Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Product
Phase Failure Detectors
DSP
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Your product The DSP-1L or DSP-1LM is used to protect your three-phase motors against phase loss, imbalance, or reversal. It continuously monitors each phase of your power supply. In case of a problem, it cuts the power to the control circuit to protect the affected motor.
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Product
Gas Analysis
HPR-90
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The HPR-90 automated package cracking analysis system is a complete system optimized to analyse gas within sealed volumes such as light bulbs.
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Product
Spectrum Analysis
S96090B
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The spectrum analyzer (SA) application adds high-performance microwave spectrum analysis to the analyzer. With fast stepped-FFT sweeps, the SA application provides quick spurious searches over broad frequency ranges.
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Analysis Software
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We offer comprehensive software solutions for analyzing sound and vibration as well as communication and audio quality. Thanks to a modular structure, users can tailor specific solutions to their individual requirements.
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PAM-4 Analysis
N19306B
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PLTS N19306B extends the N19301B base product to perform PAM4 eye diagram analysis beyond the default NRZ eye diagram analysis in the base N19301B.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Product
Solar Wafer Transfer Tool
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Solar Wafer Transfer Tool
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
MultiSite Test sockets and Wafer Level
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multi-site sockets include anything from strip test sockets to test sockets for wafer test to multi-position, singulated devices. The advantages of these sockets can be enormous as test time can be decreased by a factor of ten over conventional one up testing. In most cases, the throughput is only limited by tester capabilities and/or handling capacity.
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Contactless Wafer Geometry Gauge
MX 20x series
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The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
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Product
Optical Communication Analysis
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In lab and manufacturing environments, R&D engineers require scalable and optimized test solutions to enable them to properly characterize new advanced modulation scheme signals for next-generation, ultra-high-speed telecom networks. Through EXFO’s optical communication analyzers, R&D engineers and manufacturing operations involved in the development or production of transmitters or systems based on new high-speed technology will find the right tools for their advanced technology needs.
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Thermal Analysis
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Improve accuracy, sensitivity, and performance in thermal analysis using our comprehensive portfolio of instruments. Our wide selection of precision designed accessories and consumables deliver the peace of mind that comes from knowing that you’ll get the results you need.
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Chemical Testing and Analysis
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Chemical testing and analysis is vital for regulatory compliance and to understand the quality and composition of chemical substances and materials that are used in products, industrial processes and manufacturing. Specialist industry knowledge, and expertise in applying the most relevant methodology are the keys to successful chemical testing. Advanced analytical instrumentation or a combination of techniques is necessary to solve problems or determine composition.
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Product
Measuring and Analysis Software
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With over 10 years of experience, IVS-KA6000 PV Test IV software has been developed by Enli Technology. IVS-KA5000, the previous generation, has more than 500 users. IVS-KA6000 is evolved from IVS-KA5000 based on users’ feedback and experience. IVS-KA6000 can control a variety of SMUs and perform data collection of current and voltage based on setting parameters by users. The formulas and algorithms of IVS-KA6000 are …
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Multi-Track Spectral Analysis
FreqAnalyst Multi
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FreqAnalyst Multi is a unique multiple tracks real time spectrum analyzer: it lets you visualize the spectral content of several audio tracks on the same screen with extreme smoothness and high resolution for both time and frequency. It is the ideal solution for mixing: you can use it as a frequency overlap detector and actually see which part of the spectrum every single instrument uses.
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Product
Wafer Inspection System
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JRT Photovoltaics GmbH & Co. KG
In close cooperation with well-known providers of inspection systems, we provide modular systems for quality control and classification of raw wafers.
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Universal Analysis Tool
CANalyzer
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CANalyzer is the universal analysis tool for ECU networks and distributed systems. CANalyzer makes it easy to observe, analyze, and supplement data traffic in CAN, LIN, MOST, or FlexRay systems. With powerful functions and user-programmability, all needs are covered from simple network analysis to advanced troubleshooting of complex problems.
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Product
Simulation And Analysis Software
fcXplorer Analyzer
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Avionic Interface Fiber Channel Simulation and Analysis Test Software, fcXplorer, is an easy-to-use graphical user interface for Fiber Channel Simulyzer modules. fcXplorer is designed for troubleshooting, optimization, planning and configuration of fiber channel data. The low and high level protocol analysis offers acquisition, filtering, time stamping and interpretation of Fiber Channel data traffic and generates statistics.
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Wafer Prober
Prexa MS
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The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
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PC Analysis Software
TekScope
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Get the analysis capability of an award-winning oscilloscope on your PC. Analyze waveforms anywhere, anytime. The basic license lets you view and analyze waveforms, perform many types of measurements and decode the most common serial buses - all while remotely accessing your oscilloscope. Advanced license options add capabilities such as multi-scope analysis, more serial bus decoding options, jitter analysis and power measurements.
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Product
Modular Logic Analysis
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With the HDA125 High-Speed Digital Analyzer, Teledyne LeCroy has defined a totally new class of instrument – a high-performance logic analyzer module that can be combined with existing high-speed oscilloscopes to provide unparalleled mixed-signal measurement and analysis.
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Product
Gas Analysis
HPR-20 EGA
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The Hiden HPR-20 EGA gas analysis system is configured for continuous analysis of evolved gases and vapours from thermogravimetric analysers, TGA.
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Product
Cross-Section Analysis Laboratory
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PCBs are constructed of a variety of materials such as glass, ceramic, copper, solder and Teflon. Trialon has the equipment and experienced staff to perform this difficult analysis. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Product
Water Iron Analysis
Aztec AW633
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The Aztec 600 colorimetric iron analyzer provides reliable and accurate measurement of iron concentrations to improve drinking water quality and optimize chemical usage.
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Carbon/Nitrogen Analysis by Combustion
928 Series
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By incorporating state-of-the-art hardware and an on-board touch-screen software platform, the 928 Series allows you to easily handle the most demanding sample applications. The core capabilities and performance of previous generations of LECO macro combustion instruments have been maintained, while key improvements have been made in throughput, uptime, and reliability. Macro sample mass ability (up to 3 grams for Nitrogen/Protein model regardless of sample carbon content) with rapid cycle times and a resulting low cost-per-analysis make the 928 Series ideal for analysis of characteristically heterogeneous, difficult to prepare, or low analyte level samples.
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Product
Wafer Edge Profile Measurement
WATOM
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WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
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Product
Ambient Temperature Vacuum Wafer Chucks
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6" (152mm) Vacuum Wafer Chuck for General Purpose Ambient Temperature testing with a Stainless Steel vacuum wafer surface
