Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Product
Intelligent, Single- or Dual-Channel MIL-STD-1760 Adapter
EXC-1553UNET/Px-1760
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The EXC-1553UNET/Px-1760 is an intelligent, single- or dual-channel, MIL-STD-1760 adapter. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the MIL-STD-1760 bus, both in the lab and in the field.The EXC-1553UNET/Px-1760 shares its API with the entire Px family so that applications currently running on PCI, PCIe, ExCARD or PCMCIA boards will run without change on this device.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.In addition the EXC-1553UNET/Px(S)-1760 provides 8 I/O Discrete signals and an IRIG B input.
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Product
LTE Emulation for End-to-End QOS Validation
IxLoad-Wireless XAir2
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Keysight Network Applications and Security
Ixia’s XAir2 load module provides LTE user equipment (UE) emulation that enables a powerful IxLoad eNodeB Layer 1 to 7 test solution. With complex UE modeling, it offers realistic and easily-configured traffic models and call patterns. Using IxLoad’s real-world subscriber modeling, testers do not need to be protocol experts to develop test realism. From a single tool, users can perform capacity tests, detail a cell throughput, measure voice and video quality, model a wide variety of mobility scenarios.
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Product
Rugged Data Acquisition Systems
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Our team of engineers have decades of experience in performing structural testing in the aerospace, off highway, automotive, construction equipment, pulp & paper, and utility markets. We have used our testing expertise to develop a line of Rugged Data Acquisition (RAC) Systems that perform under harsh testing conditions.
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Product
PCB Test And Design-For-Test Services Group
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ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Product
Flying Probe Programming & Test Development
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Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.
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Product
Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228B
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The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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Product
Visual Fault Diagnostics and Repair System
ScanExpress Viewer
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ScanExpress Viewer™ is a printed circuit board (PCB) CAD data & photograph visualization tool for boundary-scan test development, electronic manufacturing test, and product repair environments.When combined with ScanExpress ADO™ (Advanced Diagnostics Option) for detailed results from ScanExpress Runner™, ScanExpress Viewer displays fault coordinates and connected traces superimposed directly on a board photograph or CAD layout diagram for expedient repair.
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Product
Full test development environment
XJDeveloper
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XJDeveloper is a graphical application that allows you to quickly and easily set up and run tests on your circuit. With XJDeveloper you can reduce your time to market by reusing your test scripts all the way through the product design process and then in manufacturing.
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Functional / Non-functional Software Testing Services
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Expert team with holistic experience and knowledge of software testing, development, and core business processes. We boast a comprehensive suite of software testing services that cover Functional and Non-functional testing,
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Product
Seno-Con Test System
PANTHER 2K QST
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Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
Integrated Test Environment
ITE
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The Integrated Test Environment (ITE) is our solution to handle complex hardware or software test projects.ITE provides features to define and manage requirements and test cases in different documents, link them with each other as well as plan tests and test campaigns. Moreover the tests can be developed, executed and evaluated by considering the linked requirements. Test results can additionally be recorded and finally reported in different, adaptable and configurable reports.
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Product
Pre-Configured Data Acquisition Systems
Series 6800
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Based completely on the Series 6000 hardware and software platform, Series 6800 is a turn-key system pre-configured for specific measurement types and environments. Systems are available for Strain/Bridge, Voltage/IEPE, Thermocouple and packaged for laboratory or portable applications. Systems range in channel count from 8 to 128 channels and can be easily expanded, should test requirements change. Included PI660 turn-key software helps facilities focus on testing, not developing software. If you don’t see a configuration that fits your application, we can build a system specific to your needs.
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Product
Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
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GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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Product
EMP- EMI Solutions
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We have spread our business tentacles and are operating smoothly, through our DELHI NCR branches which are having facilities like Mechanical and Electronic Designs, Manufacturing, Integration and Testing for development and production activities. We have the In-house Environmental and EMI pre-compliance test facilities which guarantee better quality products.It is our pledge to serve the society with more efficient and qualitative output through our open mindedness and creative solutions. We continue with ardent hope that our products will definitely gather more and more momentum with the defence, the private industrial bigwigs and international companies as well. Growing the business tentacles in India, Concept Shapers are embarking upon the drive of expansion of the resources at its disposal. Our resources are our strength, be it human or the space. We firmly believe in the doctrine of ‘Engineering Innovative Concepts to configure a better tomorrow’.
