Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
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DFT Consulting
SiliconAid Solutions provides expert consulting services for all aspects of semiconductor Design-for-Test (DFT) development and implementation. Staffed by experts with proven track records from major semiconductor manufacturers, SiliconAid focused expertise provides you resources when and where you need them the most.
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AC and DC Power Sources
CFS100 Series
The CFS100 Series programmable AC or DC output power sources are cost effective source of power for development, test and production applications requiring anywhere from 800VA or less to 4000VA of single phase AC or DC output.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Test Bench For Circuit Breaker
SCR ELEKTRONIKS have developed Test Bench for Circuit Breaker to test 2, 5 & 10 at a time. Panel is provided with constant DC current source.
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Development Test Stands for Electric Motors
Development test stands from imc are characterized by high flexibility in electric motor trials. A comprehensive variety of motor types can be tested and a complete range of tests carried out. The mechanical configuration consists of a test bed with a load machine and a torque measuring shaft. The load machine and torque sensor shaft are mounted on a linear guide and precisely aligned axially by means of laser. It can be moved towards the test object on ball bearings, as a complete unit. Especially time-saving: no need to realign the load machine assembly when changing the torque sensor.
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Test & Development
Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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MEMS Test System Development
olidus Technologies’ can design and build a test system customized for your exact needs, using our own or off the shelf components:Custom MEMS Test Systems. We can integrate and assemble test equipment and handling systems to fit your requirements. Custom MEMS Test Software. We can write custom software for device-specific calibration and testing, interfacing various instruments and handling systems, or create a customized GUI. We can also adapt our standard STI Test Software to work on your hardware system.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228A
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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Type 39, E-Frame with a 4-slot 6U P&G VPX BP, 600 watt PSU
39E04ASXC8Y2VCF0
The Type 39 E-Frame test platform supports 4-slot test & development platform for 6U VPX and OpenVPX™ boards.
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Test Development Solution
Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete "turn-key" service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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Test Program Sets (TPS)
Data Review, Corrections, & Generation (Reverse Engineering). Technical Requirement Documentation (TRD). Test Strategy Reports (TSR). Test Program Development – Software. TPS Sell-Off & Acceptance. Life-Cycle Support. Technical Interface Test Adaptors (ITA) – Hardware. Training - TPS Development, ATE/TPS Operator, Fault Diagnostic, ATE Maintenance.
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Multichannel Memory-Mapped ARINC 708/453 Interface Card
EXC-708mPCIe
The EXC-708mPCIe is a multichannel, memory-mapped ARINC 708/453 interface card that supports two ARINC 708/453 channels, each programmable as transmit or receive. Each channel implements a 64K x 16 FIFO and supports polling and/or interrupt driven operation. The card complies with the PCI ExpressTM Mini Card standard. It’s small size and suitability for Mini Card compatible computers make it a complete solution for developing, testing, integrating 708 interfaces and for performing system simulation of the ARINC 708/453 Weather Radar Display databuses, both in the lab and in the field. In Transmit mode, each ARINC 708 word is written to the FIFO as a block of 100 16-bit words. In Receive mode, each ARINC 708 word is stored in the FIFO as a block of 103 16-bit words. The first two words comprise the 32-bit Time Tag, indicating the word’s time stamp. The next 100 words comprise the 1600 bits of the ARINC 708 word, which are followed by the Status Word.The EXC-708mPCIe card comes complete with C drivers including source code.
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Functional Tester
ESF-2003
The functional tester developed on the basis of our experiences in electric parameters testing technique.Accumulated with 30 years of experiences in electronic testing, Shindenshi Corporation develops this ESF-2003.Shindenshi will provide suitable products to customer for their need.
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Boundary Scan Program Development Service
No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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Functional / Non-functional Software Testing Services
Expert team with holistic experience and knowledge of software testing, development, and core business processes. We boast a comprehensive suite of software testing services that cover Functional and Non-functional testing,
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VXI Switching
The Aerospace and Defense industries were early adopters of modular test platforms. One of the first successes was VXI test systems and VXI switching. They served these industries very well for more than 20 years. Now, as VXI test systems become obsolete, test systems developers are looking to PXI as the next generation modular test platform for their industries. We offer a few different references to help you in making a switch to PXI.
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Multi Protocol Analyzer
LE-8200
The LE-8200 is the top-level model of battery-powered communications protocol analyzer. The LE-8200 has an enlarged display in response to an increasing demand without degrading the excellent portability of the LE Series. It is ideal for development tests of communications systems and industrial equipment, as well as for after-sale services and communication trouble analysis.
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Product Test & Measurement Development Software tools
Tequra Requirements
Tequra is a suite of software tools for product test and measurement which enables organisations to develop high-quality solutions faster, simplify support and maintenance, and facilitate continuous improvement.
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PLD ISP Feature, GTE 10.00p
K8220B
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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SPARK PC Development System for PCIe Cobalt, Onyx, Flexor and Jade Boards
Model 8266
The SPARK® Model 8266 is a fully-integrated PC development system for Pentek Cobalt®, Onyx®, Flexor®, and Jade™ PCI Express (PCIe) software radio, data acquisition, and I/O boards. It was created to save engineers and system integrators the time and expense associated with building and testing a development system that ensures optimum performance of Pentek boards.
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USB Controlled Multi-Function DAQ For ATE Education And ATEasy Training
GT98901 Series
The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users with a simple yet complete vehicle that replicates many of the stimulus and measurement functions associated with ATE systems. When combined with Marvin Test Solutions' ATEasy® Test Executive and Test Development environment, the GT98901 is the ideal product for creating and supporting ATE training and education applications.
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Automatic Test Equipment, Test Interface Units and Test Program Sets
Axis Aerospace & Technologies Ltd.
AXISCADES is a pioneer in Test Solutions and has a long pedigree in developing Test Systems. AXISCADES has designed and developed Automatic Test Equipment, Test Interface Units/Interface Test Adapters and associated Test Program Set Software for Indian and Global, Aerospace and Defence OEMs and End Users.
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JTAG Boundary Scan
Our partnership with JTAG Technologies enables us to provide you with a comprehensive JTAG Boundary Scan Test Development Service.
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Chassis Platform Accessories
Embedded Computing Systems require more than just a chassis housing with backplane, power supply, cooling and payload boards. To complement our wide range of systems, Elma offers a comprehensive range of system level accessories, including I/O solutions, HMI displays, system/power management controllers and test & development boards.
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5-Axis Hardware-In-the-loop Systems
Combining a 3-Axis Flight Motion Simulator (FMS) with a 2-Axis Target Motion Simulator (TMS) leads to a 5-Axis motion simulator design. This allows comprehensive HardWare-In-the-Loop tests (HWIL) for testing and development of guided missiles, munitions and other inertial systems. Almost 100% of all HWIL systems worldwide delivered over the last 50 years have been designed and built by ACUTRONIC and CARCO Electronics.
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Device Testing
S-TEST Lab
SPEKTRA Schwingungstechnik und Akustik GmbH Dresden
S-TEST Lab solutions have been tailored for system level testing in development and lab environments. The core component is the S-TEST desk system. It combines a compact design with the full test interface, that enables the developer to react flexible on changing requirements already in early project phases and to also verify product performance parameters.
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RFID Test Instrument
RAIN Xplorer
The CISC RAIN Xplorer is a unique RFID test product developed for convenient tag frequency sensitivity, communication range, and backscatter measurements. The RFID tester is designed for open area tests and measurements in an RF-controlled environment using portable or fixed RF test chambers. The system is supplied with software and a reference tag for self-calibration.
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PLD ISP Feature, GTE 10.00p
K8220A
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
