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Product
Long Edge Wet Film Combs (Stainless Steel)
3238
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Each comb has 24 measurement steps (teeth) providing a more accurate wet film thickness value.
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Product
Coordinate Measuring Machines
FlatScope
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Perfect for the measurement of larger 2D profiles (e.g.),films, circuit boards, laser cut and stamped parts large and smallMachine design with the image processing sensor under the glass plate, eliminates time-consuming focusing as the workpiece is always in the correct distance to the opticsIn raster scanning mode the machine also quickly captures the selected measurement range completelyAll geometric features are then evaluated automatically in the imageQuick dimensional measurements in the scanned image and automatic gaging with ToleranceFit® comparisons
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Product
Leather Thickness Gauge
UI-FT43
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Leather Thickness Gauge is used to measure the thickness of leather. Place the sample in a thickness meter under a specified load for a certain time and them read the thickness. Unuo Instruments supply film thickness gauge, film thickness gauge, rubber thickness gauge and etc. Shore Durometer for rubber is also available.
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Product
Tensile Testing Machines
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Is an intelligent tensile testing machine specializing in testing the mechanical properties of various flexible packaging materials. It is suitable for test the peel force, heat seal strength, tearing resistance, deformation, puncture resistance, open force, low speed unwinding force etc of plastic film, composite film, soft packaging materials, adhesives, rubber, paper fiber and other products.
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Product
Gurley Legality Tester
DRK461A
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Shandong Drick Instruments Co., Ltd.
It can be applied to quality control and research and development of papermaking, textile, non-woven fabric, plastic film, etc
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Product
Line Scan Camera
Piranha4 Polarization
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The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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Product
Packaging Material testing
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Guangzhou Biaoji Packaging Equipment Co., Ltd.
Packaging Material testing including OTR barrier, COF, lamination bond strength, material analysis, physical properties, tear strength , tensile strength, puncture, slip, blocking, scuffing, film thickness variation, WVTR and so on..
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Product
1550/1310~1490nm Wavelength Division Multiplexer
PON-WDM-1543
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Hangzhou Huatai Optic Tech. Co., Ltd.
PON-WDM-1543 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to FTTx PON network to achieve the combination and separation of the 1550nm (CATV) and 1310/1490nm (data).
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Product
Low Temperature MBE
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Low-temperature processing systems make it possible to handle advanced, delicate materials without subjecting them to high heat. By maintaining gentle thermal conditions, they unlock new possibilities for working with polymers, flexible films and other materials that can’t tolerate the extreme temperatures of conventional processing.
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Product
Advanced Packaging & TSV
FilmTek 2000M TSV
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Scientific Computing International
Advanced semiconductor packaging metrology system providing an unmatched combination of speed, accuracy, and precision for high-throughput measurements of resist thickness, through silicon vias (TSVs), Cu-pillars, bumps, redistribution layer (RDL) and other packaging processes.
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Product
Materials Metrology
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Nova is a market leader for innovative thin film metrology and process control technologies. We develop highly sensitive in-line metrology solutions on high productivity platforms, thereby enabling critical metrology solutions to be closer to a semiconductor fab’s process and integration needs.Our technologies enable customers to accurately detect and quantify small variations in film composition and thickness, thereby influencing better device functionality, and improved manufacturing yield.
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Product
Filters / Splitters / Detectors
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DiCon’s 100 GHz WDM is designed to multiplex and demultiplex signals in multi-wavelength systems based on the ITU 100 GHz grid. The component uses a thin film filter mounted between a pair of GRIN lens collimators. The 100 GHz WDM is housed in a compact, environmentally stable package that offers superior resistance to humidity and temperature and is suitable for mounting on a printed circuit board or within a module.
