Burn-In Sockets
See Also: Test Sockets, Burn-In, BGA Test Sockets
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Product
Burn-In Test
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C.C.P. Contact Probes Co., LTD.
Customized Burn-In Test Sockets for temperatures of up to 180°C.
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Product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
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Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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Product
Semiconductor
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With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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Product
Burn-In Test Sockets
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The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
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Product
Memory Burn-In Tester
H5620/H5620ES
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H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Product
Burn-In Test Fixtures
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Burn-in generally involves the extended operation of a product in a temperature-controlled environment. With possible humidity and supply voltage margining - the burn-in process can then be extended to include power stress (levels and on/off cycles) tests, high humidity environmental simulation as well as the classic "four corner test" of high voltage + high temperature, high voltage + low temperature, low voltage + high temperature and low voltage + low temperature.
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Product
RF Burn-In Services
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Innovative Circuits Engineering, inc
There are many burn-in services that we offer such as HTOL, RFBL, ELFR, LTOL, etc and our focus on quality and customer service when providing burn-in custom solutions is second to none. We work closely with our customers to make sure we provide them with the best possible burn-in regardless of their lot size or pin count. We can also provide you with other electrical stress tests such as THB and HAST, and we can provide you with comprehensive status reports for your tests as they progress whether they be burn-in, THB, HAST or any other test.
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Product
TEST SOCKET
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IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
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Product
Socket Probes
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A lot of companies build test sockets. But only our test sockets are populated with our own proprietary probe technology, developed internally. This assures you that when you purchase one of our test sockets, you are using the most advanced interconnect available.
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Product
X4 With Micro-MaTch Socket
X4-xx-2/4
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High performance, hall-sensed switch with Micro-MaTch socket up to 20 Ncm switching torque, up to 1 Mio switching cycles and optional push function
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Product
Burn-in and Stress Screening Chambers
KDR
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Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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Product
Multi Socket Programmers
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Gang programmers are based around the universal programmers but offer multiple sockets allowing 4 or more devices to be programmed at the same time giving a greater throughput where a large number of devices require programming. Mass production environments churning out tens of thousands of chips a week are where these programmers are typically found.
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Product
LED Burn-In Test
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Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
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Product
Test Sockets & Interposers
Silmat
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Innovative technology platforms and multiple product families for BGA, LGA, QFN and CSP packages down to 0.3mm pitch. High frequency bandwidth > 40 GHz..
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Product
Meter Socket Logger
PM2000
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The PM2000 Meter Logger (USA only) is a 5-channel data logging system built into an electric meter housing. It is ideal for responding to residential voltage complaints and power consumption problems.
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Product
Socket Tester
ST120+
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The Fluke ST120+ GFCI Socket Tester with Beeper checks that each wire in the outlet is properly connected to the building's electrical system. Via the bright LEDs and included chart, you can quickly and easily verify the wiring of an outlet. Able to identify several common wiring errors, including reversed phase and neutral wires and an open ground, the ST120+ will give you confidence on your next job.
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Product
Burn-In System
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The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.
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Product
Hot Socket Simulator
Hot Socket Simulator
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The new TESCO Hot Socket Simulator gives you the ability to investigate meter failure issues related to hot socket phenomenon. The Simulator is equipped with one 2S meter socket with four jaws, one of which is the heated jaw. The arcing/heating apparatus can be moved to any of the four jaws (jaw 1 is the standard). Additional arcing/heating elements can be provided as an option for multiple hot jaws on the existing socket.
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Product
Socket Saver
4690
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The Technobox PMC Socket-Saver permits cost effective volume testing of PMC modules when used with Technobox P/N 3390 ?PMC to PCI adapter for Test.? It may also be used to reduce wear and tear on Technobox P/N 1518/1523 (?Extender/Preprocessor?).
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Product
Socket Testers
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Precision Mastech Enterprises Co.
Handheld electrical tools plugged directly into wall outlets to quickly verify if they are wired correctly and functioning safely.
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Product
Socket Wrench FWZ756
1140763
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The FWZ756 is a specialized tool designed for precision applications, particularly in the realm of threaded probes. As indicated in its description, this socket wrench stands out with a tool size of 1.70 mm, making it ideal for detailed work where accuracy is paramount. With a total length of 100.00 mm and an outer diameter of 2.80 mm, the FWZ756 balances portability and functionality, ensuring ease of use in tight spaces without sacrificing performance. The maximum tip diameter of 2.00 mm allows for versatile probing capabilities, giving it an edge in various technical tasks.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Elastomer Socket
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As a structure made of silicon and conductive powder, elastomer is a good solution for high speed, no ball damage, stable CRES, low force and high frequency testing.
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Product
Socket Tester c/w Buzzer
DL1092
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Clear visual and audible indication RCD test of 30 mA RCD (max time 300 ms) Touch voltage to check for extraneous voltage on earth Compact, durable design in compliance with BS EN 61010
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Product
Low Voltage Burn-in and Test System
Max 450
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For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Product
GFCI Socket Tester
ST120
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The Fluke ST120 GFCI Socket Tester checks that each wire in the outlet is properly connected to the building's electrical system. Via the bright LEDs and included chart, you can quickly and easily verify the wiring of an outlet. Able to identify several common wiring errors, including reversed phase and neutral wires and an open ground, the ST120 will give you confidence on your next job.
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Product
Socket Wrench FWZ733S1
1003954
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The FWZ733S1 is an advanced tool within the category of threaded probes, specifically designed for precision applications. This versatile socket wrench is equipped with a tool size of 3 mm, making it an ideal choice for detailed tasks requiring high accuracy. Its robust design ensures reliability, setting a standard for professional and industrial users alike. The tools and equipment included in this range, such as the probe tool with order code 1000977-F73316B0070G300SP, enhance the functionality and versatility of the FWZ733S1, supporting an array of specialized applications.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
