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Product
Profile Measurement System
GapGun
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Third Dimension Software Limited
The GapGun is a laser gauge, profile measurement system that quickly and accurately quantifies local features such as gap and flush, step, weld and mismatch, radii, scratches, seals, dents, rivets and fasteners. It is a proven technology, used worldwide by most major automotive and aerospace OEMs, with over 1,000 units sold.
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Product
S-parameter Measurement System
DPS21
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Unlike a coaxial tube type or a wave guide tube type, this method does not make errors caused by air-gap as specimens are not put into a fixture. Practical data can be obtained even at the rough, uneven surfaces where the specimen is placed on.It enables compactness and measuring specimens by plane wave because of direct installment of lens with an antenna.It enables measurement by monitoring S21 and S11 parameter with connections of a test fixture to a vector network analyzer and PC.
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Product
Time Measurement Unit
TMU
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TMU is a dual-channel input and ARM input PCI-based time interval counter (Time Interval Counter) . The internal 40 - bit counter provides a series of precise measurements, including frequency, period, time interval, pulse width, and more. TMU uses a reciprocal counting technique , which enables low-frequency signal measurement, taking into account both measurement accuracy and measurement time. The generator creates and generates many versatile waveforms. The following are the outstanding features of the CT-50 .
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Product
Electrical Test & Measurement Products
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Electrical Test & Measuring Products, Including Clamp Meters, Voltage Testers, Multimeters & Test Kits
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Product
16-Channel VME Current Source & Analog Measurement Module
V460
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The V460 is a VME-based versatile source/measurement unit. It includes a programmable constant-current source, a precision programmable gain 16-bit analog-to-digital converter, and a 4-wire, 16-channel analog multiplexer. An internal microprocessor supervises channel scanning according to user loaded parameters, reporting sensor voltage drops or, for selected sensor types, engineering-unit data.
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Product
Reflex Reflector Measurement Systems
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Photometric Solutions International Pty Ltd
The measurement setup involves using a projector to illuminate the test item, and then measuring the luminous intensity of the light reflected from the test item. The ratio of the luminous intensity emitted by the reflector (in candelas) to the illuminance on the reflector (in lux) is the coefficient of luminous intensity or CIL (cd/lx).
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Product
Data Logger For Temperature Measurement
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Leading Manufacturer of data logger for temperature measurement from Satara.
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Product
PXI Source And Measurement Unit Family
PXS840x
Source Measure Unit
The PXS(e)840x is a high precision, high speed source and measurement unit, which is designed for automated high throughput testing.
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Product
Code Complexity Measurement Tool
Testwell CMT++
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The Code complexity measurement tool Testwell CMT++ (for C, C++ and C#) and Testwell CMTJava (for Java) saves costs and avoids software erosion. For this reasons several standards (like ISO 26262) require the enforcement of low code complexity.
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Product
EMI Measurement Application
Fsx-k54
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The EMI precompliance application (K54 option) for Rohde & Schwarz signal and spectrum analyzers is the ideal extension for EMI analysis during product development and to prepare for a smooth product certification process. Typical fields of application include commercial, automotive, avionic and military product developments (CISPR, EN, FCC, DO-160 and MIL-STD-461 standards).
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Product
Insulation Resistance Measurement
MI15KVe
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The MI-15KVe High-Voltage insulation tester is a truly portable device that allows the measurement of insulation resistances using test voltages up to 15kV.
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Product
Temperature Measurement Interments
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Most everyone wants to know the temperature on a daily basis, so we rely on accurate thermometers to give us this information. Testo manufactures a fully comprehensive offering of temperature solutions employing different senory technologies among a full assortment of measuring devices, all supported with a great probe selection to fit nearly any application.
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Product
Magnetic Property Characteristics Measurement System (from 100kHz to 14GHz)
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KEYCOM’s magnetic property characteristics measurement system delivers ideal measurement solutions for complex permeability μr''- jμr'''', ferromagnetic resonance relaxation coefficient α, resonant line width ΔH in wideband from 100kHz up to 14GHz.
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Product
Temperature Measurement
K- TC16
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The K-TC modules belong to the Influx K-series instrumentation range for CAN applications. The stackable K-TC is an ideal for those applications that require a large number of thermocouples for example vehicle durability, winter and summer testing.
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Product
X-Series Measurement Applications for Signal/Spectrum Analyzers
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The X-Series applications are proven, ready-to-use measurements for signal analysis. Simplifying complex tasks and delivering repeatable results, the applications let you see and understand the performance of your cellular, wireless and aerospace/defense devices and designs.
