Mapping
See Also: Wafer Mapping, Survey
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Pressure Mapping
WIPER
Evaluate wiper blade force profiles and interface pressure distribution.
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Concrete Corrosion Mapping System
15620
Our Concrete Corrosion Mapping System (CCMS) can be used to satisfy the ASTM C-876 standard test method and the kit contains all equipment items that are needed to perform a corrosion survey on virtually all types of reinforced concrete structures, such as bridges, highway slabs and parking garages.
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Film Thickness Mapping Systems
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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Magnetic Field Camera: mapping for MRI applications
MFC2046
MRI and NMR spectroscopy applications require a highly uniform magnetic field, within at most a few ppm. NMR is the only magnetic measurement technique capable of providing a field map with that degree of precision. Introduced 25 years ago, Metrolab’s NMR Magnetic Field Cameras have revolutionized field mapping for MRI magnets. They reduced acquisition times from hours to minutes, positioning errors to fractions of a millimeter, and they rendered human and drift errors negligible. Now, meet the latest generation NMR Magnetic Field Camera, the MFC2046! Map any magnet with the New generation of MFC probe arrays. Magnetometer Teslameter Gaussmeter
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One click site mapping
PowerMapper
PowerMapper is an automatic site mapping tool for information architects, usability analysts and web developers. It is used in more than 50 countries, by 30% of the Fortune 100, and major organizations like NASA and MIT.
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Industry Standard in GPR for Utility Mapping and Locating
GSSI’s Utility Scan Pro GPR
Geophysical Survey Systems, Inc.
With UtilityScan Pro, users can quickly identify and mark the position and depth of metallic and non-metallic objects; including utilities such as gas, communications and sewer lines as well as underground storage tanks and PVC pipes. Based on the SIR 4000 controller, the UtilityScan Pro provides the GPR professional with solutions to any underground locating situation.
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Pressure Mapping
NIP PRESSURE MEASUREMENT SYSTEM
A completely wireless system for measuring nip pressure between rollers in real-time
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Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester.
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Wafer Mapping Sensor
M-DW1
Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Epi Thickness & Composition System
Element
The Element system is the tool of record for wafer suppliers for high speed impurity mapping and epi thickness measurement. It is the only tool on the market with the unique combination of transmission and reflection based technology. This system is the industry standard for dielectric monitoring.
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Multibeam Profiler Sonar
MB1350-N
At 1.35 MHz, the MB1350 delivers 3D profile data at levels more akin to a laser line scanner than today' low frequency bathymentry systems. Mountable on Boats, ROVs, UUVs, and Tripods, BlueView's MB1350 is the right tool to take your operation into the next generation of 3D bottom and structure mapping.
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Advanced 4-CH Encoder Card with High-speed Triggering Function
PCI-8124-C
PCI-8124-C is a 4-CH trigger board which is suitable for advanced line scan application which need high line rates. PCI-8124-C has internal FIFO to realize the high speed position compare and trigger pulse output. For this application, ADLINK proposes you can use PCI-8134 and PCI-8124-C together to gain the advantage of motion control and high speed trigger function. For position compare, PCI-8124-C provides two method: linear function or variable interval. PCI-8124-C also provides the variety of mapping function between comparator and trigger output. The comparator condition can be associated with latch signal, TTL input and EA/EB signal.
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SSD
M.2 SSD (MLC)
Innodisk M.2 (S42) 3ME4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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In-Circuit Emulator
DS-XA
* Emulates XA Derivatives * 2MByte Code and Data Memory * Memory With Mapping Capabilities * Real-Time Trace * Frequency Range up to 30MHz @ 5V * Source-Level Debugger For C And Assembler * MS-Windows Debugger Software for Windows NT and 95 or Later * 3.3V And 5V Emulation Support * Support for ROMless and ROM Microcontrollers * PLCC Emulation headers
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PCMCIA Card
DAS-429PCMCIA/RT10
Both cards contain 68 Kbytes of true dual-port RAM, for data blocks, control registers and Look-up table, mapped within the Common Memory space. The card also contains a FLASH-based Card Information Structure (CIS) within the Attribute Memory space.The cards comply with the Personal Computer Memory Card International Association (PCMCIA Release 2.1) standard, including Plug and Play. The card's small size and suitability for PCMCIA compatible notebook computers with Type II and Type III slots make it a complete solution for developing and testing ARINC-429 interfaces and for performing system simulation of the ARINC-429 bus, both in the lab and in the field.The cards are supplied with C drivers, including source code, Mystic Windows software and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application.
