Boundary Scan Software
Boundary Scan software is a comprehensive toolset for program development and diagnostics for boards designed with boundary-scan devices.
See Also: Boundary Scan, IEEE 1149.1
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Product
Scanning XPS Microprobe
PHI Quantera II
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The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
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Product
Resistance Software
OhmRef
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OhmRef provides the power of automation for Standards maintaining statistical control of resistance values in your laboratory. This program controls a Low Thermal Scanner along with other equipment commonly available in Standards Laboratories to compare resistance standards over the range of 100µΩ to 10GΩ . Comparison accuracies arebetter than 1 ppm in the midranges.
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Product
Software Platforms
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Discover complete solutions for Hardware-in-the-Loop (HIL) and Rapid Control Prototyping (RCP) testing. OPAL-RT offers the most advanced real-time simulation software platforms for power systems, power electronics, aerospace and automotive sectors: RT-LAB (Multi-domain, MATLAB/Simulink® based), HYPERSIM (Power Systems), and NI VeriStand (Automotive).
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NovaFFF Software
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The NovaFFF software is based on a “one Software for all devices” strategy, incorporating system control, data collection and data evaluation as well as reporting.
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Product
3D Scanning Software
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Software is a comprehensive component to any advanced metrology system. Combined with laptops and portable equipment, 3D scanning and measurement is now possible virtually anywhere. 3D scanner software plays a critical role in every stage from the creation of a concept design to the manufacturing and inspection of prototypes. Below is a look at some of the Laser Scanner Software and 3D Scanner Software providers and platforms we represent and handle.
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Product
PC Software
DawnEdit™
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DawnEdit™ is a database editor that customizes data acquisition for vehicles. DawnEdit determines the available parameters and builds a database for each vehicle model, so you only need to select the parameters of interest from a table. DawnEdit configures the DAWN Mini Loggers for OBD, J1939, and analog data.
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Product
Support Software
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MFC classes (MSVC and .NET), VCL components (Borland BCB)Data handling, graphing, logging, Intel DSP librariesTarget boot and download, message exchangeTerminal emulator (console mode) for DSP, boot, download
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Product
Software
Part Tracking
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Part Tracking technology is a software application included in Akrometrix Surface Measurement that increases system throughput while reducing user to user and system to system measurement variation. Part Tracking uses edge recognition technology to locate a part in space and automatically crop/rotate the sample for processing of the found surface area.
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Software Options
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Sonix offers powerful microscopy analysis software to enhance packaged semiconductor imaging, accelerate production and adapt systems based on the ECHO platform to customer-specific requirements.
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Product
NumaView Software
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Teledyne Advanced Pollution Instrumentation
NumaView™ Software provides sophisticated triggers for initiating data logging, including periodic and conditional. The data can be viewed directly on the display over a selected period of time. Results also can be downloaded onto a USB flash drive or via standard T Series I/O ports.
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Product
Scanning Kelvin Probe Microscope
VS-SKP
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The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Software
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Powered by state-of-the-art Discrete Element Modeling (DEM) technology, EDEM quickly and accurately simulates and analyzes the behavior of bulk materials such as coal, mined ores, soil, tablet, and powders. EDEM simulation provides engineers with crucial insight into how bulk materials will interact with their equipment during a range of operation and process conditions.
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ESP Software
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Introspect ESP’s ultra-capable development environment allows you to easily and seamlessly develop and verify all your high-speed digital and mixed-signal algorithms.
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Product
1149.1 Boundary Scan Feature, GTE 10.00p
K8212A
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Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Interconnect Plus Boundary Scan feature enables all the tools required to develop and execute this foundational test method on the board under test.
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Software
TFT Test Systems
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Materials Development Corporation
Model CSM/Win-TFT TEST SYSTEMS allows electrical measurements of thin film transistors (TFT's) used in flat panel displays (FPD's). MDC TFT TEST SYSTEMS can quickly and efficiently measure critical transistor parameters without the need for expensive parametric testers. Various model TFT TEST SYSTEMS are available for testing both linear and saturation characteristics to find parameters like ION, IOFF, mobility, and threshold voltage.
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Software
SLICEWare
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Diversified Technical Systems, Inc.
SLICEWare is an intuitive set-up, control and data viewing software for SLICE NANO, SLICE MICRO, SLICE IP68 and SLICE PRO SIM hardware. Designed to provide fast, easy-to-use tools for data collection, SLICEWare is ideal for both small and large-scale tests. SLICEWare offers advanced features such as automatic sensor assignment, detailed channel diagnostics and real-time data display to support successful data collection every test.
