Semiconductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: iJTAG
-
Product
Compound Semiconductor
-
Scientific Computing International
Semiconductors that are made from two or more elements.
-
Product
Machine Vision Systems
-
BCO uses National Instruments hardware and software tools for image acquisition and processing to address applications such as quality and process control, automated testing for semiconductor, automotive and electronics, intelligent monitoring, and medical imaging.
-
Product
Trace Gas Monitor
GA-370
-
For monitoring quality control of manufactured high-purity gases at air separation and semiconductor plantsGA-370 provides constant, ultrahigh-sensitivity and high-precision monitoring of trace impurities (CO, CO2 and CH4) for quality control at gas manufacturing facilities.
-
Product
Semiconductor Test System
-
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
-
Product
Measurement System
DPS
-
EYCOM develops and manufactures highly accurate and dependablemeasurement systems for permittivity, dielectric loss tangent, or permeabilityby leveraging its accumulated experience and expertise over a long period of time.Capitalizing on such experience and expertise, KEYCOM is committed todeveloping customized solutions for wide range of specific applications such asflexible circuit board, semiconductor, thin film, millimeter wave and microwave frequency board,
-
Product
IV Analyzer / 8 Slot Precision Measurement Mainframe
E5260A
-
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
-
Product
3.4 MP NVIDIA® Jetson Nano™ Camera
E-CAM30_CUNANO
-
e-CAM30_CUNANO is a 3.4 MP 2 lane MIPI CSI-2 custom lens camera board for NVIDIA® Jetson Nano™ developer Kit. This Jetson Nano camera is based on 1/3" AR0330 CMOS Image sensor from ON Semiconductor® with 2.2 µm pixel.
-
Product
PXI Low-Leakage Switched Guard Switching Solutions
-
They are based on the switched guard design principle, and the overall designs assure isolation resistances of up to 1013Ω. This high level of isolation resistance ensures accurate and reliable measurements, making our products ideal for high-precision semiconductor testing.
-
Product
Long Neck Combustible Gas Leak Detector
CD100A
-
UEi Test & Measurement Instruments
The CD100A is the service persons tool designed to detect combustible gas leaks in residential and small commercial applications. Semiconductor sensor responds instantaneously to all combustible gases. The easily adjusted, steady tic rate provides a precise indication of the leak source. The CD100A can be used in tight quarters where others might not fit.
-
Product
Infrared, Near Infrared and Raman Spectroscopy
-
rom the very compact FTIR spectrometer to the world’s highest resolution: Bruker offers the industry's largest selection for demanding routine and High End FTIR research application including the new and unique verTera cw THz functionality.Process monitoring with FTIR / FT-NIR process spectrometers.A complete line of Near Infrared Spectrometers to fit all your needs, including Process Monitoring.FTIR Microscopy and Raman Microscopy and Spectral Imaging for high sensitivity at high spatial resolution.High spectral resolution, high performance Raman and FT-Raman spectrometers for advanced routine solutions.FTIR Gas Analyzers for the fully automated and high precision real-time monitoring of gas compoundsImaging Remote Sensing systems for analysis of gases, liquids and solids.CryoSAS semiconductor material quality control for photovoltaic and electronics industry.OPUS, the "all-in-one" IR and Raman spectroscopy software consists of a suite of software packages that cover both standard and specialized applications.ONET, software for the setup, administration and control of large FT-NIR spectrometer networks.
-
Product
ALD Materials
-
Chemists have synthesized many exciting new precursors for ALD and have created a large number of atomic layer deposition materials, such as coatings with improved properties for metals, semiconductors, insulators, oxides, nitrides, dielectrics, magnetic, and refractive coatings.
-
Product
Hall Effect Measurement system
HMS-3000
-
Hall Effect Measurement System is very useful for measuring Carrier Concentration, Mobility, Resistivity and Hall Coefficient that should be pre-checked in order to grasp the electrical specifications of semiconductor device. Therefore, it is essentially required system to understand the electrical characteristics of semiconductor device.Ecopia’s HMS series consist of constant current source , terminal conversion system by Van der Pauw technique, low temperature(77K) test system and magnetic flux density input system. So, it is well-established system that has all the things needed to Hall Effect Measurement System.
-
Product
Surface Analysis
-
Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
-
Product
Metrology System
IMPULSE V
-
With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
-
Product
LED
-
light-emitting diode (LED) is a two-lead semiconductor light source. It is a pn junction diode, which emits light when activated. When a suitable voltage is applied to the leads, electrons are able to recombine with electron holes within the device, releasing energy in the form of photons.
