Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Single Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Single Wafer Transfer Tools
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*Beam Propagation Analysis
M²
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M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
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Analysis Application for E84
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GCI's industry leading E84 diagnostic software is a powerful, Windows-based graphical analysis application that can upload and analyze data from GCI's E84 Handheld Tester, E84 DLD, and RJ-11 Optical Transceiver products. The E84 Analysis Application can also display the signals of a live material handoff in real-time when connected to GCI's E84 DLD or RJ-11 Optical Transceiver.
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Surface Analysis
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Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
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Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Dynamics & Transients Analysis Software
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Dynamics & Transient analysis software enables engineers to simulate sequence of events including power system disturbances and evaluate system stability by utilizing an accurate power system dynamic model.
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Spectrophotometers, Laboratory And Analysis Systems
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Instruments, accessories and calibration standards for in-situ and ex-situ optical transmission, reflection, absorption, and photoluminescence measurements
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Complete Power Analysis System
PK3564-PRO
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PK3564-PRO complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, and 1-year deluxe warranty.
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Arc Flash Analysis
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ETAP Arc Flash Analysis allows you to identify and analyze high risk arc flash areas in your electrical system, and it also allows simulation of several different methods used by engineers to mitigate high incident energy.
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Harmonic Analysis Software
HI_WAVE
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HI_WAVE simulates resonance and harmonic distortion in industrial, commercial, and utility power systems.
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CS/ONH-Analysis
G6 LEONARDO
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The high-end thermal conductivity detector used for hydrogen and nitrogen analysis allows detection limits in a sub-ppm range (based on 1g sample mass)
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Ultrasonic Imaging with Molecular Analysis
MOLECULUS
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MoleculUS is a dual-modality ultrasound and photoacoustic data acquisition unit that allows the simultaneous collection of ultrasound and photoacoustic channels sharing the same probe elements. The analog signal path of MoleculUS is split into PA and US paths. PA and US modes operate sequentially in time with support for US preview mode and continuous on-fly multiplexing between modes.
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Wafer Inspection Products
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Sonix provides manual and automated wafer inspection and metrology systems for wafers ranging from 100mm to 300mm, with extensive analysis capabilities at both the wafer and device level. These industry-leading automated wafer inspection systems are used by the world’s top manufacturers to ensure quality from development through production.
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BT Imagine New wafer Thickness System
IS-T1
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Measurement Technique Laser Triangulation1-3 Laser Sensor SpotsLaser Spot Size Optimized for Accuracy and Precision.
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Data Analysis & Graphing Software
Origin
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Origin is the data analysis and graphing software of choice for over half a million scientists and engineers in commercial industries, academia, and government laboratories worldwide. Origin offers an easy-to-use interface for beginners, combined with the ability to perform advanced customization as you become more familiar with the application.
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Catalysis and Thermal Analysis
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A system for catalyst characterisation, reaction testing, kinetic and thermodynamic measurements.
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Stack Analysis Tool
GNATstack
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GNATstack is a software analysis tool that enables Ada/C/C++ software development teams to accurately predict the maximum size of the memory stack required to host an embedded software application. GNAT Pro add-on.
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Dynamic Image Analysis (DIA)
CAMSIZER
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Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions. Retsch Technology's optical analyzers CAMSIZER P4 and CAMSIZER X2 are based on this technology, covering a measuring range from 0.8 m to 30 mm.
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Surface Form Analysis System
Tropel® FlatMaster®
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Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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PCIE GEN5 Analysis System
KODIAK
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PCIe Analysis Platform with Embedded Hardware, Calibration-Free SI-Fi™ Probing and Automatic Equalization, Internal SSD Storage, Touchscreen LCD, and Standard PCIe Cabling.
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On-Line Gas Analysis System
Titan-OL
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The Titan-OL is a turnkey, process-ready gas analysis system. The analyzer and sample handling hardware can be wall or frame mounted in a NEMA enclosure suitable for use in production environments, including Class I, Div. 1. The integrated sampling system is fully purgeable and can handle multiple sample and reference lines.
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Transient Motor Starting Analysis
TMS
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The Transient Motor Starting Analysis module (TMS) is a state-of-the-art time simulationprogram to analyze all aspects of motor starting problems accurately.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
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The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
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Dynamic Signal Acquisition and Analysis
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m+p Analyzer systems are available for field and laboratory use from 4 to many hundreds of measurement channels. From gathering simple time history data to narrowband (FFT) spectra, fractional octaves, wavelets, shock response spectra and much more, m+p Analyzer real time analyzers can be used with a wide range of instrumentation hardware including our own m+p VibPilot, m+p VibRunner and m+p VibMobile systems, National Instruments (CompactDAQ USB, PCI, PXI) and VTI Instruments (PCI). Low cost portable instruments to systems for distributed measurements can be configured for maximum flexibility. Measurement data from all sources are stored in a common format so it is easy to compare and handle results from any measurement source.
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Manual Media Analysis Solutions
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Truly one tool to view them all. The Ultimate Analyzing Tool for manual in-depth analysis, verification and validation of various file formats and containers. Metadata extraction and stream manipulation available.
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Wafer Test
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Automatic KLA wafer probers with tray-to-tray-wafer-handling are operated 24h a day and 7 days a week. Data retention bake/tests are done at wafer level
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Data Analysis Software
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software package which is used to obtain, display and analyse data from control systems such as those used within motorsport and automotive applications.Familiar controls and extensive use of the mouse, menus and accelerator keys make it easy to set up and to use
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Wafer Prober
Prexa
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The latest fully automated 300mm wafer prober. The system offers excellent productivity and advanced functions, contributing to KGD (known good die) testing for advanced packaging.
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C/C++ Source Code Analysis
CODECHECK
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CodeCheck is a programmable tool for checking all C and C++ source code on a file or project basis. CodeCheck is input compatible with all variants of Standard K&R C, Standard ANSI-C/C++, and all C and C++ compiler vendors. We support GCC-GNU Open Source C/C++ compilers. CodeCheck is designed to solve all of your Portability, Maintainability, Complexity, Reusability, Quality Assurance, Style Analysis, Library/Class Management, Code Review, Software Metric, Standards Adherence, and C++ Corporate Compliance Problems.
