Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Mini Back Probes/Wire Piercers
618
*Great for backprobing weather pack style connectors used with numerous automotive sensors *Also very handy for piercing and tapping readings on smaller gauge wires - using the included probe adapters *Works with most Test Lead Kits in the field - with standard 4mm banana plug test lead *Set includes four probes - red, black, green, yellow Test probes 21 mm length
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Ingun Spring Probes
MicroContact AG offers the assortment of test probes and test adapters from Ingun as a Swiss representative.
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Non-Contact Voltage Testers
PeakTech Prüf- und Messtechnik GmbH
User-friendly tester for non-contact voltage testing from 50 V to 1000 V AC. Suitable for outlets, lamp sockets or against wire insulation testing. If AC voltage is present at the relevant measuring point, this is indicated visually by a flashing red LED and the integrated buzzer sounds. If the measuring point is voltage-free, the test probe lights up permanently green.
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PCIe Carrier For PMC And PrPMC
PCI104
The PCI104 is a PCIe carrier for PCI Mezzanine Cards (PMC) or Processor PCI Mezzanine Cards (PrPMC). The PCI104 carrier allows simplified testing of PMC/PrPMCs and their associated PMC I/O Modules (PIMs) by using a PC environment during board development or deployment. The PCI104 can also reduce the costs of manufacturing PMC/PrPMCs by allowing manufacturers to use off-the-shelf PCs for functional testing. The PCI104 converts the PCIe x4 edge connection to PCI-X via a PCIe to PCI-X bridge. The trace lengths to the PMC/PrPMCare kept to a minimum so the PMC/PrPMC can run with a133MHz PCI-X clock speed. The J4 connector of the installed PMC/PrPMC is routed to a 96-pin DIN connector per theVITA-35 specification. The PCIe to PCI-X bridge can run in either transparent or non-transparent mode and can also operate in forward or reverse mode. The PCI104 has a fan mounted on the board to cool the PMC/PrPMC. The fan can easily be removed for testing and probing of hosted card.
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Stand-Alone Test Fixture
MA 2012/D/H/VPC-G12x-18
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,50 kg
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Retractable Cable
3700
Peaceful Thriving Enterprise Co Ltd
*2 x 6m retractable test leads.*Used as an extension cord for cars, trailers, boats and more.*Optional accessory included alligator clips, test probes and banana plugs.*The tester can be used with any multi meter or device equipped with banana jack connectors.
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CAD / BOM Translation Software
ProntoTEST-FIXTURE
In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Materials (BOM) files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is then used by Test Engineers to program their ATE (Agilent/Hewlett Packard "board & board x/y", Teradyne "ipl", Genrad ".ckt"), MDA, and flying probe test equipment and design the "Bed of Nails" test fixtures.
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Probe Cards
Direct Dock
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Flying Probe Testers
Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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EMC Accessories
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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Environmental Test Probe, Temperature
72-8366
Simple thermocouple junction at the end of a 1m wire provides effective low cost ambient temperature measurement. It is suitable for measuring air temperature and may be placed in direct contact with hard surfaces. Type K thermocouple temperature probes are commonly used with all types of industrial temperature controls and measurement equipment, and are compatible with Tenma handheld thermometers and digital multimeters that include temperature function. All are terminated with standard Type K plugs.
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Spring Contact Probes
Spring Contact Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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ICT Probes
ICT Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Test Hook Probe
CX-S11
Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Used on enclosures prior to accessibility testing. The test hook is ¨hooked〃 into vents and seams in the enclosure & then pulled with a force (usually 20N).
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Rugged Connectors
Guaranteed for a minimum of 100,000 connections, our rugged connectors are designed to meet your industrial & ergonomic demands in harsh testing environments. We offer numerous connector specifications all fitted with interchangeable spring loaded test probes. Supplied as a single hand held unit, panel mounted or fitted to a test lead, the combinations are limitless. Designed directly from your CAD data and thoroughly tested, our rugged & reliable connectors are used worldwide on a daily basis.
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Heat Test Probe 43
CX-43
Shenzhen Chuangxin Instruments Co., Ltd.
It's the necessary tool to proceed protecting electric shock test of household and similar electrical appliances.
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CAM/TRAC Test Kits
Series 40
The CT Series 40 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance.
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Test Sphere Probe
CX-500
Shenzhen Chuangxin Instruments Co., Ltd.
Test Sphere Probe This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish. TOP
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Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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THRU HOLE BARE AND LOADED BOARD TEST PROBES
SERIES 80
MAXIMUM CURRENT: 6 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,35 mOHMS meanMaterials and FinishesPLUNGER: Heat treated berylliumcopper, 24 Kt gold plated over nickelBARREL: Nickel silver with 24 Kt goldplated ID and OD over nickelSPRING: (Standard) Beryllium copper,silver plated. (-1) Stainless steel,silver plated
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THRU HOLE BARE AND LOADED BOARD TEST PROBES
SERIES 93
ElectricalMAXIMUM CURRENT: 7 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,35 mOHMS mean
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Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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Mini-Link™ Miniature Jumper
Series ML-100
Mini-Link Miniature Jumpers. Used to jumper from row-to-row or from pin-to-pin. Their miniature size makes it possible to stack one on top of the other. A convenient test probe slot is provided as well. Mini-Links are available from the factory with or without a handle, used for ease of inserting or extracting.
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Fine Pitch Test Probes
Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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Test Hook Probe
CX-17
Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Test Hook Probe is strickly designed according to IEC60065.
