IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
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IC & Transformer
Mornsun Guangzhou Science & Technology
MORNSUN launched the self-designed electronic integrated circuits according to the different product lines, types of the integrated circuit include AC/DC power supply control ICs, DC/DC power supply control ICs, interface ICs, start-up ICs, contactor power saving controller ICs and digital isolator ICs. MORNSUN IC chip can be widely used in industrial equipment, process control, data acquisition system, building automation, smart meter, etc. Adopting MORNSUN's AC/DC transformers and DC/DC transformers, with the use of its control ICs, can achieve wide voltage input flyback power supply design with multiple protection functions and superior EMI performance. We hope that those power transformers along with the integrated circuits & chips electronics can be an ideal fit for your application needs.
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IC Test Probes
C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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X-Band Silicon Radar Quad Core IC
AWS-0105
The AWS-0105 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and single beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain and +15 dBm output power during transmit mode and 7 dB gain and +7 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 56 lead 7x7 mm QFN for easy installation in planar phased array antennas.
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Handheld Compact Professional IC Tester
LinearMaster
The ABI LinearMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The LinearMaster is designed for testing analogue ICs with up to 16 pins through a ZIF socket (see ChipMaster for digital devices). A range of adapters is also available for SOIC and PLCC devices.
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Environmental Sensor And Automotive Sensor IC Solutions
With more than 20 years of industry experience, Renesas is an expert in providing sensor technologies that enable our customers to design and build best-in-class sensor solutions. As we expand the breadth of our sensor technologies, Renesas will create unique and differentiated sensor solutions.
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Analogue IC Tester
SYSTEM 8 (AICT)
The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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IC Product Testing & Analysis Services
Integrated Service Technology
Integrated Service Technology Inc.
iST (Integrated Service Technology Inc.) is a leading lab-service company, specializing in the development of IC product testing & analysis, failure analysis, debugging, reliability test, material analysis. Apart from developing testing technologies for the upstream IC design and semiconductor industries, iST also expanded to provide a full-spectrum of services for the mid and downstream companies in the electronics industry.
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Linear IC Tester
570A
The Model 570A Analog IC Tester's built-in test library includes all common Analog ICs including op-amps, comparators, voltage regulators, voltage references, analog switches & multiplexes, opto-isolators & couplers, and audio ICs.
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X-Band Silicon Radar Quad Core IC
AWS-0103
The AWS-0103 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and dual beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain and +15 dBm output power during transmit mode and 7 dB gain and +7 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8V supply, and is packaged in a 56 lead 7x7 mm QFN for easy installation in planar phased array antennas.
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Miniature IC Handler
3270
Chroma 3620 is an innovative system handler for high-volume multi-site IC testing, especially for CIS Testing, at the system level.
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IC-3171, 1.9 GHz Intel Celeron Dual-Core Processor, 4-GigE Port, 2-USB 3.0 Port Industrial Controller
784963-01
The IC‑3171 is a high-performance, fanless industrial controller for developers who require a high level of processing power and connectivity for automation and control applications in extreme environments. The IC‑3171 provides connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. In addition, this controller has onboard isolated, TTL, and differential digital I/O, so it can perform synchronization and control tasks without additional tethered I/O.
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IC-EM2-XMCa, Removable mass storage XMC module
IC-EM2-XMCa
The IC-EM2-XMCa is an XMC storage module dedicated to add mass storage capability to IC Single Board Computers (SBCs) based on VPX, VME and cPCI form-factors.
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IC-3173, 2.20 GHz Intel Core i7 Dual-Core Processor, 4-GigE Port, 2-USB 3.0 Port Industrial Controller
784970-01
The IC‑3173 is a high-performance, fanless industrial controller for developers who require a high level of processing power and connectivity for automation and control applications in extreme environments. The IC‑3173 provides connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. In addition, this controller has onboard isolated, TTL, and differential digital I/O, so it can perform synchronization and control tasks without additional tethered I/O.
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IC-3173, 2.20 GHz Intel Core i7 Dual-Core Processor, 4-GigE Port, 2-USB 3.0 Port Industrial Controller
784966-01
The IC‑3173 is a high-performance, fanless industrial controller for developers who require a high level of processing power and connectivity for automation and control applications in extreme environments. The IC‑3173 provides connectivity for communication and synchronization to EtherCAT and Ethernet CompactRIO chassis, EtherCAT motion drives, GigE Vision and USB3 Vision cameras, and other automation equipment. In addition, this controller has onboard isolated, TTL, and differential digital I/O, so it can perform synchronization and control tasks without additional tethered I/O.
