thickness Measurement System
MPT1000
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Power Measurement Tool
REAMP
Very accurate and stable power source for projects requiring ultra-low power consumption analysis.
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Analog Modulation and Frequency-Dependent Measurements
Modern lightwave transmission systems require accurate and repeatable characterization of their optoelectronic, optical and electrical components to guarantee high-speed performance.
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Virtual Machine Solution
M22
The M22 Virtual Machine Solution frees up lab space, increases reliability, and optimizes large scale installation's efficiency. With one M22 you can replace 22 desktops in your laboratory. The M22 utilizes shared redundant drives to ensure data and system integrity. The hyper-fast internal bus integrates perfectly with Maccor's MIMS Server ensuring up-to-date data backups.
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Product Test & Measurement Development Software tools
Tequra Requirements
Tequra is a suite of software tools for product test and measurement which enables organisations to develop high-quality solutions faster, simplify support and maintenance, and facilitate continuous improvement.
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Measurement, Communications & Testing
Process & Analytical Instruments division of AMETEK
Measurement Communications & Testing provides the design, integration and installation of critical communication systems, workflow, life-safety solutions and calibration instruments for temperature, pressure and process control. It also is a leader in level measurement devices, continuous position sensors, hardness testers, force measurement devices and retractable cord reels. In addition, it offers a line of weathering test instrumentation along with laboratory and outdoor testing services.
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Digital Instruments and Measuring Transducers
Digital instrumentation devices are installed to display an electrical or process variable, for rapid monitoring and management, normally in industrial settings. This information can be used to detect any alarm that may be triggered by a control value, informing in real time of any malfunction in an industrial, machinery or control system process. The data is shown numerically, and is proportional to the measured parameter and can be integrated into SCADA systems, as long as they have integrated communications.
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Digital Combo Set for Measuring Low-Frequency Signals
SVG-5
- Measurement of root-mean-square AC voltage and frequency of single-ended or differential signals- Measurement of AC voltage frequency of single-ended or differential signals- Generation of sine waves- Visual examination of freeform signals- Signal spectrum analysis
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Vertical Vibration Test Machine
RK-3000
Shenzhen Chuangxin Instruments Co., Ltd.
The vertical vibration test machine is used to test the vibration resistance of the products.
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Sheet Resistance Measurement
The Filmetrics® R54-series and R50-series sheet resistance measurement instruments have been developed based on over 45 years of KLA sheet resistance measurement innovation. The R50 measures metal layer thickness, sheet resistance and sheet conductance. The R54-series adds a light-tight enclosure, along with 300mm support, to provide metal thickness measurement solutions for semiconductor and compound semiconductor manufacturing.
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Measuring and Test Devices
ProfiMessage D
With a ProfiMessage D device, you can immediately begin using a optinal PROFINET interface as well as communicating to third-party systems via an OPC UA Server/Client. The device is also equipped with a display to show important configuration and measurement data. Other special features include universal sensor inputs, high-level data security, and a diverse range of interfaces.
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Measuring Fork Sensors
Leuze electronic GmbH + Co. KG
With the sensors, an infrared light-band illuminates a CCD line. A passing object can thereby be measured by its occlusion. The resolution of 14 µm and the high reproducibility enable the reliable measurement of very fine yarns and wires. The variety of implementable measurement functions enables the position detection of transparent edges, the determination of the thinnest or thickest wire and much more. The vacuum resistance of the devices also enables use in carbon fiber production.
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High Current Resistance Measurement Systems
Measurements International Ltd.
Modular Designed Base Unit with Expanded Capabilities to 10,000 Amp, Complete Turn-key System, Resistance and Temperature Curves, Complete Measurement Systems Available, Proven Technology.
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Dual Digital Display Spring Torsion Testing Machine
Model TNS-S-I Series
Jinan Testing Equipment IE Corporation
This series is mainly used for torsion test of all kinds of torsion springs.
