Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Standard Parameters for Analysis
C-Cell Mono
C-Cell Mono is the original system and comes with the standard parameters for analysis. C-Cell Mono takes 1 image of the sample to produce analytical results such as crust wall thickness, size, shape and location. C-Cell Mono is the entry level model of the C-Cell range and offers all the basic image analysis needs for a baker.
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Data Logging and Analysis With Tecap
Tecap provides such a tool for simple online overview. This tool is useful to analyse the stability of the developed test program. It is easily to recognize if the program shows the expected repetitive accuracy.
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Stream & Video Quality Analysis System
VQTS-300
VQTS-300 is a self-contained solution, combining: HDMI/DVI, Display Port or LVDS grabber - one of Unigraf UFG-04 range capture cards, order option Powerful stream analysis tools - Unigraf UFG-04 software Sophisticated image quality analyzer - VideoQ VQMA3 software Ideal tool for development labs, software developers and high volume manufacturers Easy-to-use tool, instantly revealing your source-sink link status, video camera or other video device performance User-selectable reporting modes: machine-readable file with Pass/Fail marks detailed multi-page PDF document Manual and automated performance measurement of HDM/DPI links, video cameras and/or video processors Via optional SDI-HDMI adapter VQTS-300 measures the performance of 3G-SDI/HD-SDI video processors
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Multi-omics Analysis Package
The Multi-omics Analysis Package, developed for metabolic engineering applications, provides the ability to automatically generate metabolic maps and perform a variety of data analysis for the vast data generated in fields like metabolomics, proteomics and flux analysis. It offers a powerful platform to support drug discovery, bioengineering and other life science research applications.
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Portable Wafer Probe Station
PS-5026B
High Power Pulse Instruments GmbH
The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.
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Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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CS/ONH-Analysis
G6 LEONARDO
The high-end thermal conductivity detector used for hydrogen and nitrogen analysis allows detection limits in a sub-ppm range (based on 1g sample mass)
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Analysis Software for FLIM, PLIM
SPCImage
*Analysis of Single-Decay, FLIM and PLIM Data*Analysis by Iterative Convolution and Fit Procedure or by First Moment of Photon Distribution*Calculations of Decay Parameters and Lifetimes by Various Decay Models*Calculation of FRET Efficiencies*Display of Lifetime and FRET Images*Display of Lifetimes, Amplitudes, Intensities or Ratios*Export of Lifetime Data and Images
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Wafer Mapping Sensor
M-DW1
Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Image Analysis Software
Offering you a complete choice of products which include brinell pro software, caliper pro software, cast iron analysis software, hardness pro image analysis software, live measurement software and material plus software.
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Carbon/Nitrogen Analysis by Combustion
928 Series
By incorporating state-of-the-art hardware and an on-board touch-screen software platform, the 928 Series allows you to easily handle the most demanding sample applications. The core capabilities and performance of previous generations of LECO macro combustion instruments have been maintained, while key improvements have been made in throughput, uptime, and reliability. Macro sample mass ability (up to 3 grams for Nitrogen/Protein model regardless of sample carbon content) with rapid cycle times and a resulting low cost-per-analysis make the 928 Series ideal for analysis of characteristically heterogeneous, difficult to prepare, or low analyte level samples.
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Impurity Analysis In Bulk Gas
High-purity gas is necessary in industries such as chemical, medical, and foods. Precisely controlled GC enables identification and quantitation of a trace amount of impurities in bulk gas. If the gas resources in a factory consist of multiple lines, a sample line selector SLS-2020 can be utilized to switch sample lines automatically, allowing a single GC to analyze all samples.
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Datalogger for IAQ Analysis
HD37AB1347
Datalogger for indoor air quality analysis (IAQ). Measurement of airspeed, temperature, relative humidity, atmospheric pressure, CO² and CO.
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STDF Test Data Analysis Tool
DataView
DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Incident-based Abnormal Software Behavior Analysis Services
If you have a software problem that no one can analyze, need training to get your developers, support and escalation engineers improve their troubleshooting, debugging, memory dump and software trace analysis skills or just need the expert opinion on an existing analysis report please don't hesitate to contact us.