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Product
ALD Advantages
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Atomic Layer Deposition (ALD) stands out for one reason: control. The most significant advantages of thin film deposition via Atomic Later Deposition over other methods, are manifest in four distinct areas – film conformality, low temperature processing, stoichiometric control, and inherent film quality associated with the self-limiting, and self-assembled nature of the ALD mechanism ALD is exceptionally effective at coating surfaces that exhibit ultra high aspect ratio topographies, as well as surfaces requiring multilayer films with good quality interfaces technology. This thin-film process builds materials one atomic layer at a time, delivering unmatched uniformity and sub-nanometer precision, even on complex 3D structures. That level of accuracy makes ALD a critical technology for advanced semiconductor manufacturing, flexible electronics, and materials research.
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Product
Spectroscopic Ellipsometers
SENresearch 4.0
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The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 spectroscopic ellipsometer is a customer-specific configuration of spectral range, options and field upgradable accessories. SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides broadest spectral range with best S/N ratio and highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm. The new motorized Pyramid Goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure highest precision and long term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle resolved transmission measurements.
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Product
Mixers/Receivers In Terahertz Range
Hot Electron Bolometer (HEB)
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Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz. Advantages: Above about 1 THz Hot Electron Bolometer mixers offer the best sensitivity and lowest noise of all the technology for the coherent detection of radiation.
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Product
PCIe Gen3 4K Compact, High Speed Camera for Testing
CB120MG-CM-X8G3
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4K, compact, high speed camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
For AIM-65 And AIM-75S
8" AG+AR Screen Protection Film
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Surface Hardness: 2 ~ 3HReflection Rate: 0.15%Haze: 15%Dimensions: 212 x 128 x 0.15 mm/ 8.35 x 5.04 x 0.006 inWeight: 0.009 kg/0.02 lb
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Product
Multiple Angle Reflectometry
FilmTek 4000
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Scientific Computing International
Fully-automated wafer metrology optimized for photonic integrated circuit manufacturing. Delivers unmatched measurement accuracy, with a 100x performance advantage over the best non-contact method and 10x that of the best prism coupler contact systems. Designed to enable optical component manufacturers to increase functional yield of their products, reliably and at lower cost.
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Product
Coefficient Of Friction Tester
COF-02
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Jinan Leading Instruments Co., Ltd.
COF-02 Coefficientof Friction Tester is applicablein static and kinetic coefficient of friction tests of plastic films, sheets,rubber, paper, PP woven bags, fabric style, metal-plastic composite strips/belts for communication cable, conveyor belts, wood, coatings, brakepads, windshield wipers, shoe materials and tyres, etc. With the materialsmoothness testing, users can control and adjust material quality technicalindexes to meet application demands. Besides, this tester is applicable for thesmoothness measurement of cosmetics, eye drop and other daily chemistry.
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Product
Anti-Fogging Progerty Tester
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Shijiazhuang Zhongshi Testing Machine Co., Ltd.
The instrument is used for testing anti-fogging property of the soft PVC Calendar stenter film. It is the ideal testing equipment for science research department, universities, commodity inspection, laboratory, graduate school and quality supervision departments.
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Product
CWDM Mux/Demux Module（4,8,16,18-Channel）
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Flyin Optronics’ Coarse wavelength division multiplexer (CWDM Mux/Demux) utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, wide pass band, low temperature sensitivity and epoxy free optical path.
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Product
Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
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*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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Product
PCIe Gen3 4K at 500 Fps High Speed Compact Camera for Testing
CB160MG-LX-X8G3
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4K at 500 Fps High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
Micro-spot DUV Spectroscopic Reflectometry
FilmTek 2000 PAR
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Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
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Product
Ellipsometer
alpha-SE®
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For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds. Works with your materials - dielectrics, semiconductors, organics, and more.
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Product
Nuclear Magnetic Resonance Spectrometer
NMR
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NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
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Product
Affordable EDXRF Analyzers
NEX QC Series
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Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
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Product
10 N Screw Flat Grips
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10 N (2.2 lbf) screw flat grips are primarily used for tensile testing low force, soft materials such as yarn, paper, plastics, and cloth, in film or wire geometry. Grip faces are flat and rubber-coated, and the supplied coupling joints for the 10 N screw flat grips are designed for use on lower-capacity load cells.
