Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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MPI SiPH Probe Systems
MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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IEC60335 Nail Test Probe
CX-Z12
Shenzhen Chuangxin Instruments Co., Ltd.
The Finger Nail Probe is indicated to test IEC 60335 and UL requirements. Used to check the security of parts that snap together. The spring gauge assembled in the handle can be calibrated to the necessary force for using the instrument. This probe is made of stainless steel with appropriated hardened tip and a handle in insulating material. Handle has a special adaptor M5 for use with 50N force gauges.
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Gaussmeter
DX-101
DX-101 Gaussmeter is based on the Hall effect magnetic field strength of the latest developments in instrumentation, the design of desktop-type Gauss meter. Maximum range 330.0mT and 3000mT two tranches, the minimum basic error of 1.0%. Test probe connectors is imported, stable and reliable connection.
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Digital Leeb Hardness Tester
TIME®5310
Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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Short Test Pin Probe 13
CX-13
Shenzhen Chuangxin Instruments Co., Ltd.
Short Test Pin Probe 13 Used to test accessibility through enclosure openings per IEC, EN, UL and CSA Standards.
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Eddy-Current Sensors
Eddy-Current sensors are noncontact devices capable of high-resolution measurement of the position and/or change of position of any conductive target. Eddy-Current sensors are also called inductive sensors, but generally "eddy current" refers to precision displacement instruments (or nondestructive testing probes) and "inductive" refers to inexpensive proximity switches. High resolution and tolerance of dirty environments make eddy-current sensors indispensable in today's modern industrial operations.
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Advanced High Speed Test Probe
SQprobe
SQprobe® is an advanced high speed probe designed for emerging software defined (SDN) and virtualized networks. It monitors IP based voice, video, audio and data streams at Gigabit rates, performing deep packet inspection (DPI) and providing accurate and detailed real time service quality metrics, usage and demographic data.
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CAT III Digital Multimeter
82600
Measures AC/DC voltage/current up to 600V and 10A, capacitance, diode, duty cycle, frequency, resistance, temperature and transistor. Includes 13 Functions and an operating temperature range between -40° to 1000°C. Features manual or auto shutdown after 15 minutes of inactivity, protection against overload at all ranges, data hold, low battery indicator and warning alarm. Also includes a LED flashlight for low light situations. Rubber outer case adds protection against drops and a stand bracket to hold meter at viewing angle and test probe holding clips.
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Terminal Test Kit (92 Pcs)
3601C
Peaceful Thriving Enterprise Co Ltd
*Total: 92 pcs*Alligator clip x 2 pcs*Testing probe x 2 pcs*Flat terminal x 48 pcs*Testing needle x 4 pcs*1 to 2 connector x 2 pcs*Round terminal x 24 pcs*5K variable resistor x 2 pcs*Polarity tester/stroboscope x 2 pcs*SRS air bag replacement connector x 2 pcs*Male / Female to Male / Female Extension Wire x 4 pcs
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Handheld Digital Multimeter, 2000 Count, Auto/ Manual, 10 A, 250 V, 3.5 Digit
72-13430
Clear LCD Display. Equipped with comfortable protective cover, test probe holder. 2m drop test, precision protection. Auto Power Off. Auto Backlight Off. Loud Buzzer Sound. Knobs shift smoothly, in-line with ergonomics. Relative mode. Powered by AAA 1.5V x 2 batteries. 12-month limited warranty. view Terms & Conditions for details
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FEA and Strain Gauge Testing
Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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Test Service Offerings
ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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IPTV Testing Probe
H & M-Probe
*Stand alone low bandwidth IPTV monitoring probe*Rugged packaging and industrial reliability*Web based appliance generates automatically service quality alarms*Provides basic metrics for quality of MPEG2 TS video transport*Stores alarm history and provides graphical histograms*Accepts streams bandwidth
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30 AMP Fuse Buddy Testers
FB305M
Can test circuit current up to 30 Amps - an easy way to check fuel pump amperage. Clever design allows for easy connection into fuse sockets. Fuse Buddy ends are molded into the shape of the fuse itself. During testing the fuse is removed and replaced into the Fuse Buddy. This way, the circuit being tested maintains fuse protection. Fuse Buddy stays put & won't fall out of the socket, like test probes do.
