Discrete Semiconductor Testers
check connected individual semiconductor components.
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Semiconductor
The semiconductor industry faces continuous pressure to reduce device size and costs while improving performance and reliability. Semiconductor, test and assembly automation manufacturers demand the same improvements from the motion technology which drives it. Haydon Kerk Pittman continues to develop new technologies in motors, lead-screws, gears, encoders, actuators, slides, drives and complete sub-systems that increase operational speeds and accuracy while lowering the cost of ownership.
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16-CH Discrete Input 16-CH Discrete Output Daughter Board Module
HSL-DI16DO16-DB-NN
- Slave ID consumption: 1 16-CH NPN sinking type sensor inputs or dry contact and 16-CH - NPN sinking type outputs- Photo couple isolation voltage: 2500Vrms- Input impedance: 4.7KΩ- Input current: ??10mA(Max), ??12.5mA(Peak)- Input voltage: ??40V (Max)- Output switching capacity:300mA/ch at 24VDC- Terminal Base:HSL-TB64 or HSL-TB32-DIN- LED indicator: Power, Link and I/O status
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Discrete Devices High-speed Testing System
QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Semi-automatic Semiconductor Probe Assembly Equipment
The components of the incoming parts are pre-assembled and preloaded to two packages. We use a high-speed four-axis robot equipped with high-precision multi-sensor grips to grab these pre-assembled subcomponents. Under CCD visual guidance, a set of rotary grab devices is equipped to capture top plunger. The device uses a multi-set CCD visual module to ensure accuracy, and the positioning accuracy of each motion link is controlled within 15um.
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Semiconductor Test Equipment
IC Tester
Equipment to determine the pass/fail of devices in the wafer inspection process and the final inspection process after packaging.
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Semiconductor Package Wind Tunnel
WT-100
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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DISCRETE TMTC INTERFACE BOX
The Discrete TM/TC Box is a 6U custom 19’’ rack equipment that could be filled with 6U, 4HP plug-ins covering the main ECSS compliant discrete I /Fs. The I/O signals of this box are all arranged in the rear side of the box, keeping clear the front side: in this way no accidental operation could be performed on the box.
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Atlas DCA Pro Advanced Semiconductor Analyser
DCA75
The DCA75 is a great instrument for identifying and testing a wide variety of semiconductor components. Just connect any way round! The DCA75 will perform the following:*Display component type (such as N-CH MOSFET, darlington transistor etc).*Display component pinout (such as drain, source, gate etc).*Display detailed parameter measurement.*Plot characteristics curves on your PC.
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Power Discretes
Our power discrete products are high-quality solutions for a wide range of high-voltage and high-power applications. They include a variety of high-voltage Switch Mode Power Supply (SMPS) transistors—Insulated-Gate Bipolar Transistors (IGBTs) Silicon Carbide (SiC) MOSFETs and Silicon MOSFETs—Diodes and Radio Frequency (RF) MOSFETs. Many of our products are offered in single- and combi-packaged options across a variety of voltage ratings, currents, and package styles.
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Rub Tester and Abrasion Tester
RT4
This comparative test works by abrading a printed sample against a reference material under known conditions. The results can be used to identify alternative substrates, better ink and coating formulations or the suitability of finished cartons, films or printed books, magazines and promotional materials.
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ITA, G18, 18 Module With Discrete Wiring And PCB Capability
410120101
ITA, G18, 18 Module with Discrete Wiring and PCB Capability
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Semiconductor
Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.
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Semiconductor Authenticity Verification & Anti-Counterfeiting
JTAG Interrogator
Top manufacturers have used JTAG tests for years to ensure electronic systems are free from defects and assembled correctly. With growing uncertainty in supply chains and the proliferation of counterfeit components, that same technology can be used to verify the authenticity of system components.The Corelis JTAG Interrogator is an affordable solution for semiconductor verification. The software and hardware system provides the means to quickly identify components on an assembled electronic product by reading available information from the JTAG chain. Components can also be scanned to discover undocumented opcodes that may indicate hidden JTAG capabilities such as backdoors and harmful or malicious functions.Fast and nonintrusive JTAG component identification has never been so easy.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Semiconductor Test
Ismeca NY32
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.
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Receiver, G18, 18 Module For Discrete Wiring
310120101
The lightweight and rugged 18 module Receiver provides a solution that will accommodate larger ATE chassis’ (PXI, VXI, SCXI). It allows immense versatility by affording space for up to an 18 slot PXI chassis.
