Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
-
Product
Burn-In Systems
OPTIMUM Series
-
Advanced Microtechnology, Inc.
The OPTIMUM product line of burn-in systems has a model to meet your individual testing requirements. Please select one of the models below for more specific information
-
Product
Multi-Wafer Test & Burn-in System
FOX-XP
-
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
-
Product
Burn-in Systems
-
Incal Offers A Line Of State-Of-The-Art Burn-In Testing Hardware And Software For Retrofit And/Or Total, Customized Burn-In System Configurations.
-
Product
LED Burn-In Test
-
Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
-
Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
-
Product
Multiple Channel Burn In Power Supply
MCPS
-
The most important features of this burn in power supply is its ability to hold a constant output for each channel even in the event that a unit under test on one channel may short and fail. Since each channel has it''s own transformer, no glitches or voltage spikes can get into any of the other channels. This image shows the results as the second channel from the left is shorted with a small wire and the circuit breaker pops out. Used for burn-in testing and other timed testing where power isolation is required. Very basic simple circuit, see schematic below. Cleans and frees up benchtops, burn in racks and work space clutter. Available in benchtop or rackmount.
-
-
Product
Memory Burn-In Tester
H5620/H5620ES
-
As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
-
Product
RF Bias Burn-In System
-
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
-
Product
Advanced Burn-in and Test System for packaged parts
ABTS-Li
-
High power logic individual temperature control
-
Product
Burn-in Room and Aging Test Chamber
-
Isolated type of burn-in room features: ●Separate the product and loading area, easy to control temperature and maintain. ●Temp. range: 40-70ºC±3/±5ºC, ●Temp. constancy: ±0.5ºC ●Uniformity: ±3ºC ●Test frame materials: painted stainless steel or a combination of forming aluminum ●Insulation: with PU foam ( doors with double glazing ) insulation, so that the internal temperature is not subject to external factors, to achieve power saving effect ●Product hierarchy placement, Selection of layer height in accordance with the requirements, convenient access ●Computer monitoring system is optional. ●Noise level:≤75dB Application Suitable for all kinds of electronic products, especially for products with heating characteristics Product and loading area should be separated Large-scale production
-
Product
Environment And Burn-in Temperature Chambers
9000 Series
-
Delta 9000 Series Temperature Chambers offer a wide choice of temperature ranges and capacities in addition to smart electronics. Field proven by satisfied customers for over four decades, Delta chambers are quality instruments that provide service longevity and integrity unique in their field. Over the years, Cohu has added advanced features to the proven basic chamber design and has refined system components and programming capability to deliver outstanding quality and value.
-
Product
Burn-In Test Fixtures
-
Burn-in generally involves the extended operation of a product in a temperature-controlled environment. With possible humidity and supply voltage margining - the burn-in process can then be extended to include power stress (levels and on/off cycles) tests, high humidity environmental simulation as well as the classic "four corner test" of high voltage + high temperature, high voltage + low temperature, low voltage + high temperature and low voltage + low temperature.
-
Product
Polarity & Burn in Test Systems
-
Our polarity and burn-in test systems are available for components such as multilayer, disc type or hollow ceramics.
-
Product
Burn-in Environmental Test Chamber
-
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's High Temperature Aging Chamber is widely applied for automotive parts ,electronic and electric products ,components and materials by constant high temperature reliability test.
-
Product
RF Burn-In Services
-
Innovative Circuits Engineering, inc
There are many burn-in services that we offer such as HTOL, RFBL, ELFR, LTOL, etc and our focus on quality and customer service when providing burn-in custom solutions is second to none. We work closely with our customers to make sure we provide them with the best possible burn-in regardless of their lot size or pin count. We can also provide you with other electrical stress tests such as THB and HAST, and we can provide you with comprehensive status reports for your tests as they progress whether they be burn-in, THB, HAST or any other test.
-
-
Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
-
Product
Electric Burn-in Board Carts
-
Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
-
Product
Burn-In Test
-
C.C.P. Contact Probes Co., LTD.
Customized Burn-In Test Sockets for temperatures of up to 180°C.
-
Product
Burn-In Tester
-
Universal test bench system. Provides basic electrical measurements at a low cost. Designed for a wide range of electronic products with a dedicated wiring harness. Allows you to expand the scope of functionality. Work in automatic or manual mode. Tailored to the needs of low- and high-volume production
-
Product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
-
Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
-
Product
Memory Burn-in Tester
B6700 Series
-
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
-
Product
Burn-in System
Sonoma
-
High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
-
Product
DC Electronic Loads
-
Electronic Test & Power Systems
An adjustable electronic load gives the test engineer the ability to qualify designs, check production batches or service and repair electrical products. Many applications demand an adjustable electronic load. These include the burn-in of new devices along with general power supply, battery, fuel cell and generator testing.
-
Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
-
Product
Custom PCB Test Fixtures
-
Emergent Electro-Mechanical designs and manufactures customized test fixtures and burn-in racks. Each of our custom designs is unique to our customer's particular project requirements. Emergent fixtures feature innovative design components including a linear collapsing system, interchangeable and reusable plate design, and top and bottom probing.
-
Product
Stability and Shelf Life Test Chambers / Rooms
-
Steady state environmental temperature and humidity walk in rooms for pharmaceutical, medical, electronics, personal care, research and development and consumer products applications. Meets all ICH guidelines. Flexible sizes. For stability and shelf life testing, package testing, accelerated aging, drying, burn in, reliability testing, controlled temperature storage, incubation, and cold room applications.
-
Product
Flame & Other Plastics Testing
-
Educated Design & Development, Inc.
Plastics are tested to determine their flammability burning characteristics (Flame rating), their ignition potential due to thermal and electrical sources, their resistance to electrical tracking, and other electrical characteristics. The specific test required on a plastic depends on the type of component or end-use product, as well as the environment in which the plastic is used. This test equipment meets most UL, CSA, IEC, EN and other international safety standards.
-
Product
Flame Ionization Detector
-
A flame ionization detector converts a hydrocarbon gas concentration into an electrical signal. The flame is hydrogen fueled and burns in hydrocarbon free combustion air. Either side of the flame are two electrodes between which an electric field is generated by means of a polarization voltage. The sample is pre-mixed with the fuel gas and heated in the flame to a temperature at which the hydrocarbon molecules ‘crack’ and CH fragments appear. These CH fragments are oxidated by the oxygen in the combustion air resulting in the formation of CHO+ ions. The ion current then passes to the electrodes and the resulting current measured is proportional to the quantity of C atoms derived from organic compounds.The Thermo-FID features two separate microprocessor controlled pressure compensations to avoid any influence from environmental or sample conditions. In addition, the complete Thermo-FID range of analyzers are equipped with a flame trap that is used as a heated sample inlet filter. The measurement chamber and all material in contact with the sample gas are heated between 120°C and 200°C to avoid condensation.