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Non Destructive Analysis
The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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Signal Analysis
FFT Analysis
The program FFT (Fast Fourier Transform) Analysis is used for narrow-band spectral processing of signals coming from the input channels of ADC modules and FFT spectrum analyzers (in real-time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Static Code Analysis Tool
Klockwork
Klocwork integrates seamlessly into desktop IDEs, build systems, continuous integration tools, and any team's natural workflow. Mirroring how code is developed at any stage, Klocwork prevents defects and finds vulnerabilities on-the-fly, as code is being written.
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Advanced All-in-One Bluetooth® Analysis System
Vanguard
The most advanced, most comprehensive Bluetooth protocol analyzer ever made. Building on a legacy of innovation, the Bluetooth Vanguard All-In-One Protocol Analysis System delivers new advances designed to ease the increasingly complex tasks of Bluetooth developers. Vanguard provides synchronized capture and analysis of BR/EDR, Bluetooth Low Energy, Wi-Fi 802.11 a/b/g/n/ac (3x3), WPAN 802.15.4 (all 16 2.4 GHz channels), raw 2.4 GHz RF spectrum analysis, HCI (USB, UART, SPI), generic SPI/UART/I2C/SWD communications, WCI-2, logic signals, and Audio I2S.
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Full-Wave Three-Dimensional Analysis Software
EZ-FDTD
Based on the Finite-Difference Time-Domain method, EZ-FDTD brings the full power of electromagnetics to solve complex EMI/EMC real-world problems for any frequency ranges that your application demands. Eliminate guessing for critical problems. Eliminates rule of thumb uncertainty. Provides insight, confidence and solutions.
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Stand Alone Wafer Sorter
MicroSORT
The Microtronic MicroSORT semiconductor wafer sorter is designed to maximize throughput while minimizing wafer handling in a user-friendly operating environment. This stand-alone semiconductor wafer sorter enables sophisticated semiconductor wafer sorter routines for up to 4 wafer-cassette platforms. MicroSORT semiconductor wafer sorter reads OCR scribes from the top, bottom, or simultaneously, allowing for enhanced semiconductor wafer tracking and sorting. The MicroSORT semiconductor wafer sorter’s basic functions include the ability to move, compress, randomize, find, align, verify, and split semiconductor wafer lots. With our virtual tweezer mode, an operator can click on wafer icons to move wafers between cassettes, read semiconductor wafers, and swap wafer positions.
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Data Acquisition & Analysis
Avionics Interface Technologies
We provide fully integrated avionics data bus and high speed network analyzer and data acquisition systems. Combining our extensive product catalog of Avionics interface modules, and our easy to use Analyzer software applications, with our Engineering Expertise, we are able to satisfy a wide range of avionics network data capture and analysis requirements with our COTS products or with customized solutions.
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Fully Automatic 4 Point Probe System for Silicon Wafer
WS-8800
*Measurement of resistivity, thickness, conductivity(P/N) and temperature*Tester self-test function, wide measuring range*Thickness, measurement position and temperature correction function for silicon resistivity*Number of cassette station can be changed by customers request*Host (CIM) communication and SMIF or FOUP compatible
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Water Analysis Meters & Electrodes
Ideal for Accurate Everyday Measurements in the Laboratory
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Wi-Fi Site Surveys, Analysis, Troubleshooting App
Netspot
NetSpot is the only professional app for wireless site surveys, Wi-Fi analysis, and troubleshooting on Mac OS X. It''s a FREE Wi-Fi analyzer. No need to be a network expert to improve your home or office Wi-Fi today! All you need is your MacBook running Mac OS X 10.6+ and NetSpot which works over any 802.11 network.
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PAM-4 Analysis
N19306B
PLTS N19306B extends the N19301B base product to perform PAM4 eye diagram analysis beyond the default NRZ eye diagram analysis in the base N19301B.
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WAFER MVM-SEM
E3300 Family
The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Battery Test and Analysis System
BTAS-16
The task of testing an aircraft’s Nickel-Cadmium batteries is complicated and involved because of the high number of cell voltage readings that need to be taken during testing. Taking voltage readings from all 20 cells in the typical nickle-cadmium aviation battery multiple times is laborious and error prone, but must be done to properly estimate the condition of the battery under test.
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High Resolution Frequency Response Analysis (FRA) System
TR-AS FRA
The Frequency Response Analysis (FRA) on power transformers is used for diagnosis at works, after putting into operation and for maintenance on site. The frequency dependent admittance is determined and recorded as fingerprint.