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Passive Probe, 10:1, 1.5 GHz, 1.3 M
N2874A
A compact 2.5-mm probe head diameter, low input capacitance, and fine-pitch probe tip accessories make the N2870A Series ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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SparkFun LED Driver Breakout
TLC5940 (16 Channel)
The TLC5940 is a 16 channel PWM unit with 12-bit duty cycle control (0-4095), 6 bit current limit control (0-63), and a daisy chainable serial interface. This breakout board is a good way to take full advantage of this useful IC. All 16 PWM channels are broken out to standard 0.1" headers, which run alongside convenient voltage and ground rails. Also, because the TLC5940 can be daisy-chained, the breakout is designed to support that feature. On the left-hand side of the board all serial inputs are broken out to 0.1" headers and likewise with output on the right-hand side.
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Environmental Testing
Environmental Testing is the evaluation of a product in conditions which simulate the physical environments that may harm or adversely affect the products performance. Environmental testing can play an important role throughout a product's development cycle to ensure that the materials and manufacturing processes can survive the stresses of the environment in which the product is likely to operate. These environments may include high and low temperatures as well as quickly changing temperatures. Also, temperature humidity environments may also be a factor. Environments with an added media such as dust, ice and freezing rain may also have an adverse effect on products. Listed below are some of Global Testing Services Environmental Testing capabilities
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Magnetic Speed Sensors
We offer the most comprehensive portfolio of magnetic speed sensors ICs, covering the full range of speed and speed with direction, two- and three-wire interface, magnetic encoder (ring magnet) and gear tooth sensing, Hall and GMR technology, and ASIL-compliant options for transmission, wheel speed, engine, e-motors, and many more encoder and gear tooth sensing applications.
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Passive Probe, 10:1, 200 MHz, 1.3 M
N2871A
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Circbord
8003
VECTOR Electronics and Technology, Inc.
Pad per hole & peripheral ground plane.0.085” Square pads etched around each hole on wiring side.Accommodates any type DIP IC device or discrete component.Single sided board with pads and peripheral GND plane on one side only.Single-sided with no etch and plating on reverse side.
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IC Card Meters
Shenzhen Star Instrument Co., Ltd.
Single-phase IC card energy meter adopts dual measurements and raises the bar on tamper detection.
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8 Channel Sample & Hold and Signal Conditioning Board for Group3
All channels provide for voltage division ahead of transient suppression before going into the S&H ICs. Channels that are sampled and held use a common sample and hold pulse that samples while high and holds while low. Jumpers on each S&H chip allow buffering of analog signals where sample and holds are not required. An advantage to the buffers is that it provides a high input impedance for high impedance voltage dividers.
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PLCC-to-DIP Adaptor
Series 352000/353000
PLCC to DIP Adapter. Converts PLCC packaged ICs to DIP footprints. Available with PLCC sockets or PLCC pads on top side. Consult factory for panelized form or for mounting of consigned ICs.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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BGA Sockets
Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
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High-Speed Digitizers and FPGA Development Kit
Keysight unique technology uses proprietary ICs so you can get the most out of the ADCs and FPGAs integrated into the digitizer. On-board real-time algorithm in the FPGA allows fast detection of signal characteristics in various domains.
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10M/100M/1G Ethernet Network Emulator
VirtualNetTM GE
VirtualNet-1G is a high-performance Network Emulator that replicates real world Ethernet network effects such as latency and errors on user traffic in a controlled environment. The VirtualNet-1G emulator uses customized ICs to support full line rate performance at all frame sizes and impairment settings. The emulator can be transparently installed in-line as shown in the diagram below. VirtualNet-1G emulator has an intuitive and easy to use GUI interface and a very powerful TCL based CLI to aid in configuration and testing.
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Near Field Probes 30 MHz up to 3 GHz
RF1 set
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Low Noise Test Leads For N1413 With B2980 Series, 3m
N1425B
The N1425B is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425B is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425B enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425B to the B2985B/87B.
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OX 775 WDM Node
Sharp Vision WDM Node accepts output for Pon EDFA with 3 wavelengths. They separate 1550nm (CATV) into RF output. PON output (1310/1490nm) is provided.- Double IC – 4 Output- Sensitivity : - 12 dBm- AGC : - 8dBm to + 2dBm- Output Level : 106 dB- Frequency : 40 ~ 900 MHz