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Semiconductor Lifecycle Management
Defense and space applications no longer drive the semiconductor industry. There is such a mismatch between the market life of a modern semiconductor, which can be measured in months to a couple of years, and the platform needs of defense and space platforms, measured in decades.Semiconductor Lifecycle Management (SLiM™) from Teledyne e2v HiRel Electronics solves this headache. We have many years of experience partnering with customers to save cost and lower risk when dealing with platform extensions.
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Capacitor Tester
MIG0603CAP
The MIG0603CAP consists of two circuits with impulse capacitance 20 µF and 0,25 µF. Both circuits generate a voltage wave shape 1,2/50 µs and are combined in a 4 unit height 19" rack. The generator circuits are defined in IEC 60384-14 and EN 132400. The serial resistors Rs, the impulse capacitor CT, and the load capacitance Cp will be automatically switched when different capacitance ranges are selected on the MIG0603CAP.
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Voltage Tester
HH2611
Handy, quick response and easy to use tool. Safe to use Non-Contact testing 90-220V AC voltage. Delect AC voltage without connecting into the wire circuit. Very bright LED and buzz sound alarm if voltage is present. Used to detect where the wire is broken. Used to detect whether an outlet is present of voltage. Used to detect a broken Christmas bulb out of a series of connected Christmas bulbs
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Epstein Tester
S21 and S21R Series
Incoming material inspection can be very useful where strict quality standards are maintained. It saves a lot of processing cost since lossy material is inspected at the entry level before it goes to production level. Epstein Stack testing is one of the oldest and widely used methods for electrical sheet testing.
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Transformer Testers
*Quickly tests deenergized power distribution transformers*Briefly energizes the transformer and takes a snapshot of the condition by measuring the voltage, current and power factor of the test signal*Tests overhead, pad-mount and distribution transformers*Audible alarm confirms successful test*Improve SAIDI statistics by quickly testing and getting the transformer back in service*Auto self-test performed with every test*Compact, lightweight and easy-to-use
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Scratch Tester
CSR1000
This tester is highly effective in measuring the adhesion strength (adhesion strength) of hard coatings (Ti, TiN, SiC, DLC, etc.) formed by PVD and CVD on metal surfaces such as cemented carbide. Adopting a scratch test method that allows quantitative measurement with simple operations, the film surface is scratched while increasing the load on the sample surface, detecting film breakage with high sensitivity, and providing the load at which film breakage occurs (critical load). tools and mold tools that require
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Puncture Testers
Mechanical puncture testers check the puncture resistance or hardness of materials like dry wall, foam boards, cardboard, etc. They are ideal for handheld penetration tests or mounting to a test stand and intrinsically safe in hazardous environments. An optional handle is available.
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Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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Vector Tester
PVT360A
The R&S®PVT360A is a VSG/VSA single-box vector tester optimized for FR1 base station, small cell and RFcomponent testing in production and characterization environments. Two independent signal generatorsand analyzers enable fast parallelized measurements. A frequency range of up to 8 GHz, flexible bandwidth configuration and an optional second TRX channel provide the necessary performance and enable flexible adaptation in a small form factor.
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Torque Tester
WDIS series
Management of various torque tools PLC and connection alsoWDIS-IP (05/5/50/200/500/1500), WDIS-RL (005/05/6/10), WDIS-IPS (05C/5C/20CL). The DIS series has become easier to use and has higher performance. Interlocking with a personal computer or PLC, the torque measurement can be managed at a higher level.Management of manual torque drivers and wrenches, management of automatic and semi-automatic tools, inspection of screw tightening and loosening torques
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Rotor Tester
SL Series
Shanghai Aoboor Electric Co., Ltd.
Applicable for testing fully opened, fully closed squirrl-cage rotors with process slot, with or without shaft, it can identify broken bars, slim bars, under-casting, porosity, sand holes, residues, improper end rings, internal short circut in bars, eccentricity.
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Circuit Tester
TE6-0720
Hangzhou Tonny Electric & Tools Co., Ltd.
*For use on cars, trucks, boats, trailers and motorcycles*Needle point probes *Use to trouble shoot both primary and secondary circuits*Use this tester to check primary circuits of 6/12V*On secondary or high voltage circuits you can check spark plugs
