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Si
atomic number 14 tetravalent metalloid chemical element.
- TEAM SOLUTIONS, INC.
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Single Port Serial Interface
APCI-7300-3
*PCI interface to the 32-bit data bus. *Asynchronous communication adapter, 1-port serial interface*1 socket for SI modules*Modular structure through SI modules*Configurable as: RS232, RS422, RS485, with or without isolation, or 20 mA Current Loop (active, passive) with isolation*Addressing through software
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Medical Device Calibration
Trescal provides full Medical Device Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Medical Device Calibration services can be delivered at your site or at our lab. Accreditations for our medical device calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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DVB / MPEG Stream Analyzer program
dvbsnoop
dvbsnoop is a DVB / MPEG stream analyzer program, which enables you to watch (live) stream information in human readable form. Its purpose is to debug, dump or view digital stream information (e.g. digital television broadcasts) send via satellite, cable or terrestrial. Streams can be SI, PES or TS. Basically you can describe dvbsnoop as a "swiss army knife" analyzing program for DVB, MHP, DSM-CC or MPEG
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MPEG & DVB Analyzer
The analyzer combines the most important MPEG analyzer features into one single product: Decode all MPEG and DVB service information down to the descriptor level. Current/Next table versions are listed separately. SI information for "other" transport streams is decoded as well. The full range of descriptors defined in MPEG2 and DVB are supported.
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Mass Calibration
Trescal provides full Mass Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Mass Calibration services can be delivered at your site or at our lab. Accreditations for our mass calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Fiber Optic Power Meters
FOD 1202
The FOD 1202 & FOD 1202Si triple wavelength power meters are reliable, rugged and hand-held test product. InGaAs & Si Version with triple wavelength calibration
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Photodiodes
Avalanche
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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Signal Integrity Studio, Analysis & Simulation SW for WAVEPULSER High-Speed Interconnect Analyzer
WavePulser-Signal Integrity (SI) Studio
WavePulser Signal Integrity (SI) Studio is included as a single license in the WavePulser 40iX-BUNDLE or can be purchased as an additional license for offline access to additional users. WavePulser Signal Integrity (SI) Studio combines S-parameter, Impedance profiling and de-embedding measurements, channel and equalizer modeling, eye diagrams and jitter analysis in a single affordable software package for emulating the complete serial data channel.
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Hardness Calibration
Trescal provides full Hardness Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Hardness Calibration services can be delivered at your site or at our lab. Accreditations for our hardness calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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KV CAPS
500 V
Macom Technology Solutions Holdings Inc.
The MACOM KV CAPSTM Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available as unpackaged chips. The chips have gold bonding surfaces on both terminals to enable excellent bonding and minimum contact resistance.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Scanning Slit Beam Profilers
DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Si Detectors & Spectrometers
Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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Pressure Calibration
Trescal provides full Pressure Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Pressure Calibration services can be delivered at your site or at our lab. Accreditations for our pressure calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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AAA Solar simulator
SS50AAA-PLC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
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Electrostatic chucks
Semiconductor substrates such as Si wafers or masks for the next generation of extreme ultraviolet lithography (EUVL) are handled in a vacuum. For nm structures and exact overlay, the reproducibility of the substrate evenness is a crucial factor, as unevenness results in structural distortions. Particles are problematic and heat input as well as thermal expansion must be taken into account.
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Fiber Optic Power Meters
FOD 1202Si
The FOD 1202 & FOD 1202Si triple wavelength power meters are reliable, rugged and hand-held test product. InGaAs & Si Version with triple wavelength calibration
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Radiometry Calibration
Trescal provides full Radiometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Radiometry Calibration services can be delivered at your site or at our lab. Accreditations for our radiometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Resister
Our ARFC type Film Flat Chip Resistor & ARFCN type Thin Film Chip Resistor Network are high precision Metal Film resistors produced with high purity. Alumina Substrate and Ni-Cr-Si Resistor Film based on high precision Etching Technology. The electrode Terminals are made with Spattering Film and Nickel-Solder Plating, and solderability is very good in all Flow, Reflow and Dipping type soldering for Hybrid IC, SMT, PCB etc. Our ARFC Metal Film Resistor & ARFCN type Thin Film Chip Resistor are being produced under the thorough quality control, and are being used widely in high precision and high reliability electronics circuit such as Measuring Instrument, Medical Instruments, Communication and other Industrial Instruments.
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Seismometers
SI value, the so called “velocity response spectrum”, is one of the standards to express an earthquake''s destructive power against structures. SW-74SI is an advanced model equipped with alarm output to 10-step and SI value output.
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Torque Calibration
Trescal provides full Torque Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Torque Calibration services can be delivered at your site or at our lab. Accreditations for our torque calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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DVB Analyzer
DVB Inspector
DVB Inspector is an open-source DVB analyzer, written in java. It can show the logical structure of the DVB SI and PSI data. It also shows bit rate usage data. DVB Inspector can be used to analyse contents; MPEG Video structure, teletext, DVB subtitles, DSM-CC Object carousels.
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Volume Calibration
Trescal provides full Volume Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Volume Calibration services can be delivered at your site or at our lab. Accreditations for our volume calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Flow Calibration
Trescal provides full Flow Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Flow Calibration services can be delivered at your site or at our lab. Accreditations for our flow calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Pressure Meters
An individually-numbered Traceable® Certificate provided with each unit, assures accuracy from our ISO/IEC 17025:2005 (1750.01) calibration laboratory accredited by A2LA. It indicates traceability of measurements to the SI units through NIST or other recognized national measurement institutes (NMI) that are signatories to the CIPM Mutual Recognition Agreement.
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1.3 Million Pixel CMOS Image Sensor
Sapphire 1.3M
This 1.3 million pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 60 fps in full resolution. Novel industrial machine vision application features such as multi ROI and histogram output are embedded on-chip. Very low power consumption enables this device to be used in battery powered applications.
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Avalanche Photodiodes
Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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High Voltage DC Load ISSRs
Series SI
Series SI relays are designed to switch high voltage (high power) DC loads. These devices feature the latest generation of High Voltage IGBT Technology as well as an innovative isolated driver to ensure fast power turn on and OFF. The relays feature triggered control input to avoid linear control risks and fast switching times. The relays also offer an LED for status.Available options include:SI60DC100 100A, 0-500 Vdc Load; 4.5-32 Vdc Control
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Spectrometer
VIS-NIR
Wavelength range is 420 nm to 1100 nm with 4 nm resolutionHD Volume Phase Holographic GratingBack-thinned Si CCD with low noise electronicsExtreme low stray light and high transmissionShort acquisition time and high SNR spectraTEC cooling option availableBluetooth option availableFiber coupled or free spaceOEM Solution
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Solar Radiation Sensors
Ingenieurbüro Mencke & Tegtmeyer Gm
The silicon solar radiation sensor (Si) sensor provides an inexpensive but yet robust and reliable solution for measuring the solar irradiance specifically for the monitoring of photovoltaic (PV) systems. Due to the structure of the sensor element, which corresponds to a PV module, these sensors are ideally suited as a reference for the monitoring of PV systems to determine the solar radiation.