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Product
Digital I/O Vector Development Software
DIOEasy
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DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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Product
Open Top BGA Sockets
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Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Product
Test & Development
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Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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Product
ApTest Services
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Applied Testing and Technology, Inc.
We undertake projects ranging from short term engagements to long term partnering, for customers from startups to the Global 1000. Many ApTest projects encompass a complete outsourced test design and development program, while others involve assisting a client with defining or implementing in-house testing programs.
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Product
Function / Arbitrary Waveform Generators
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Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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Product
Development Switches
TTESwitch A664 Lab v2.0
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The TTESwitch A664 Lab v2.0 supports laboratory testing and development efforts for non-real-time to hard real-time operations in distributed systems. The flight-capable TTESwitch Module A664 Pro is the core of TTESwitch A664 Lab v2.0. This enables a reduction in the development cost and time of a flightworthy switch.
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Product
CXL Compliance Testing
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Teledyne LeCroy offers an integrated and automated Compliance Testing system, for CXL Compliance Testing for developers developing devices based on the CXL Specification.
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Product
EMULATION TESTING
STORAGE
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SANBlaze Technology, Inc. is a pioneer in storage emulation testing technologies and a leading provider of storage, networking and multifunction solutions for embedded systems. SANBlaze emulation systems are deployed in the test and development labs of most major storage hardware and software vendors worldwide.
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Product
IC Tester
ICE1
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The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Product
Audio Test Software
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1. Distortion free stimulus even the equalized stimulus.2. Unlimited channels acquisition and processing. (Hardware limited)3. Human correlated listening test(Bark Scale intensity chart). (Requires large memory)4. Hi Res intensity chart for buzz/pop detection. (Requires large memory)5. Auto equalization method with target dBSPL accuracy.6. TCP client for test framework integration.7. Easy limits and logs development.8. Easy logs visualization module.9. Auto waveform alignment and triggering.(Upto single point alignment accuracy)10. Easy regression testing via TCP client.11. Standard Magnitude, Phase, THD, THD+N, Rubb&Buzz, Pink Noise, Noise Tests.12. Unlimited calibrations and equalization for scaling to different products and stations.13. Lowest test system and test sequence development times.14. Requires minimal training and debugging.15. Automatically avoid Reference speaker play and stop pops.16. WMD/ASIO driver compatible sound cards supported.(B&K 3670 recommended)
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Product
Boundary-Scan DIMM Socket Tester
ScanDIMM
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Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Software for the Development and Implementation of Test Programs using IEEE 1641
newWaveX Suite
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We Have a unique suite of tools to support the development and implementation of test programs created using IEEE 1641 to define the signals and tests. These include the entry-level version of newWaveX (newWaveX–Lite), the development versions of newWaveX (newWaveX–SD and newWaveX–PD) and the complete integrated development environment for IEEE 1641, SigBase. These tools provide everything necessary to work with IEEE 1641, from creating simple signals through to implementing and managing a complete 1641 test environment. All of our 1641 tools are commercial off-the-shelf (COTS) items that may be used stand-alone or integrated into a complete test development environment. newWaveX products may be integrated with third party test executives and associated software.newWaveX is an intuitive user-friendly suite of products that does not require specialist training for users to acquire the skills to develop 1641 programs. Completing the IEEE 1641 User/Developer training course (which uses newWaveX Signal Development for the hands-on element), together with the associated 1 day newWaveX–SD User/Developer training course, provides complete information for the newWaveX user. Further support is provided for users of newWaveX packages under the maintenance agreements for those products.
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Consulting
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Consulting Services by LXinstruments including test process consulting, development of product specifications, pretests and feasibility studies, development of applications and support, examination of test equipment and process capability, and more.
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Product
DC Power Supplies
XG 850
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AMETEK Programmable Power, Inc.
The Sorensen XG Series is an 850 Watt, 1U half-rack DC power supply. The XG Series is the new standard for powerful, programmable DC power systems. Designed for test, production, laboratory, OEM and quality assurance applications, the XG Series provides a wealth of features to ensure accuracy and greater efficiency. It puts clean, reliable power at your disposal and delivers stable, variable output voltage and current for a broad range of development, test and system requirements.
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Product
Reach Power-over-Ethernet (PoE) Testers
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After assembly, electronic equipment manufacturers need to test functionally of their products. They want to provide the most test coverage, in the shortest time, for the least cost. When test engineers develop product test plans, they select the most appropriate off-the-shelf general purpose test equipment available. Reach designs and manufactures custom test equipment which is a better fit than general purpose equipment. It not only reduces test time but also reduces costs.
