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IP Parallel IO
IndustryPack compatible IP-Parallel-IO with counter and timer design adds up to 48 digital parallel IO lines to one IP slot of your carrier board.
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Serial to Parallel Analysis Package
B4601C
Your system uses serial buses to communicate between ICs and transfer data to and from peripheral devices. Sifting through thousands of serial bits by looking at long vertical columns of captured 1's and 0's can be very tedious, time-consuming, and error prone. The Keysight Technologies B4601C serial to parallel analysis package is general-purpose software that allows easy viewing and analysis of serial data.
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Parallel Seam Sealers
It is an equipment to hermetically seal the packages, such as the crystal and SAW devices, optical devices, sensors, MEMS, etc., by seam welding. Hermetic sealing can be accomplished in both N2 and vacuum environment. Furthermore, we are offering a variety of products for research and development and production applications.
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Parallel 8-channel Hipot Tester
TH9010
Changzhou Tonghui Electronic Co., Ltd.
8-channel parallel output of withstand voltage, and each channel is non-interfering ■ Output: AC: 5kV/10mA; DC: 6kV/5mA ■ Insulation resistance test voltage: 0.10kV -1.00kV
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Parallel Robots
The Omron Quattro robot excels at high-speed applications in packaging, manufacturing, assembly, and material handling.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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GPIB Parallel Interface
Model 4813
* Provides 128 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Optional Relay Driver boards add 64 or 128 Relay Drivers.
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Massively Parallel Parametric Test System
P9001A
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Serial to Parallel Controller
E84 SPC
300mm equipment manufacturers utilize this off-the-shelf E84 communications controller to provide SEMI E84 compliant communications for their products. With its built-in Load and Unload algorithms it is the perfect E84 communications solution for process tools, stockers, load ports, FOUP buffers, smart storage shelves and simulation load ports. The E84 SPC easily integrates with equipment controllers through a standard serial communications connection.
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8-Sites Flash Programmer w/Relay Barrier, True Parallel Channels
YAV90FR2
The YAV90FR2 or YAM90FR2 is a flash programmer housed in a compact 6TL YAV Module form factor, designed forseamless integration into automated test environments. It incorporates the advanced FlashRunner 2.0 technology fromSMH, enabling efficient programming of microcontrollers, flash memory, and other logic or memory devices. Themodule features flexible connectivity options, with all digital I/O (DIO), programmable voltage lines, and correspondingground lines switchable via integrated relays.
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Parallel systems
Did you know you can couple several Gill AC, Gill 12 and Weld Testers together or any combination of Gill AC, Gill 12 or Weld Tester, to give you a parallel logging multiple Potentiostat / Galvanostat / ZRA / FRA system, capable of recording from each working electrode at up to 60 readings per second. Coupling several Gill ACs or Gill 12s together gives the added abilities of the Weld tester and the ability to perform fast sweeps. Using our latest software, it has never been easier to couple instruments together to provide a Parallel System. In fact up to 32 instruments can be controlled at the same time. These instruments can either have individually enclosures or be rack mounted.
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Ethernet To Parallel Digital Interfaces
ICS's 8063 Ethernet Digital Interface provides a fully enclosed parallel interface that is suitable for benchtop or rack mount applications.
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"Soft Grid" and Parallel Operation AC Generator Excitation Regulator
svrsp
The Kinetics model SVRSP Exciter/Regulator rectifier is designed and rated in capacity and operating parameters for the application of exciting the DC fields on an AC generator operating in parallel with other AC generators and the power system is a "soft system" in relation to loading. A "soft system" is a generating system that may not be able to sustain the rated AC voltage under impulse/step loading conditions and results in voltage reduction when tan impulse/step load is applied.
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Parallel Simulation Engine
RocketSim
Complementing compiled-code simulators, Cadence® RocketSim™ parallel simulation engine eliminates functional verification bottlenecks by speeding up simulation using commonly available multi-core servers.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Massively Parallel Board Test System
I7090
The Keysight i7090 is a massively parallel board test system designed to help PCBA test engineers improve manufacturing efficiency while reducing costs. Unlike traditional in-circuit testers, the i7090 supports up to 20 In-Circuit Test cores in parallel, which means engineers can test multiple Units Under Test (UUTs) simultaneously without the need for multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space.
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Portable Parallel Analyzer
SL1000
Perform up to four colorimetric and two probe-based measurements in parallel, and complete the entire test suite in 25% of the time. Complete more tests on site, get the results you need faster, and visit more sites in each shift.
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PXI 32 Chan I/O Parallel I/P Prog Threshold
40-412-101
A 32-channel Digital I/O module with high output voltage and current capability and a dual variable threshold input. Each of the 32 channel outputs can be used to drive the output high or low using a high current capacity drive capable of sourcing 0.4A from the high side or 0.5A sink on the low side for each channel. The module is available in two versions with either serial or parallel capture of the input levels.
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High Parallel Tri-Temp Pick-and-Place Handler
Delta MATRiX
Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
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High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Ethernet Parallel Interface
Model 8013
* Provides 128 high-power TTL I/O lines.* Fully VXI-11 Compliant plus Raw Socket for easy programming with Visual Basic or C, Agilent VEE and LabVIEW.* Standard board has a horizontal Ethernet connector and 150-pin Digital IO connector on the component side. * Mates to Relay Driver Boards with 64 or 128 Relay Drivers.* Mates to 115650 Connector Board with 4 flat ribbon headers.
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CMOS Image Sensor
CIS
CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Solution For Test-in-Strip
InCarrier
The InCarrier process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test. Leveraging the strip like design the InCarrier ensures robust test-handling for even smallest devices and supports high parallel test.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Coherent DDS Modules
ITS has developed several custom Direct Digital Synthesizer modules that offer phase-coherent or phase-continuous operation at any frequency step size. These agile DDS modules can be programmed through direct parallel, Ethernet, or RS-232 interfaces.
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GPGPU Processor
VPX6-4955
Curtiss-Wright Defense Solutions
The VPX6-4955 delivers incredible processing power from not one, but two NVIDIA Quadro Turing TU104 GPUs, providing a remarkable 6144 CUDA cores for parallel processing and a 50% improvement in performance per CUDA core compared to the previous Pascal generation.
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High Power Programmable AC Source with Transients
61510
Chroma Systems Solutions, Inc.
Power Rating:61511: 12KVA61512: 18KVAVoltage Range: 0-150V/0-300V / AutoConfigurations with input voltage of 220V or 480VFrequency: DC, 15Hz-1500HzSingle-phase or three-phase output selectableProgrammable slew rate setting for changing voltage and frequencyProgrammable voltage and current limitHigh output current crest factor, ideal for inrush current testingTurn on, turn off phase angle controlTTL signal which indicates output transientLIST, PULSE, STEP mode functions for testing Power Line Disturbance (PLD) simulationVoltage dips, short interruption and voltage variation simulationHarmonics, inter-harmonics waveform synthesizerComprehensive measurement capability, including current harmonicsAnalog programmable interfacesRemote interface: GPIB, RS-232, USB and EthernetCapable of delivering power output up to 90KVA by implementing Master-slave parallel operation
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Stand-Alone Test Fixture
MA 2012/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 15,50 kg
