Discrete Semiconductor
semiconductor typically having one circuit.
-
Product
Impact Series Power Discrete Semiconductor Tester
-
The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
-
Product
Automated Discrete Semiconductor Tester (ATE)
5300HX
-
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
-
Product
Automated Discrete Semiconductor Tester (ATE)
5000E
-
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
-
Product
Rebuilt Testers
-
Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
-
Product
Semiconductor Test System
-
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
-
Product
EEE Component Testing and Screening Services
-
DPACI performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability commercial, industrial, space, and U.S. military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications. Our engineering experience in electronic parts screening, qualification, and in-house test fixture fabrication allows us to provide value added components in a timely manner.
-
Product
Programmable Parametric Tester For Discrete Semiconductors
IST-8800
-
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
-
Product
Parts Screening And Testing
-
DPA Components International performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability Commercial, Industrial, Space, and U.S. Military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications.
-
Product
(AOI) Automated Optical Inspection Systems
-
For automated defect detection and high-accuracy measurements. VisionGauge Online High-Speed AOI systems are perfect solutions for demanding high-throughput, high-resolution applications. These systems are perfect for a wide range of applications including MicroElectroMechanical systems (for MEMS inspection or MEMS measurement), semiconductor & discrete device inspection and measurement.
-
Product
The Lorlin© Impact Series
-
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
-
Product
Programmable Parametic Tester
IST 878
-
IST Information Scan Technology, Inc.
The IST 878 is a low cost test instrument that provides in-circuit or out-circuit testing for a wide range of discrete semiconductors
-
Product
Semiconductor
-
You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
-
Product
Power Discretes
-
Our power discrete products are high-quality solutions for a wide range of high-voltage and high-power applications. They include a variety of high-voltage Switch Mode Power Supply (SMPS) transistors—Insulated-Gate Bipolar Transistors (IGBTs) Silicon Carbide (SiC) MOSFETs and Silicon MOSFETs—Diodes and Radio Frequency (RF) MOSFETs. Many of our products are offered in single- and combi-packaged options across a variety of voltage ratings, currents, and package styles.
-
Product
Compact Semiconductor ATE
QST286
-
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
-
Product
Semiconductor Testers
-
Designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices
-
Product
Semiconductor
-
Engineered ceramics are used in the semiconductor industry because of their excellent material properties. Ultra-pure ceramics are often used in the whole cycle of semiconductor manufacturing including Semiconductor Wafer & Wafer Processing, Semiconductor Fabrication (Front End), and Semiconductor Packaging (Back End).
-
Product
Discrete Detectors
-
TRAL test station is a quasi-universal test station designed to measure parameters of discrete (or small linear array) infrared detectors sensitive in a wide spectral range from about 700nm to about 16 000 nm (NIR/SWIR/MWIR/ LWIR detectors or broadband non selective detectors). All main types of infrared detectors can be tested: photonic detectors: photovoltaic/photoreconductive, cooled/non-coooled, thermal detectors, pyroelectric detectors etc.
-
Product
Semiconductors on Film-Frame
Ismeca NY32W
-
32-position turret platform for semiconductors on film-frame wafer media, providing highest inspection yield. Integrating innovative hardware and software technologies such as intelligent features that enables extended autonomous operation and productivity.
-
Product
Semiconductor Test
-
Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
-
Product
16-CH Discrete Input 16-CH Discrete Output Modules
HSL-DO16-UC / HSL-DI16-UC
Input/Output Module
- Support 16 DI channels and 16 DO channels- Transmission speeds: 3/6/12 Mbps- RJ-45 phone jack for easy installation- Compact design to meet space limitation and cost-effective requirement- Fuse design to protect digital output channelover-current
-
Product
Discrete Switch Cards
-
Compatible for use on the VXI, LXI, and GPIB platforms, these switch products were formerly sold under the Racal Instruments brand name.
-
Product
16-CH Discrete Input 16-CH Discrete Output Module
HSL-DI16DO16-M-NN
Input/Output Module
- Input voltage: ±40 V (Max)- Output switching capacity: Single channel 500 mA; all channels 60 mA at 24 VDC- Photo couple isolation voltage: 2500 Vrms- Input impedance: 4.7 KΩ- Input current: ±10 mA (Max) , ±12.5 mA (Peak)- 16-CH digital input and 16-CH digital output. "NN" type for NPN sinking type sensor input or dry contact and NPN sinking type output- Slave ID consumption: 1
-
Product
Semiconductor Laser
-
Fibre coupling semiconductor laser. The product range of wavelengths is 450nm~1550nm. The product range of power is 2mW~300W. A Variety of package coupling form,can be integrated indicator light,a photoelectric detector, a semiconductor refrigerator, optical switch function. Solution of flexible and diverse, providing customized service sub system.
-
Product
Semiconductor CharacterizationSystem
Keithley 4200
-
Materials Development Corporation
The MDC CSM/Win-4200 System integrates the extraordinary power of the CSM/Win softwarewith the power of the new Keithley 4200-SCS. Measure capacitance, voltage, and current down to sub-femtoamp levels.
-
Product
Semiconductor Test Platform
PAx
-
PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.
-
Product
Semiconductor Curve Tracer
CS-3000 Series
-
*Max. Peak Voltage : 3,000V（HV mode）*Max. Peak Current : 1,000A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
-
Product
DISCRETE TMTC INTERFACE BOX
-
The Discrete TM/TC Box is a 6U custom 19’’ rack equipment that could be filled with 6U, 4HP plug-ins covering the main ECSS compliant discrete I /Fs. The I/O signals of this box are all arranged in the rear side of the box, keeping clear the front side: in this way no accidental operation could be performed on the box.
-
Product
Semiconductor Functional Verification Tools
Trek5
-
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
-
Product
Semiconductor Inspection (SEMI)
-
A process for detecting any particles or defects in a wafer.
-
Product
Semiconductor Test
Ismeca NY32
-
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.
