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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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PXI Source Measurement Unit
PX773x
The PX773x is a high precision, high speed source and measurement unit, which is designed for automated high throughput testing.
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PXI/PXIe Fault Insertion Switch, 74-Chan 2A, N/C Through Relays, Fault Buses on M & U
40-190C-012
The 40-190C-012 (PXI) and 42-190C-012 (PXIe) are fault insertion switches with 74 channels. They are part of a range of modules available with 74, 64 or 32 channels and are primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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CAN/FlexRay/Differential Bus PCI Fault Insertion Switch - 4 Channel
50-200-004
This PCI Fault Insertion card is designed to simulate common faults on two wire communication interfaces such as CAN Bus. This card supports 4 or 8-channels of two wire serial interfaces. Each channel can simulate an open fault in either or both wires, a short between both wires or a short to one of eight externally applied fault connections, such as a battery connection or ground, via four fault buses.
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Scienlab Battery Test System - Cell Level
SL1007A
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Electronics Testing Solutions
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Custom Test System Solutions
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Source Measurement Unit
PEMU4
The PEMU4 represents a new level of performance and capabilities for USB-based SMU (Source MeasurementUnit) instrumentation. The PEMU4 supports -1V to +6.5V 0.5A with FVMI, FVMV, FIMV, FIMI modes. 4 channel can be ganged to support high current driving. I2C/SPI/RFFE function for serial port device testing. 4 Counter for frequency measurement.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Combinational Base Test Platform
6TL24
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid-volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Batterie Inspektor
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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6TL60 Rotary Test Handler
H79006010
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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PXI Dual Bus 64-Chan 2A Fault Insertion Switch, N/O Through Relays
40-190B-402
The Dual Bus, 64 Channel PXI Fault Insertion switch is part of our family of 2 Amp fault insertion solutions, The range includes modules with 74, 64 or 32 channels and single or dual fault buses. This version has normally open through relays, so in the default state, there are no paths between inputs and outputs for any signal channel.
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Safety Compliance Test System
EN 60601
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Standardize Production Test Software For PCBAs And Electronic Devices
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Modular Functional Testing Platform
OTP2
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Component Test Fixture For N1413 With B2980 Series
N1428A
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Manual Tablet Testing Units
H-Series
The manual lab testers of the H-series in the new LAB.line design combine state-of-the art technology with usability: round shapes, generous radii and smooth surfaces allow for easy and hygienic cleaning.Operation of the embedded touch display is simple and intuitive: you can change a product or view informative test results with just a few clicks.The H series consists of three unit variations with usually 500 N, alternatively 50 N or 1000 N. The H5 version offers to connect an external scale (Sartorius/Mettler). With the H5+ version, you can even perform high-precision measurements with the external thickness gauge module.
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PCIe 2.0 Test Platform
PXP-100B
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