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GPS Datalogging
PATH-TRAQ™
Taking locating to the next level. The PathTraq app allows for mapping, data logging and simplified file sharing of your locates.
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High-Definition Distributed Fiber Optic Sensing
ODiSI
Luna’s ODiSI system provides the world’s highest resolution distributed fiber optic sensing solution for strain and temperature measurement. Using low-profile optical fiber as sensors, the ODiSI system maps strain and temperature fields with sub-millimeter spatial resolution, providing unprecedented detail and data insight.
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Pressure Mapping for Patient Care, Medical Research, and Animal
The search for cost-effective tools in the prevention and management of pressure-related problems for at risk patients has been a constant source of frustration for clinicians and hospital administrators. Tekscan's pressure measurement devices provide accurate, reliable data that is outcome focused and provides important insights into the formation of pressure-related sores. This information is an important quantitative adjunct to other qualitative assessment tools, assisting the clinician in providing results-oriented, cost-effective assessments and preventative care.
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Multipurpose Module for SLSC
Bloomy’s Multipurpose Module for SLSC provides a convenient location in an SLSC system for applications ranging from a simple rearrangement of signals to installation of circuits and components. Both front panel connectors are mapped to screw terminals, through holes, and surface-mount technology pads thus accommodating a wide variety of components. Breakout areas for all rear transition interface (RTI) pins simplify integration into SLSC-based systems. On-board power supplies (±15VDC, +5V, and +3.3V) are also made available for the user’s analog and digital circuits. The module features a considerable amount of available board space for user applications.
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Pressure Mapping
GRIP™ SYSTEM FOR R&D
Tactile pressure sensing system that quantifies forces applied by the human hand while grasping objects.
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Fiber Optic Sensing Interrogator
Summit
Summit fiber optic sensing system delivers the most reliable measurements for structural testing, design optimization, structural health monitoring, thermal mapping and 2D shape sensing.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Channel Emulator
Qosmotec Software Solutions GmbH
Knowledge about channel models is not necessary to run tests with the QPER Channel Emulator. It applies the visualised virtual drive test concept, which is also used in the handover tester, to a fully fledged channel emulator: The tester outlines the network layout on the screen and defines a drive test route on the map. While running a simulated drive test, all channel effects are automatically calculated by QPER and applied to the channel emulation hardware.
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Smart Sensorgrid NG
Smart Sensorgrid belongs to the smart sensor family devised for on-line monitoring of diagnostic quantities in electrical assets. It provides traffic-light alerts to SCADA systems / asset and maintenance service. Smart Sensorgrid is a state-of-art PD analyzer, exploiting the TECHIMP T-F Map technology (patented). Such feature allows noise rejection and automatic alarm warning based on amplitude and repetition rate trend relevant to statistical parameters. The PD sensor, a HFCT, is integrated in the smart sensor body.
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SAM Auto Line
PVA TePla Analytical Systems GmbH
The fully automated acoustic microscopes from the SAM Auto Line enable simple detection of cavities, voids, bubbles, inclusions, and delamination and are ideally suitable for wafer inspection, bond checking, and MEMS inspection. An automatic defect-review software package performs a fully automated evaluation of the entire wafer. The results can be issued as klarf files and VEGA MAP. A GEM/SECS connection is also possible.
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Software For Data Analysis
Imc FAMOS
Data source managementVisualization of measurement data at your fingertipsFull range of analysis functionsReport generation with direct PDF outputQuickly analyze large data sets with 64 bitMulti-layer macro creationProject managementLink data with dynamic maps or video
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Magnetic Susceptibility Meter for Multi-Layer Survey
MULTI KAPPA
Multi Kappa instrument serves for fast field survey allowing both spot measurement and mapping by means of several probes. Together with GF Instruments traditional pocket magnetic susceptibility meters cover wide range of demands for accurate susceptibility measurement on ground surface, outcrops and samples of rock and soil. geological survey, archaeology, agriculture and forestry, raw material prospecting, mineralogy, sedimentology, detection of metallic objects, UXO survey.
