Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Adapter
EXC-1553UNET/Px(S)
The EXC-1553UNET/Px is an intelligent, single - or - dual channel, MIL-STD-1553 adapter. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the MIL-STD-1553 bus, both in the lab and in the field.The EXC-1553UNET/Px shares its API with the entire Px family so that applications currently running on PCI, PCIe, ExCARD or PCMCIA boards will run without change on this device.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.
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Test Enclosures
The HV test hood, developed by us in accordance with EN50191 standard (erection and operation of fixed and temporary electrical test installations), is designed for testing large quantities in ongoing production. The ergonomic design ensures fatigue-free operation even during repetitive work sequences. Equipped with all safety-relevant functions, such as safety switch and locking of the hood cover during the test sequence, the operator is optimally protected at all times.The interchangeable adapter plate within the test cell allows quick adaptation for different test conditions and test situations.
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Manufacturing Test Station
Scan Executive
The Scan ExecutiveTM Manufacturing Test Station is used to apply the same IEEE 1149.1 tests that were developed and used in the lab in a high-volume manufacturing environment without requiring additional development.
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Test Workflow Standard
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Multibus Development and Test Tool for ECUs and Networks
CANoe
The versatile software tool for development, testing and analysis of ECUs and entire networks. Bus systems: CAN, CAN FD, LIN, MOST, FlexRay, Ethernet, WLAN, Car2x ITS G5, AFDX, J1708, ARINC429 > Protocols: TCP/IP, SOME/IP, CANopen, J1939, ISO 11783, J1587, MCnet, GMLAN, K-Line, CANaerospace and ARINC 825. Others upon request.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Software Capabilities
In test system development, the best hardware is only usable if its software control environment is robust and easy to use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
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Eclipse Test Development Environment
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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In Circuit Test Service
In Circuit Test Program Development. Provide you with programming and fixture build as well as schematic review. Will order the fixture from one of our preferred vendors or any Fixture Vendor you prefer.
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Turnkey Data Acquisition Systems
Series 6800
Based completely on the Series 6000 hardware and software platform, Series 6800 is a turnkey system configured for specific measurement types and environments. Systems are available for Strain/Bridge, Voltage/IEPE, Thermocouple and packaged for laboratory or portable applications. Systems range in channel count from 8 to 128 channels and can be easily expanded, should test requirements change. Included turnkey software helps facilities focus on testing, not developing software. If you don’t see a configuration that fits your application, we can likely build a system specific to your needs.
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Multi Protocol Analyzer
LE-8200A
The LE-8200A is the top-level model of battery-powered communications protocol analyzer. The LE-8200A has an enlarged display in response to an increasing demand without degrading the excellent portability of the LE Series. It is ideal for development tests of communications systems and industrial equipment, as well as for after-sale services and communication trouble analysis.
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Digital I/O Vector Development Software
DIOEasy
DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Program Development for Multisite Test
IG-XL
Teradyne’s award winning IG-XL software transforms test program development for the FLEX, UltraFLEX and J750 family of testers. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228B
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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Steering Module Test Systems
Steering test systems for quiet evaluation of rattle, NVH & performance issues – non-hydraulic. The MB Dynamics Steering Module Test Simulator family of technologies (SMTS) is an assembly of components and software designed to facilitate the quiet testing, development, troubleshooting, and auditing of a variety of steering gear and steering column assemblies — collectively referred to here as steering modules (including components).
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Power Device Test Systems
Power semiconductors are devices that control electric power, and are used in automobiles and a wide range of electrical products. Our power semiconductor test systems, developed and provided by CREA, an Advantest Group company, specialize in testing power semiconductors that handle high voltages and large currents, and have special safety features for this purpose.
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Intelligent, Single- or Dual-Channel MIL-STD-1760 Adapter
EXC-1553UNET/Px-1760
The EXC-1553UNET/Px-1760 is an intelligent, single- or dual-channel, MIL-STD-1760 adapter. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the MIL-STD-1760 bus, both in the lab and in the field.The EXC-1553UNET/Px-1760 shares its API with the entire Px family so that applications currently running on PCI, PCIe, ExCARD or PCMCIA boards will run without change on this device.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.In addition the EXC-1553UNET/Px(S)-1760 provides 8 I/O Discrete signals and an IRIG B input.
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PCIe Compliance Testing
Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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4U Compact 42HP CompactPCI Serial Chassis Platform
CPCIS4VC800
The CPCIS4VC800 is a 4U vertical-mount chassis that holdsup to eight 3U slots at a 0.8” pitch. The modular card guidescan be adjusted to allow 1.0” pitch or other spacing in .2”increments. The standard PSU is a fixed 350W ATX, but other options are available. Conduction-cooled card guides arealso available for testing and development.
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Flying Probe Test Programming & Testing Services
Zero Defects International LLC
ZDI utilizes a Seica flying probe tester in order to provide test program development and testing services to customers in Silicon Valley and throughout North America. This is a very cost-effective solution for printed circuit assembly manufacturers who do not have in-house equipment of their own but have customers who require test services.
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Protocol Testing Software
IOL INTACT®
To meet the needs of its higher layer protocol based conformance testing, we have developed a custom software test tool and API, named IOL INTACT® (Improving Networks Through Automated Conformance Testing). A modular and cross-platform API with built in packet generating, scheduling, triggering, and filtering capabilities offering fully automated protocol analysis and testing, the IOL INTACT software is used in a number of our Testing Services including IPv6, Routing, and Home Networking.
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Chassis Dynamometers
Is a device used for vehicle testing and development. It uses a roller assembly to simulate a road in a controlled environment, usually inside a building.
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Compact Protocol Analyzer
LE-1500R
"LE-1500R" is a protocol analyzer (line monitor) dedicated for asynchronous communication monitoring with affordable pricing. LE-1500R can run as a stand- alone by the internal battery for long time and can be remotely controled by a PC or a smart phone via Wi-Fi (Wi-Fi function is available only in USA, Canada, Japan, and EU). The analyzer has a TTL measurement port (which supports UART communication) as its standard port besides RS-232C, RS-422, and RS-485. It can monitor communication data of max 500Kbps for up to 32MB (8,000,000 data) in real time and also can execute a simulation testing of send/receive data. It also has a BERT function (which is not equipped with the analyzers of this pricing level) as its standard function. The correct time stamp, the measurement of idel time (which are the difficult for other software analyzers), and the capturing ability (without missing data) are the best options for trouble shooting and development test of a communication sytem which requires a reliablity.
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VPX/VME64x Hybrid, Type 39 E-Frame, Test Platform (Tall)
39E08ADXC8Y3VG3X
The Type 39 E-Frame, test platform supports development from legacy VME64X to VPX. With a rugged aluminum construction, the versatile 39 E-Frame is 12U to hold 6U cards. The full size (84HP) width holds 17 cards (3 on .8 inch and 14 on 1 inch pitch).
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Data Logging and Analysis With Tecap
Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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JTAG based Test & Flash Programming Services
We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
