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Product
Differential Active Probe, 250 MHz
DP0010A
Signal Probe
The Keysight DP0010A is the 250 MHz model of the DP001xA Series differential active probes. These probes provide the superior general-purpose differential signal measurements required for many of today’s high-speed power-related measurements such as motor drives, automotive differential bus measurements, and high-speed digital system designs.
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Product
SPL-03C-090 Step Probe
SPL-03C-090
Step Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 50Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 127Recommended Travel (mm): 3.22Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,530Overall Length (mm): 38.86Rec. Mounting Hole Size (mil): 95Rec. Mounting Hole Size (mm): 2.40Rec. Mounting Hole Remark: 94 to 96 mil / 2.39 to 2.44 mmRecommended Wire Gauge: 22-26 AWGRecommended Drill Size: #41 or 2.40 mm
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Product
Rectal Probe For Mice (Isolated)
RET-3 ISO
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• An isolated sensor (can be used with monitoring equipment where electrical interference from other electrodes may be present).• Reinforced strain relief for applications where probe is in more frequent use.• Smooth ball tip. Stainless steel shaft - 3/4'' long, .028'' diameter. Tip diameter .065'', 5 foot lead length. Time constant 0.5 seconds.
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Product
SAX Test Block & PAX Probes
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The SecuControl SAX is a versatile, space-efficient, and two-in-one terminal and test block that brings safety and consistency to substation testing. Its finger-safe design, keyed PAX/STP plugs, make-before-break operation and built-in CT shorting deliver reliable secondary injection without wiring changes or open-circuit risks. Ideal to modern substations where speedy deployment and simplicity are key.
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Product
Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25I-6
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Product
Cup, Concave 90/120 degree, Alternate 0.78 (22.00) - 3.70 (105.00) General Purpose Probe
HPA-0A-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Logic Analyzer Probes
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Three probe types are available for GoLogicXL logic analyzers: flying leadset, Mictor, and Pinpoint probes. The Mictor and Pinpoint probes are compatible with similar Keysight/Agilent "soft touch" and Tektronix "connectorless" probes. All GoLogicXL probes are coaxially shielded and use passive termination inputs to prevent loading the device under test. Both differential and single-ended input signals are supported by all probes. Input voltage swings small as 300 mV are supported in single-ended mode, and 150 mV for differential signals.
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Product
Inline Micropositioner
SP-150
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Signatone's most stable and precise micropositioner for sub-micron probing.
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Product
Kelvin Probe Set
11059A
Accessory Kit
Reduce ground-related errors and contact resistance through gold-plated flat tweezers and special gripping surfaces
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Product
General Purpose Twin-Lead Tester
69136
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Tests voltage in 90-250 volt range, AC or DC.Neon lamp glows indicating live circuit.The 5'' (127 mm) test leads have probes on the ends.Handy pocket clip.
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Product
Design for Test
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Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Product
Test Hook Probe
CX-17
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Test Hook Probe is strickly designed according to IEC60065.
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Product
Antenna Kits
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A.H. Systems offers 10 models of portable antenna kits. Each kit provides all the reliable antennas, current probes and accessories needed to satisfy a wide array of customer requirements. Each component has a specific storage compartment in the carrying case therefore, loss and breakage are virtually eliminated. Cables, a tripod with azimuth and elevation head and a tripod carrying case accompany each antenna kit. Click on a model below to learn more about it''s characteristics and included antennas.
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Product
5 KV Voltage Probe (Single)
5KVP
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5KVP voltage probe allows direct connection between your PowerSight meter and 5,000 Vrms.
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Product
Sensor Unit for High Precision Current Sensors
CT9557
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Hioki pull-through current sensors and clamp on current probes are best-in-class current sensing devices for use with power meters, Memory HiCorders and high performance oscilloscopes. The CT9555 is 4-channel sensor unit and power adapter for any of the CT686x series, 9709 and CT684x series current sensors and probes that provides waveform and RMS output.
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Product
Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25I-12
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Differenzial Probe
BumbleBee®
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PMK Mess- und Kommunikationstechnik GmbH
BumbleBee® is a 400 MHz, 1 kV CAT III high-voltage, differential probe, that can be used with anyoscilloscope or device providing 50 Ω termination.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T1-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Extendible Test Leads
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The Extendable Tip Probe permits testing in those hard to reach areas. The tips are fully insulated with durable Kynar. This prevents accidental shorting of adjacent components. The tip is stainless steel and is very sharp, allowing for penetration of conformal coatings. The rubber lead is 18 gauge, 48" long.
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Product
Manual Fixture Kit
230353 – CMK-04
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Temperature and humidity duct probe
T3113
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Relative humidity, temperature sensors at 150mm stem. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Product
Multi-Sensor In Plane
MS 1000-IP-20
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Advanced Thermal Solutions, Inc.
The MS 1000-IP-20 is a three-sensor probe designed for measuring fluid velocity and temperature in the same vertical plane. It eliminates the need for multiple probes or a traversing probe for determining the flow profile or distribution.
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Product
Advanced KIT: LED LUX Measurement Kits
LLM-Basic KIT and LLM
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Special photoradiometer kits with PHOT probe for the measurement of ILLUMINANCE. Thanks to the high precision sensor, the kits can be used in a wide range of applications and situations where the measurement of illuminance (LUX) is necessary.
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Product
30A, 100MHz High Sensitivity Current Probe
CP031A
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Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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Product
Standard 4.47 (127.00) - 12.00 (340.00) High Frequency Probe
K-50H-S
High Frequency Probe
Current Rating (Amps): 6Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 2.50Nominal Impedance (Ohms): 50Test Center (mil): 600Test Center (mm): 15.24Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 90Recommended Travel (mm): 2.29Overall Length (mil): 1,205Overall Length (mm): 30.61
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Product
Stimulus Induced Fault Testing
SIFT
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SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.





