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Reliable CAN Measurement Technology
CNT evo CAN MM Series
The CNT evo is a high-precision measurement module designed for measuring frequencies, pulse widths, incremental displacement measurements, rotation angles, position measurement, event counting and period measurements.
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Temperature & Velocity Measurement
Advanced Thermal Solutions, Inc.
Highly Accurate Instruments for Measuring Temperature & Air Velocity of Electronic Devices.
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Measurement Power Amplifier
Qam
The amplifier is DSP controlled, with a very straightforward operation. Included is a white/pink noise signal generator. The internal signal module provides low crest noise signals to be able to reach high power levels from sound sources or electromagnetic shaker. External input of signal is equally possible, with spectral linearisation or without. This can be used for music, RASTI or any other signal
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Large testing machine for timber
This device is used to conduct a three- / four-point bending test on wooden pillars. To facilitate the adjustment between the bearings, it is equipped with rails on the base as well as a trolley to transport the sample.
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Vapour Permeability Measurement System
Mass Spectrometer vapour permeability measurement system which works across every gas or group of gasses used in modern engineering. This is important as vapour permeability issues effect many performance and safety critical aspects across the engineering industries.
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Code Complexity Measurement Tool
Testwell CMT++
The Code complexity measurement tool Testwell CMT++ (for C, C++ and C#) and Testwell CMTJava (for Java) saves costs and avoids software erosion. For this reasons several standards (like ISO 26262) require the enforcement of low code complexity.
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PIM & Return Loss Measurement
Range to Fault (RTF)
Range To Fault (RTF) is an exciting new technology from Kaelus that enables operators to accurately measure the location of PIM and Return Loss faults in their RF infrastructure. Reflection data together with PIM data provides an unmatched level of clarity for identifying the location of faults in the RF path.
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Basic Pulsed-RF Measurements For E5081A — Up To 44 GHz
S960251B
Add pulsed-RF measurement capabilities to your E5081A ENA-X vector network analyzer.
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Data Logger & Measuring Instruments
Data loggers and measuring instruments of the ALMEMO® series were developed for different measuring tasks and a very wide range of applications. The system consists of a data logger or a measuring device and intelligent connectors, which are used to connect the corresponding sensors. On the instrument side, the versions differ only in the number of measurement inputs. Device types ranging from 1-channel transmitters to measurement data acquisition systems with up to 1000 measurement inputs are available.
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Measuring Amplifiers
VibroMatrix
The VibroMatrix measuring system consists of the USB measuring amplifier "InnoBeamer" and various software modules, which can be put together individually. Suitable for your measurement task. All you need is a computer or a notebook. The software enables you to measure in real time and record your data for later offline analysis in the office.
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WaferPro Express On-Wafer Measurement Program Software
WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
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Loopworks Measure iOS App
Loopworks is a unique suite of online and App-based tools and resources designed by Ampetronic to enable its customers to understand, specify and design Hearing Loop systems.
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Open Source Computer Vision & Machine Learning Software Library
OpenCV
Open Source Computer Vision Library
The library has more than 2500 optimized algorithms, which includes a comprehensive set of both classic and state-of-the-art computer vision and machine learning algorithms. These algorithms can be used to detect and recognize faces, identify objects, classify human actions in videos, track camera movements, track moving objects, extract 3D models of objects, produce 3D point clouds from stereo cameras, stitch images together to produce a high resolution image of an entire scene, find similar images from an image database, remove red eyes from images taken using flash, follow eye movements, recognize scenery and establish markers to overlay it with augmented reality, etc.
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WBGT Index Measurement
HD32.2
HD32.2 is a thermal microclimate data logger to measure WBGT (Wet Bulb Globe thermometer temperature) Index in Hot Environments according to ISO 7726 and ISO 7243.
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Measurement Technology for Teaching and Training
Is particulary suitable for training and further education. With the disturbance emission model, a variety of different experiments which improves one`s understanding of electromagnetic processes in modern electronic engineering are possible. The coupling mechanisms of disturbance emissions are visualized from their sources to the antenna. The impacts of EMC measures are then easier to understand. At VM 251 the electromagnetic d
