Semiconductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: iJTAG
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Analysis
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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ANSI X3.28 to Modbus RTU Converter
Model 2399
* Converts ANSI X3.28 commandslinto Modbus RTU packets.* New 32 Address Mode supports multi-channel Modbus Controllers like the Watlow MLS300.* Control Modbus RTU devices from any ASCII serial source.* Serial ports support RS-232 and 2-wire/4-wire RS-485 signals.* Includes serial baud rate conversion.* Internal logic is IEEE-488.2 compatible and uses SCPI commands for configurtion setup.* 2399 mounts on a DIN rail or on any flat panel.* Inexpensive way to maintain manufacturing equipment such as semiconductor fusion chambers, etc as the ANSI Controllers become obsolete.* Application Note AB23-3 describes how to use the 2399 to replace obsolete Watlow Controllers in the Axcelis/Fusion Gemini Asher.* 2399 Serial Keyboard Program lets you control and setup the 2399 and test the ANSI modes.* 239x Table Loader Program uploads ANSI Command Table entries from an Excel csv file.
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Baratron® Isolation Systems
These Isolation Systems are designed to automatically maintain a heated Baratron® capacitance manometer at vacuum throughout a process cycle. Maintaining a heated Baratron® capacitance manometer at vacuum is one of the most important ways to optimize its accuracy and repeatability in production systems, making this product especially well-suited for fast-cycling industrial and semiconductor manufacturing processes.
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Wide Temperature Range HDR USB3.1 Gen1 Camera Board (Color)
See3CAM_CU20
See3CAM_CU20 is a 2.0 MP HDR USB camera board with ultra-Lowlight performance. It has an ability to stream seamlessly at wide temperature range (-40°C to 85°C). This Full HD USB3.1 Gen1(5Gb/Sec.) camera is based on 1/2.7" AR0230AT CMOS digital image sensor with a pixel size of 3.0 μm x 3.0 μm from ON Semiconductor™. It has S-mount (M12) lens holder which allows customers to choose and use the lens according to their requirement. It is a Plug-and-Play camera (UVC compliant) for Windows, Linux. This HDR camera is also backward compatible with USB 2.0 host ports.
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Distributed-Feedback Laser
DFB pro
Distributed feedback (DFB) lasers unite wide tunability and high output power. The frequency-selective element a Bragg grating is integrated into the active section of the semiconductor and ensures continuous single-frequency operation. Due to the absence of alignment-sensitive components, DFB lasers exhibit an exceptional stability and reliability. The lasers work under the most adverse environmental conditions even in the Arctic or in airborne experiments.
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Biased and Unbiased HAST Testing
Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
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High Flexibility VNA Cables
Our lines of high frequency VNA test cables display excellent electrical properties such as wonderful phase stability of +/- 6° at 50 GHz and +/- 8° at 67 GHz as well as VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz. The 50 GHz assemblies are terminated with 2.4mm connectors while the 67 GHz versions utilize 1.85mm connectors. The braided stainless steel armoring surrounding the coax provides a rugged, but flexible cable with a flex life exceeding 100,000 cycles, making these test cables ideal for use in semiconductor probe testing, precise bench top testing as well as lab/production testing where the need for a highly flexible, yet durable cable solution is required. The VNA test cables are also equipped with rugged stainless steel connectors that provide up to 5,000 mating cycles when attached with proper care. Additionally, the flexibility of these cables makes it easier and safer to test a Device Under Test (DUT). A swept right angle 2.4mm and 1.855mm connector option allows these cables to fit in tight spaces and can reduce the length of cable required in many applications.
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UV Meters
OAI’s UV Measurement Instrumentation are the standard for Semiconductor Lithography, MEMS, Sensors, Microfluidics, UV Curing, 3-D Printing, Sterilization, Water Purification and Solar/PVC industries. For over 45 years our meters have earned a reputation for accuracy, repeatability and dependability. We offer full calibration and support services worldwide.
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Semiconductor Package Wind Tunnel
WT-100
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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Wafer Chucks
ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
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Silicon & Compound Wafers
Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Wafer Tester
Tokyo Electronics Trading Co., Ltd.
A vital step in the Semiconductor Value Stream, focusing on electrical screening and consumption of Known Good Die (KGD).
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Probe Card
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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High-resolution, SWIR InGaAs camera
Wildcat+ 640 Series
The Wildcat+ 640 series is based upon a state-of-the-art InGaAs detector with 640×512 pixels and 20 μm pixel pitch. The camera offers superior, high resolution SWIR imaging capabilities, comes in a versatile and industry-proven Wildcat camera package (GenICam compliant) and offers advanced on-board image processing.The Wildcat+ 640 camera outputs full frame images up to 300 Hz via either a CameraLink or USB3 Vision interface.The Wildcat+ 640 is suitable for semiconductor inspection, display inspection (mobile phone and TV), and laser beam analysis.Benefits & Features- Compact and industry-proven camera design- High-resolution SWIR imaging- Advanced on-board image processing performance- GenICam complaint- Flexible optical mount and lens options
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LED
Scientific Computing International
A light-emitting diode (LED) is a semiconductor device that emits light when current flows through it.