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Product
FEA Software
Autodesk® Nastran®
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Autodesk Nastran FEA software analyzes linear and nonlinear stress, dynamics, and heat transfer characteristics of structures and mechanical components.
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EVT Software
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Emergent Vision Technologies has two software packages available to meet all requirements. eCapture is a standalone imaging package that provides accessibility to all functions of the Emergent Vision Cameras. eSDK is Emergent''s Software Developer''s Kit for integration of Emergent cameras into your system. Both software solutions provide <3% CPU overhead for Windows and Linux when capturing a 9Gbps video stream from the cameras.
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Calibration Software
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System Monitor is a software package for configuring and tuning automotive control systems. It has built-in support for motor sport systems and can be tailored to support third party control units.System Monitor not only allows you to tune data for your program versions, but also manages those versions on disk, allowing them to be located quickly for programming or modification
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Product
Boundary Scan / JTAG Test Development System
onTAP Development
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The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Product
CAD/CAM Software
C-LINK DTM
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C-LINK DTM is the interface between CAD, test and repair, and combines these into one platform. Our CAD/CAM software has since its introduction in 1985 developed into the leading standard tool. C-LINK supports virtually every test system on the market.
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Product
OBDLink SX Scan Tool
425801
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OBDLink SX is the perfect entry level scan tool designed for the do-it-yourself mechanic. Despite its modest price tag, it is packed with advanced features normally found in more expensive scan tools. Includes the latest OBDWiz diagnostic software. USB interface.
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Product
Software And Tools
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Renesas Electronics offers high-quality software, high-function and easy-to-use development tools, an abundant boards & kits lineup for development environment for Renesas microcontrollers and microprocessors. This fully designed development environment helps you develop your system more effectively and efficiently; reduces your development time and cost yet improves the quality of system. Furthermore, we offer various third party products and they will also enable you to have development environment best fit to your needs.
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Software
DPM-3
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Was developed to read and edit Plug and Play Smart Sensors that are compliant to the IEEE 1451.4 Standard. TEDS, or transducer Electronic Data Sheet, is a set of electronic data in a standardized format defined within the IEEE 1451.4 standard. This data specifies what type of sensor is present, describes its interface, and gives technical information such as sensitivity, bridge type , excitation, etc. This information is stored in an EEPROM chip attached to the sensor. By having this chip, the sensor can identify and describe itself to the network and or Smart Load Cell Meter (DPM-3), thereby easing automatic system configuration.
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VisualIMPACT Software
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CEAST VisualIMPACT software is designed to control CEAST Pendulums and Drop Tower Series, manage tests and offer a user-friendly interface when using the Data Acquisition System. It records force and absorbed energy data related to impacts, visualizes and helps analyze the results and calculates resilience. The operator is guided through parameters setup by means of tables describing strikers and specimens that are filtered according to the test type and international standard selected. In the case of instrumented tests, many possibilities for data analysis and visualization are made available. The results are shown through comprehensive and customizable graphs and can be filtered by break type (only specimens with a selected break type are shown). Working with groups of test, the software performs a statistical analysis, and the operator can pick and discard single test results. Different measurement units can be selected. It is possible to print reports and to export data totally or partially. Recent improvements include the possibility to set a number of user profiles, including graphic settings, default printing options, advanced parameters for data analysis and so on, switching quickly from one another when looking at results. The introduction of a new Data Acquisition System (CEAST DAS 64K) in the Impact product line has also triggered a number of new capabilities for the SW, which is now able to process a more comprehensive calibration file for instrumented tups and hammers and manage DAS configurations with a wider range of data acquisition channels.
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Product
Line Scan Camera
Piranha4 Polarization
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The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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Laser Scanning Systems
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QFP markets manually handled and optically tracked 3D laser scanners that set new standards in the metrology measurement industry. The products are characterized by exceptional performance, ease of use and cost-effectiveness and are the perfect solution for the metrology room as well as for the production line, stand-alone or automated.
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Software
DIFFRAC.SUITE
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DIFFRAC.SUITE represents a new software platform offering a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of most modern software technology for maximum ease of use and networking.
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Product
Color Measurement With Line Scan Cameras
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The Chromasens line scan cameras offer new approaches for the color-accurate capture of objects. The chromaPIXA has an internal FPGA-based color calculator which converts the color information of the CCD sensor on-the-fly into standard output color spaces. Algorithms are used which allow a more precise transformation than the usual 3x3 matrix transformation.
