Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Veracode Analysis Center
Innovating through software holds many promises, but it can also create some major operational headaches. Without a holistic approach to application security, teams often lose valuable time onboarding, learning, and managing multiple AppSec tools that don't “play well” together. Various testing methods, metrics, and dashboards provide incomplete views of activity, and security teams often struggle to maintain control and understand overall risk.
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Bare Wafer Inspection System
LS-6700
Hitachi High-Technologies Corp.
High sensitivity (50nm:Bare). High accuracy for COP/CMP discrimination (85%). High throughput (80 wph @300mm).High positioning accuracy (+/-30m). Wafer Size 300mm / 200mm.
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Fluid Analysis Information Management System
SpectroTrack
SpectroTrack is an Information Management System (IMS) optimized for laboratories that specialize in the analysis of in-service (used) lubricants for machine condition monitoring. The browser-based system is the ideal tool for accessing historical and trend information about an organization’s high-value assets. The software provides a single end-to-end view of a sample lifecycle from sample submission and receipt to results entry. The software also provides all trending, imaging, numerical and textual asset data in one secure location. Clients can see a comprehensive, historical view of fluid condition for an engine, department or an entire fleet.
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Rotating Machinery Analysis
The Rotate software package is part of the m+p Analyzer Software for noise & vibration measurements and analysis. It provides a wide range of data acquisition and analysis tools for capturing and understanding noise and vibration induced in rotating and reciprocating machines by their motion. Fixed and variable speed machines are accommodated as are both structural vibration and condition monitoring diagnostics. Multiple tacho inputs can be processed for accurate speed tracking during analysis. Spectral mapping, order tracking, time history and orbit data analysis are all available.
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Data Acquisition Analysis SystemWave Stocker
This is the really useful equipment which our Solution Teamdeveloped using their experience obtained at their customer' s site.Simultaneous measurement by with sampling of max.16 channels is possible, enabling easy waveform analysis. This can be used for versatile tasks as the measurement at the site, inspection and R & D.
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Spectrum Analysis, Up To 26.5 GHz
S930902B
The S930902B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 26.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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2D Near-Field Analysis of VCSEL Arrays
VTC 4000
Instrument Systems Optische Messtechnik GmbH
The VTC 4000 near-field camera from Instrument Systems was specially developed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-controlled characterization of all relevant parameters simultaneously for the single emitters of the array.
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LED Type Wafer Alignment Sensor Controller
HD-T1
Panasonic Industrial Devices Sales Company of America
The HD-T1 Series is a new Wafer Alignment Sensor that uses a safe red LED light beam, with a resolution of 30µm, to achieve the same high level performance as Laser Sensors. The HD-T1 Sensor is best suited to detect wafer eccentricity, notches and orientation flats. Using linear image Sensor methodology and high-speed sampling technology, a wide variety of objects can now be stably measured with great precision at ultra-high speeds. This CCD style Sensor is developed for use in almost all fields of industry, e.g. tire manufacturing or Semiconductor production (Wafer Printed Circuit Boards).
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Cross-Section Analysis Laboratory
PCBs are constructed of a variety of materials such as glass, ceramic, copper, solder and Teflon. Trialon has the equipment and experienced staff to perform this difficult analysis. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Static Code Analysis for Embedded Software
GrammaTech CodeSonar®
CodeSonar is GrammaTech´s flagship static analysis software. Able to analyze both source code and binary code, it is specifically designed for zero-tolerance defect environments. With its advanced static analysis engine, CodeSonar is one of the most effective tools for eliminating the most costly and hard-to-find software defects early in the application development lifecycle. Compared with other tools, CodeSonar identifies twice as many defects that result in system crashes, leaks, data races, memory corruptions and security vulnerabilities.
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Multifunction Data Collection and Analysis System
2002
The Model 2002 DME System is a state of the art, multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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System Modeling for Diagnostic Design and Analysis
EXpress
eXpress is a comprehensive model-based diagnostics engineering software application providing an environment for the design, capture, integration, evaluation and optimization of complex or large-scale system diagnostics, prognostics health management (PHM), systems testability engineering, failure mode and effects analysis and system safety analysis. eXpress is uniquely suited to influence the diagnostic development for new designs or to exploit the diagnostic challenges of existing legacy systems. Its robust structure facilitates the capture of extensive interdisciplinary design knowledge providing an unmatched ability to corroborate, reuse and re-purpose expert knowledge in performing standardised testability, reliability and maintainability analyses.