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Product
Measurement System
A0010A RIN
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Realizes world's widest 40 GHz measurement bandwidth with high-sensitivity, low-noise 40 GHz optical receiver and Agilent high-performance X-series signal analyzer. SYCATUS developed unique calibration method, which achieves high accuracy and repeatability.
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Product
Photoluminescence & Electroluminescence Measurement System (PL/EL)
PL
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PL/EL Measurement System includes Laser, Spectrometer, Lock-in amplifier, Optical Chopper, Sample Holder(PL/EL), PMT/CCD, Fiber, Optical optics, Optical Table, Refrigerator（low temperature）,Sample Chamber and related accessories;
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Product
On-board Emissions Measurement System
OBS-ONE PN Unit
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The OBS-ONE PN unit is an on-board emissions measurement system for analyzing the solid particle number concentration within the specified particle size range under real-world driving conditions. The unit uses a condensation particle counter which is recommended principle by the Particle Measurement Programme (PMP), one of working groups affiliated with UNECE.The PN unit combines with the GAS unit to measure the specified exhaust gas components, along with the exhaust gas flow rate, the GPS position, and the atmospheric conditions (temperature, humidity, pressure).
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Product
Shaft Power Measurement Kits
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Shaft Power Measurement Kits are available in two formats, the standard and the compact kit. The compact kit is ideal for single day trials, while the standard one is used for long duration trials of between 30-60 days.
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Product
Phasor Measurement Unit Calibration System
6135A/PMUCAL
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The 6135A/PMUCAL system is the only fully automated and traceable PMU calibration system available today. It fully complies to the IEEE C37.118.1™-2011 and section 7 of IEEE C37.242:2013 standards for PMU operation and verification.
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Product
IV Analyzer / 8 Slot Precision Measurement Mainframe
E5260A
Mainframe
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
Color Measurement With Line Scan Cameras
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The Chromasens line scan cameras offer new approaches for the color-accurate capture of objects. The chromaPIXA has an internal FPGA-based color calculator which converts the color information of the CCD sensor on-the-fly into standard output color spaces. Algorithms are used which allow a more precise transformation than the usual 3x3 matrix transformation.
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Product
Automated Measurement Expert (AMX), VNA Plugin
S94702A
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The Keysight automated measurement expert (AMX) is a smart software solution for automated multiport S-parameter measurements with the PXIe vector network analyzers M937xA/M9485A or the benchtop E5080A ENA network analyzer. The S94702A AMX VNA plugin adds S-parameter measurement capabilities to the Keysight test automation platform (TAP). The combination of the TAP and the VNA plugin forms the AMX backend software, which makes the VNA setups and executes the test sequences in the PXIe controller according to the optimized test sequence files generated by the AMX test plan builder. Other instrument plugins allow you to control the DUT mode, expand the number of test ports with the PXI switches or multiport test set, and use external instruments such as a DC power supply and a digital multimeter. The AMX backend software also provides step-by-step calibration wizard for full multiport calibration using the 4-port ECal module.
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Product
Photonics / Light Measurement
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A multidisciplinary domain that involves the generation, control, manipulation, and detection of light.
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Product
Spectroscopic Ellisopmeter for Simple Thin Film Measurement
Auto SE
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The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
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Product
Impedance Measurement
CITS880s
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Finer geometries and thinner copper can present a challenge for fabricators measuring impedance on leading edge PCBs. The CITS880s answers that challenge with the introduction of Launch Point Extrapolation (LPE). LPE extrapolates the TDR response back to a point close to the start of the transmission line effectively allowing to users more accurately to measure the instantaneous or incident impedance of the line.
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Product
CD Measurement and Advanced Film Analysis
FilmTek CD
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Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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Product
Return Loss, Impedance & Balance Measurement Accessory
Model SLM620-1
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For Loss- Frequency Range : 300Hz to 620KHz.- Impedance : 60 to 1000 ohms (40dB maximum).- Accuracy : ±1dB (upto 300KHz) ±2dB (300KHz to 620KHz).For Impedance- Frequency Range : 300Hz to 620KHz.- Impedance : 60 to 3000 ohms.- Accuracy : ±10% (upto 300KHz) ±20% (300KHz to 620KHz).
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Product
SolarIV Series Solar Cell Current Voltage Measurement System
SlarIV
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SolarIV IntroductionOne of the key measurements needed for photovoltaic devices in the measurement of their I-V characteristics. Through measuring the I-V curves the user can determine physical performances of devices such as photo-electric conversion efficiency, fill factors and so on. Such data is important for reliable work in research and quality inspection. ZOLIX supply the SolarIV system and the most perfect, professional technical support.
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Product
Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems
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QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