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Patented DPEM Process for Die Removal
DPEM (Decapsulate Plastic Encapsulated Module) is DPACI’s patented Turn-Key Solution to replacement of obsolete high reliability devices in legacy systems. From dissolving the plastic encapsulation of a semiconductor device to re-bonding new wires onto a chip or package lead frame, complete solutions are offered. DPACI retains reliability test data as well as customer testimonials for the process and can share this information on a need-to-know basis.
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3.4 MP Custom Lens Low Light Camera Module
e-CAM30_CUMI0330_MOD
e-CAM30_CUMI0330_MOD is a high performance, small form factor, 3.4 MP pluggable Low Light Camera Module with S-Mount lens holder. It is based on AR0330 - a 3.4MP CMOS Image sensor from ON Semiconductor®. It has a dedicated, high-performance Image Signal Processor chip (ISP) on-board that performs the entire Auto functions (Auto White Balance, Auto Exposure control) in addition to complete image signal processing pipeline that provides best-in-class images, videos and the optional MJPEG compressions.
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Automation Monitor
The Automation Monitor is a diagnostic system for remote analysis and troubleshooting of semiconductor capital equipment. The monitor is capable of delivering synchronous streams from strategically located video cameras, sound devices and data sources on the equipment.
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Semiconductor Curve Tracer
CS-5000 Series
*Max. Peak Voltage : 5,000V（HV mode）*Max. Peak Current : 1,500A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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Semiconductors Testing
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Software Development Projects
Precision Development Consulting Inc
Automation of new process tool prototype in startup environment, Complex R&D Gasbox Automation, Semiconductor System Control Software, Wafer Transfer Control Software, 300mm Factory Automation, Complete port of Spectrometer software to windows, HSMS Protocol
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THz Pulsed Imaging and Spectroscopy
TeraPulse 4000
TeraView’s proprietary semiconductor technology gives the TeraPulse 4000 a market leading signal-to-noise specification with over 90 dB at peak. As standard, the TeraPulse offers a bandwidth of 60 GHz up to typically 4.5 THz; with an option to extend this beyond 6 THz.
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5MP MIPI Camera Module
E-CAM55_CUMI0521_MOD
e-CAM55_CUMI0521_MOD is a small form factor, 5 MP fixed focus camera module based on AR0521 CMOS image sensor from ON Semiconductor® has a dedicated, high-performance Image Signal Processor chip (ISP) on-board that performs all the Auto functions (Auto White Balance, Auto Exposure control) in addition to complete image signal processing pipeline that provides best-in-class images and video. This low light camera module can stream uncompressed VGA (640 x 480) at 75 fps, HD (1280 x 720) at 100 fps, 1280 x 960 at 75 fps, FHD (1920 x 1080) at 65 fps, 2560 x 1440 at 38fps, 2592 x 1944 at 28 fps.
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RF Analog Signal Generators
The right solution for your requirements from the broad analog signal generator portfolio of Rohde & Schwarz.With the analog signal generator portfolio we cover the wide range of RF, microwave and mmWave frequencies.Our selection of analog signal generators is characterized by the outstanding signal purity and performance as well as their functionality of the solutions; whether in the high end or midrange area.The solutions benefit industries such as RF semiconductor, wireless communications, aerospace and defense, and also covers tasks featuring development, production and service, and more.
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Semiconductor Testing Equipment
We provide you with various inspection equipment mainly for the semiconductor post-production process. Also, "inspection boards", "measurement control" and "test applications" are available for you to meet your various needs.
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Cleanroom Monitoring System
CRMS
The Kanomax Cleanroom Monitoring System offers turnkey solutions for monitoring needs required by various industries such as pharmaceutical, medical device, aerospace, semiconductor, and automotive.
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50MHz Arbitrary Waveform/ Function Generator
Model 645
Berkeley Nucleonics Corporation
The BNC Model 645 50MHz Function/Arbitrary Waveform Generator delivers many advanced features and user modes than our previous models, with a price that is designed to meet tough economic constraints. New DDS+ technology embraces advancements in the semiconductor industry and leverages state-of-the-art components for both standard and complex functions. The resulting design is a box for every bench, far more capable than the ARBs and Function Generators of the past. We have even incorporated IP support, so a web browser can control the instrument over LAN.
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Leak Detectors
In various market segments from the automotive industry to refrigeration and air conditioning technology to the manufacture of semiconductor components and solar technology our leak detectors provide the highest quality and increased process safety. With an INFICON leak detector, the time and money required for maintenance and troubleshooting of your products will be reduced to a minimum and your ongoing operating costs will be significantly less. An INFICON leak detector, for example, is so highly sensitive that a release of less than one millionth of a gram of gas can be shown to be a leak.
