Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Product
ISDN Chip Set
Emutel Symphony
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Emutel Symphony is a convenient and flexible Basic Rate ISDN, Primary Rate ISDN and Analog PSTN network simulator. With support for S, U, E1, T1 and PSTN analog interfaces you can use the Emutel Symphony to test and develop a full range of ISDN(E1/T BRIS BRIU) and PSTN analog (FXS) equipment.
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Product
Automated Discrete Semiconductor Tester (ATE)
5300HX
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The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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Product
Development Switches
TTESwitch A664 Lab v2.0
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The TTESwitch A664 Lab v2.0 supports laboratory testing and development efforts for non-real-time to hard real-time operations in distributed systems. The flight-capable TTESwitch Module A664 Pro is the core of TTESwitch A664 Lab v2.0. This enables a reduction in the development cost and time of a flightworthy switch.
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Product
PCB Test And Design-For-Test Services Group
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ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Eclipse Test Development Environment
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The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Product
5-Axis Hardware-In-the-loop Systems
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Combining a 3-Axis Flight Motion Simulator (FMS) with a 2-Axis Target Motion Simulator (TMS) leads to a 5-Axis motion simulator design. This allows comprehensive HardWare-In-the-Loop tests (HWIL) for testing and development of guided missiles, munitions and other inertial systems. Almost 100% of all HWIL systems worldwide delivered over the last 50 years have been designed and built by ACUTRONIC and CARCO Electronics.
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Product
Application Lifecycle Management
ALM
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Manage and track the various stages of an application's life, including requirements gathering, design, development, testing, deployment, maintenance, and retirement.
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Product
JTAG based Test & Flash Programming Services
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We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Product
System Integration
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Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.
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Product
Semiconductor Test Software Solutions
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The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Test & Development
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Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
CompacFrame Type 39PS, Short VPX Payload Test And Development Platform
Type-39PS
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Elma’s Short VPX CompacFrame platform is designed to accelerate development and test of boards designed to fit a smaller form factor of 3U boards (3U x 100mm deep). Accommodates up to 4-slot OpenVPX or 2 VPX power & ground only backplanes.
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Product
Superior Electromechanical Universal Testing Machine
WDW-S Series
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Jinan Testing Equipment IE Corporation
WDW series computer control electromechanical universal testing system for tension,compression, flexure testing is designed according to ASTM, ISO, DIN, EN standards etc.. The electromechanical universal testing system for tension,compression, flexure testing is computer-controlled and precision. Our electromechanical universal testing system for tension,compression, flexure testing is widely suitable for metallic and nonmetallic materials for tension, compression, bending, shearing and low cycle test. The electromechanical universal testing machine features high precision, high stability and high reliability. Graph, test result display, data processing and printing can be done easily by its PC system and printer. Completed with modulus for metal, spring, textile, rubber, plastic and other material test, the electromechanical universal testing system for tension,compression, flexure testing is widely used in many fields such as industry factories, research and development, test institutes and training centers etc. WDW-S series superior materials testing systems adopt robust load frames, precise load weighting system, advanced measuring and control system, and intuitive modular application software. Configured with wide range of accessories for applications, the materials testing systems can provide the best testing solutions for your individual application needs. With 20 years’ experience of materials testing industry and based on abundant application knowledge, we are completely capable of configuring the best solutions and more accurate testing systems for the manufacturers involved in load frame, core measuring and control elements, software package, grip/fixture that based on their specified test application and other requirements.
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Product
3U VPX Development Kit
Software Development Kit
This development kit enables efficient 3U VPX backplane design and software verification.- 3U VPX architecture- One CPU blade, one GPU blade (optional), SOSA-aligned- 1TB NVMe pre-installed in CPU blade- Rear transition module(s) included- Test Frame with backplane pre-installed
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Software
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Alta may have the most advanced COTS MIL-STD-1553 and ARINC hardware devices, and our test and development software is 2nd to none. Alta's software is modular, portable, and made for real-time controls & test -- and designed for rapid integration success. This page provides a brief overview of each product and links to main landings pages.
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Product
Rugged COM-HPC Server Type Size E Reference Development Platform Based On Ampere® Altra® SoC
Ampere Altra Developer Rugged
Software Development Kit
The rugged 4U rackmount server platform provides a cloud-native environment for embedded edge development. It can host the SOAFEE (Scalable Open Architecture for Embedded Edge) providing a cloud-native environment for embedded edge development and is compatible with Autoware Foundation's Autoware Open AD Kit. It supports the open source EDKII as bootloader with UEFI, so customers can just download a stock AArch64 (arm64) ISO such as Ubuntu and install it through booting a live ISO directly on the target. The same convenience we have become used to by using x86 / amd64 target systems.
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Autonomous Vehicle Simulation
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Ansys Autonomous Vehicle Simulation provides a solution designed specifically to support developing, testing and validating safe automated driving technologies. This autonomous vehicle simulation solution saves significant time and costs versus traditional development and testing methods by allowing you to exercise your AV/ADAS software stack in a closed loop, with sensor-accurate synthetic data in software-in-the-loop or hardware-in-the-loop context with the driving simulator of your choice.
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Product
I-Pi SMARC Development Kit Based On NXP® I.MX 95 Six-Core Arm® Cortex-A55, M7 & M33
I-Pi SMARC IMX95
Software Development Kit
The ADLINK LEC-IMX95 is a powerful and versatile SMARC module that delivers high-performance computing, graphics, machine learning, and vision capabilities for IoT and industrial applications. It is based on the NXP i.MX95 processor, which integrates six Arm Cortex-A55 cores, one Arm Cortex-M7 core, one Arm Cortex-M33 core, an Arm Mali GPU, an ISP, and an eIQ Neutron NPU that can run at up to 2 TOPS.
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Product
I-Pi OSM Development Kit Based On NXP® I.MX 93 Dual-Core Arm® Cortex-A55 & M33
I-Pi OSM IMX93
Software Development Kit
The I-Pi OSM IMX93 is an OSM-based smart solution development kit powered by NXP i.MX93 (dual-core Arm Cortex-A55 & Arm Cortex-M33) processor with an in-SoC Arm Ethos-U65 microNPU (Neural Processing Unit).
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Product
Wireless Test Standards Software
test
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
Testing Aircraft Components
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Sun Test Systems develops, produces, installs and services high-quality test equipment for testing various components of civil and military aircraft and helicopters.
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Prototyping & Test Consulting Services Solutions
test
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
EMULATION TESTING
STORAGE
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SANBlaze Technology, Inc. is a pioneer in storage emulation testing technologies and a leading provider of storage, networking and multifunction solutions for embedded systems. SANBlaze emulation systems are deployed in the test and development labs of most major storage hardware and software vendors worldwide.
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Product
I-Pi SMARC Development Kit Based On Intel® 6th Gen Atom® X6425E Quad-Core SoC
I-Pi SMARC Elkhart Lake
Software Development Kit
The I-Pi SMARC Elkhart Lake is a SMARC-based edge solution development kit powered by Intel Atom x6425E quad-core SoC with integrated Intel UHD graphics and comprehensive high speed interfaces. Development-focused, this kit also supports the latest version of the Intel® Distribution of OpenVINO™ toolkit, which features more deep-learning models, higher inferencing performance, and fewer code changes, making developing ever simpler.
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Product
Physical Layer Test System
N19301B
Test System
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Flight Control System Test Platform
Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