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Gas Analysis
QIC MultiStream
The Hiden QIC MultiStream is a complete, multi-stream gas composition monitoring system. Capable of analysing gas streams at flow rates from 4 ml/min up to 10 L/min. The system is suited to a range of applications where multi-component, multi-stream gas analysis is required, environmental monitoring for example.
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CS/ONH-Analysis
G4 ICARUS Series 2
The combustion analyzer G4 ICARUS Series 2 with high frequency (HF) induction furnace and HighSense™ detection sets new standards in for a rapid and precise carbon (C) and sulfur (S) analysis in inorganic solids.
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Metallurgy Analysis
The metallurgical group is well equipped and staffed (9 full-time metallurgists and technicians) to evaluate materials ranging from cast iron to superalloys to composites. They are experienced in classical metallographic techniques, as well as the latest preparation methods.
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X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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FTIR Analysis
Anton Paar offers state-of-the-art Fourier-transform infrared (FTIR) instrumentation with the possibility to automate and connect to other Anton Paar benchmark instruments. It combines FTIR spectroscopy with comprehensive data analysis to provide rapid results and increase efficiency in the laboratory. A high-resolution touchscreen with a user interface inspired by modern smartphones enables operators to conduct the most intuitive FTIR analysis available on the market. Anton Paar’s FTIR specialists and a worldwide service network are ready to support you with your spectroscopy applications.
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Spectrum Analysis
S96090B
The spectrum analyzer (SA) application adds high-performance microwave spectrum analysis to the analyzer. With fast stepped-FFT sweeps, the SA application provides quick spurious searches over broad frequency ranges.
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Acoustic Analysis
Includes cursor readout of dB bands, max & min lines, noise curve overlays, pink noise generator, and optional STC Transmission Loss.
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Acoustic Analysis
Noise is increasingly the subject of new regulations for the protection of human health and safety as well as for improving the environment in general. As well as sound levels, the perceived sound quality of products from washing machines to vehicles is often an important part of the customer buying decision so must be considered during product development. m+p Analyzer for noise and vibration measurement and analysis provides a full range of capability for these applications. Real-time fractional octave filters satisfy all acoustic applications from simple sound pressure, sound power for equipment legislative requirements, intensity mapping to isolate sources to sound quality metrics for product refinement.
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High Frequency Antenna Analysis Software
XGtd®
XGtd is a general purpose ray-based electromagnetic analysis tool for assessing the effects of a vehicle or vessel on antenna radiation, predicting coupling between antennas, and predicting radar cross section (RCS). It is ideally suited for applications with higher frequencies or very large platforms where the requirements of a full physics method may exceed available computational resources.
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Communication Analysis System
ACQUA
ACQUA is a dual channel analysis system for diagnosis of acoustic and/or electric transmission paths up to 24 kHz. By means of predefined modifiable measurement descriptors measurement data can be gathered and evaluated in a simple and quick manner. All telecom specific analyses comply with the international standards of ETSI, ITU, TIA, 3GPP, GCF, PTCRB, DECT Forum, GSMA, CTIA.
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X-ray Diffraction and Elemental Analysis
N8 HORIZON
The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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Scanning Electron Microscopy (SEM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Dynamic Imaging Particle Analysis Technology
FlowCam® Macro
Yokogawa Fluid Imaging Technologies, Inc.
Based on proven FlowCam dynamic imaging particle analysis technology, and optimized for larger particles (50μm to 5mm), FlowCam Macro provides rapid particle characterization that goes beyond just particle size. Direct, image-based measurements of particle size and shape enable differentiation of particle types in a heterogeneous mixture.
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Mainframe Debugging and Analysis
Xpediter
Xpediter is Compuware's mainframe application interactive debugging and code coverage solution. When an application experiences a problem, developers need to get into an interactive test session to solve the issue. However, complex setup procedures make this a time-consuming step and delay the resolution process.Compuware's mainframe debugging and analysis tool Xpediter enables developers to get into an interactive test session with minimal effort and quickly move applications into production with greater confidence.
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Wafer Thickness, TTV, Bow and Warpage
ALTO-TTV FAMILY OFFERS THE SPEEDY MEASUREMENT OF WAFER GEOMETRY PARAMETER, MORE IMPORTANTLY, WE CAN AUTOMATE THE TOOL TO HANDLE FROM THIN WAFERS TO PERFORATED, WARPED, BUMPED, AND TAPE-FRAMED WAFERS. OPTIONAL SORTER AND SHIPPING JAR UNPACKING FUNCTION AVAILABLE.
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Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
