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Product
T3 Low & High Voltage Differential Probes
T3 Series
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Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.
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Product
Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 585 x 250 mm (wxd)
CMK-03
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
P2262A General Purpose Probes
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Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Product
Near Field Probes 1GHz - 10 GHz
SX set
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The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Product
µHELIX® Test Probes
Series S200, S300, S400, and S500
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Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
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Product
Current Probes
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Tektronix current probe solutions offer:*The broadest range of AC/DC and AC-only current probes*Measurement accuracy from uAs to 2000 A*Best-in-class bandwidth up to 120 MHz*Best-in-class current clamp sensitivity down to 1 mA*The only products with 3rd Party Safety Certification (UL, CSA, ETL)*The only products with bare wire voltage ratings*Automatic readout and scaling when used with Tektronix oscilloscopes so you don’t have to convert volts to amps or manually set the scaling
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Product
Dual Trace Analog Oscilloscope With Probes
2120C
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B&K Precision's model 2120C is a dual trace oscilloscope that offers high performance at a low price. Most competitor's entry level oscilloscopes have a 20 MHz bandwidth, while B&K Precision's models 2120C has a bandwidth of 30 MHz. This oscilloscope is built by and backed by B&K Precision, a company that has been selling reliable, durable, value priced test instruments for over 60 years.
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Product
EPA General Purpose Probes
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General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
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Product
Probes & Flow Cells
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The sample interface is a virtual “windows into the process” and is a critical component of any optical analyzer system. Guided Wave sample interfaces (probes, flow cells) are designed for use with NIR or UV/Vis fiber optic coupled analyzers. They are designed to be rugged and reliable in harsh chemical and physical process conditions while providing optimal transmission for long-term reliable measurements.
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Product
Voltage Probes
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In addition to EMI measurement with LISNs (Line Impedance Stabilisation Networks, Artificial Mains Networks), Probes are used for Terminal or Line voltage measurement.
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Product
Probes And Accessories
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Choose from a broad portfolio of Tektronix probes and accessories, all perfectly matched to our industry-leading oscilloscopes. With over 100 choices available, select the oscilloscope probe you need for your specific testing application. Download our Probe Selector Guide here.
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Product
Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 250 mm (wxd)
CMCSK-03-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Near-Field Probes 100 kHz up to 50 MHz
LF1 set
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The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Product
Optical Probes- High Bandwidth
DPO7OE
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The DPO7OE series optical probes with a DPO70000 real-time scope deliver the performance and advanced debug capabilities designers need to fully troubleshoot 400G PAM4 signals, up to 56 GBaud, and reduce time to market.
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Product
Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 230 x 175 mm (wxd)
CMK-06
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Mid Bus Probes
MBP850
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The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Product
Near Field Probes
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Used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.
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Product
EMC Probes
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The Beehive Electronics 100 series EMC probes allow the accurate measurement of magnetic and electric fields. They are useful for EMC troubleshooting, field strength measurement, and troubleshooting of RF circuits.
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Product
Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 1000 Units, Max UUT 450x330MM (wxd)
CMK-07
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Linear click system with ball bearings, using gas springs. 10 mm ESD-proof top cover with aluminum reinforcement bars. Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 450 x 330 mm (wxd)
CMCSK-07-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Probes With Lead Wires
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Used when the probe is installed some distance from the logger, controller, or other data acquisition device. Available in a variety of lead wire types with stripped leads or connectors attached.
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Product
Hall probes
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Axial, transverse, multi-axis, and tangential Hall probes for measuring magnetic flux density. Choose from a wide range of lengths and thicknesses—probes are also available for cryogenic applications.
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Product
Radiometer Analytical Probes
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Radiometer Analytical develops and manufactures an extensive range of electrochemical electrodes - combined pH, glass or reference electrodes, metal electrodes, ion-selective electrodes and conductivity cells - for every application and budget.
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Product
CP-2XX-4 Battery Probes
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 39Full Travel (mm): 1.00Recommended Travel (mil): 30Recommended Travel (mm): 0.75Overall Length (mil): 158Overall Length (mm): 4.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
Threaded Pneumatic & Pneumatic Switch Probes
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Narrow place solution - high flexibility - great solution - cost effective.
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Product
Threaded Probes Designed for Connector and Harness Test
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Equip-Test Threaded Probes Designed for Connector and Harness Test
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Product
SSP Switch Probes
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Spring Force Remark: Force at switch point: 2.36 (66)Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 150Full Travel (mm): 3.81Recommended Travel (mil): 100Recommended Travel (mm): 2.54Mechanical Life (no of cyles): 100,000Overall Length (mil): 1,210Overall Length (mm): 30.73Switch Point (mil): 25Switch Point (mm): 0.64
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