-
Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
-
MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
-
Product
PXIe-4162, 12-Channel, ±24 V, Precision PXI Source Measure Unit
785680-01
-
PXIe, 12-Channel, ±24 V, Precision PXI Source Measure Unit - The PXIe-4162 is a high-precision, high-density source measure unit (SMU) with 12 identical SMU channels. This module features 4-quadrant operation, integrated remote (4 wire) sensing in each channel for accurate measurements, as well as analog-to-digital converter technology to help you perform high-precision measurements. It also features guard terminals to remove the effects of leakage currents and parasitic capacitances. Additionally, the PXIe-4162 can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4162 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
-
Product
Test Service Offerings
-
ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
-
Product
MASK MVM-SEM® E3600 Series
E3640
-
Ongoing semiconductor process shrinks are driving new demand for stable, highly precise measurement of pattern dimensions for photomask and wafer production. The E3640 satisfies these requirements with industry-leading precision measurement capabilities and upgraded functionality that enhances mask R&D and production efficiency.
-
Product
Software Development Projects
-
Precision Development Consulting Inc
Automation of new process tool prototype in startup environment, Complex R&D Gasbox Automation, Semiconductor System Control Software, Wafer Transfer Control Software, 300mm Factory Automation, Complete port of Spectrometer software to windows, HSMS Protocol
-
Product
Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
-
32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
-
Product
RF & Microwave Signal Generator
SMA100B
-
The R&S®SMA100B RF and microwave signal generator delivers uncompromising maximum performance. It provides the purest output signals while maintaining the highest output power levels with the lowest harmonics, far outpacing the competition. As the world's leading signal generator, it can handle the most demanding module and system T&M tasks in the RF semiconductor, wireless communications, aerospace and defense industries.
-
Product
5.0 MP NVIDIA® Jetson Xavier™ NX/NVIDIA® Jetson Nano™ Camera
E-CAM50_CUNX
-
e-CAM50_CUNX is a 5.0 MP MIPI CSI-2 fixed focus color camera for NVIDIA® Jetson Xavier™ NX/NVIDIA® Jetson Nano™ developer Kit. This camera is based on 1/2.5" AR0521 CMOS Image sensor from ON Semiconductor® with built-in Image Signal Processor (ISP). This powerful ISP helps to brings out the best image quality from the sensor and making it ideal for next generation of AI devices.
-
Product
Backgrinding & Stress Relief
-
Grinding and Dicing Services, Inc.
GDSI delivers complete backgrinding solutions to the semiconductor, MEMS and biomedical industries. Backgrinding is a necessary process step to reduce wafer thickness prior to dicing and final assembly. By utilizing fully automated grinders staffed by highly qualified engineers, GDSI’s grinding procedures produce unsurpassed precision and repeatability.
-
Product
Field-installation Type Simplified Fluoride Ion Concentration Meter(Four-Wire Transmission)
HC-200F
-
HC-200F is connected to a fluoride ion electrode (1009) to detect free fluoride ions in the sample water.(Total fluorine is not detected.) It is suitable for fluoride ion monitoring in effluent from factories, e.g., those of semiconductor FPD and glass manufacturers.
-
Product
Streak Camera
OptoScope S3C-1
-
The S3C-1 is a streak camera based on a semiconductor sensor. Like tube-based streak cameras, the S3C-1 captures changes in light along a line and records the change over time. To record the intensity values, they are sampled and stored with up to 2 GSamples/sec. The line is 65 µm wide and consists of 200 elements along its 5 mm length. Each element consists of a sensitive photodiode with a downstream amplifier.A new and special camera feature is continuous recording. This makes it possible to take recordings of events for which precise information about the time of their occurrence only becomes available after they have taken place. This "post-triggering" simplifies or allows certain applications.
-
Product
Elemental Analyzers for Carbon, Sulfur, Oxygen, Nitrogen and Hydrogen
-
HORIBA Scientific provides inorganic elemental analyzers for a wide range of applications based on the inert gas fusion technique and high frequency heating combustion in oxygen stream.The EMIA Series for Carbon and Sulfur analysis and EMGA Series for oxygen, nitrogen and hydrogen analysis strongly rely on HORIBA’s experience as a pioneer in Non-Dispersive Infrared (NDIR) technology. Both EMIA and EMGA designs meet all requirements for the metallurgical industry. These instruments also help scientists working in other application fields such as semiconductor, battery materials, ceramics and more.
-
Product
Probe Card
-
Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
-
Product
PROBE CARD
-
the electrical characteristics of the individual CHIPs in WAFER that have been completed through the FAB stage during the semiconductor fabrication process
-
Product
Wafer Analysis Systems
Tropel®
-
Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