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IEC61032 Test Probe 12 Figure 8
CX-12
Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 12 Figure 8 is intended to be used on appliaces for verifying the inaccessibility of hazardous live parts or hazardous mechanical parts.
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Inbuilt External Controller ATE with Touch Screen Features
QT 200NXT
Qmax Test Technologies Pvt. Ltd.
QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software. The vast library support helps you to functionally test host of different IC families. Other features like user-friendly Windows based software, add-on utilities like oscilloscope, RCV meter circuit tracer, etc. makes it a favorite and makes very effective for repairing PCBs without schematic/ circuit diagrams. All these tests are carried out using simple BUT Interface like multipin test clips, probes or custom test fixture
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Multimeter Electronic Test Leads Kit
VERSATILE KIT includes 2 alligator clips with removable insulation, 2 extended range plunger mini-hooks with pass-through banana plugs, 2 heavy duty test probes, 2 42” lead extensionsUNIVERSALLY COMPATIBLE with either 0.16” banana plugs or shrouded banana plugs on all ends
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IEC60068-2-75 Spring Hammer Test
CX-T03
Shenzhen Chuangxin Instruments Co., Ltd.
*Impact hammers are used to check the durability of enclosures for electrical appliances of other electronic products.If damage occurs from the Impact Hammer test .Accessibility probes can be used to measure the extent or severity of the damage.The Impact Hammer simulates the mechanical impact to which electrical equipment may be subjected. *This hammer is mainly used to test household and similar electrical appliances shell, lever, handle, knobs, lights and other shell to withstand mechanical shocks.* The impact tester made of stainless steel or alloy.
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Test Probes
Safety right angle insulated alligator test probe, safety right angle insulated alligator test probe with insulated jaws, test probe, minitest probe, micro test probe.
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Benchtop with Drop-In Test System
600 Series Compact ATE Platform
The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Probe Card Analyzers
PB3600
The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
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Automated Bare Board Tester with Built-In Camera
QTOUCH2404C
Qmax Test Technologies Pvt. Ltd.
Qtouch2404C – Automated Bare Board Tester with in-built camera is designed to make automatic image capturing and probing of bare PCBs. It is designed to move on X,Y,Z directions making it possible to probe every test point. Flying Probe Tester is designed for testing high density fine pitched Single Sided / Double Sided and Multilayer PCBs for continuity and isolation using moving probes fixture –less technology.
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Accessibility Probe
Shenzhen Chuangxin Instruments Co., Ltd.
Temperature test probe surface temperature probe
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High Voltage Probe Meters
Shanghai Beha Electronics Co., Ltd.
*High voltage test probe *is a high voltage probe that is used with Oscilloscope● Attenuation Ratio: 1000:1*Measuring range: AC 20KV/DC 30KV
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SINGLE ENERGY IMPACT HAMMERS
Shenzhen Chuangxin Instruments Co., Ltd.
It’s used to test the mechanical integrity of product enclosures and check the durability of enclosures for electrical appliances of other electrical appliances and other electronic products. If damage occurs from the Impact Hammer test, accessibility probes can be used to measure the extent or severity of the damage. The Impact Hammer simulates the mechanical impact to which electrical equipment maybe subjected.
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Auto-ranging Digital Clamp Meter
DCM402
Expert Quality, auto and manual ranging clamp meter capable of voltage, current, resistance, diode, continuity, capacitance, frequency, duty cycle and temperature testing. Maximum jaw - opening diameter of 36mm, backlit LCD screen, auto power off, linear bar graph functions and a useful inspection light. Supplied with test leads, temp probe, case and 3 x AAA batteries.
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Stand-Alone Test Fixture
MA 2013/D/H/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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Manual Test Fixture (MA)
MA 2013/D/H/VPC-G12x-18
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 25,00 kg
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Kid's Finger Test Probe 19
CX-19
Shenzhen Chuangxin Instruments Co., Ltd.
Children Finger Test Probe 19 is intended to simulate access to hazardous parts by children of 36 months or less.
