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Process EDXRF Spectrometer
NEX LS
Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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sonic tester
PR-82
The PR-82 sonic tester has been modified for the automotive industry. This gauge is commonly used for measuring the thickness of cylinder walls, head ports, decks, tubing, body panals, and windshields. It also has the ability to scan the length of a part to find the the minimum thickness.The PR-82 is back-lit and the unit operates for up to 200 hours on a single set of batteries. It is protected by Dakota Ultrasonics 5 year limited warranty.
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Spread Resistance For Slanting Polished Sample Of Semiconductor By Tow Kinematically-mounted Probe Contacting .
SRS-2010
*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
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High Voltage Thick Film Chip Resistors
HVTK (HVR)
*Highly reliable multilayer electrode construction*Higher component and equipment reliability*Excellent performance at high voltage*Reduced size of final equipment
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Coating Thickness Gauge for Ferrous and Non-Ferrous Materials
CM8856
* It meets the standards of both ISO2178 and ISO 2361 as well as DIN, ASTM and BS. It can be used both in the laboratory and in harsh field conditions.* The F probes measure the thickness of non-magnetic materials (e.g. paint,plastic, porcelain enamel, copper, zinc,aluminum , chrome etc.) on magnetic materials (e.g. iron, nickel etc.) . often used to measure the thickness ofgalvanizing layer, lacquer layer, porcelain enamel layer, phosphide layer, copper tile, aluminum tile, somealloy tile, paper etc.The N probes measure the thickness of non - magnetic coatings on non-magnetic metals .It is used on anodizing, varnish, paint, enamel,plastic coatings, powder, etc. appliedto aluminum, brass, non-magnetic stainless steel, etc.* Automatic substrate recognition.* Manual or automatic shut down.* Two measurement mode: Single andContinuous* Wide measuring range and highresolution.* Metric/Imperial conversion.* Digital backlit display gives exactreading with no guessing or errors.* Can communicate with PC computerfor statistics and printing by theoptional cable.* Can store 99 groups of measurements.* Statistics is available.2.SPECIFICATIONSDisplay: 4 digits LCD, backlitRange: 0~1250 μm/0~50mil(other ranges can be specified )Min.radius workpiece: F: Convex 1.5mm/Concave 25mmN: Convex 3mm/ Concave 50mmMin. measuring area: 6mmMin.Sample thickness : 0.3mmResolution: 0.1 μm (0~99.9μm);1 μm (over 100μm)Accuracy: ±1~3%n or 2.5 μm or 0.1mil(Whichever is the greater)Bttery Indicator: Low batter indicator.PC interface: with RS-232C interfacePower supply: 2x1.5 AAA(UM-4) batteryOperating condition: Temp. 0~50℃ .Humidity <95% .Size: 126x65x35 mm; 5.0x2.6x1.6 inchWeight: about 81g(not including batteries)Standard accessories:Carrying case ...................1 pc.Operation manual ............ 1 pc.F probe in built .................1 pc.NF probe in built...............1 pc.Calibration foils ..............1set.Substrate (Iron) ................1 pc.Substrate (Aluminium)......1 pc.Optional accessories: RS-232C cable & software:1.USB adaptor for RS-232C2.Bluetooth interface
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Ultrasonic Testers
Our Ultrasonic Thickness Gauge range, is the widest selection on the market with the best cost/performance ratio. On some of the models the warranties are extended up to 5 years while all of these gauges are efficiently and fully backed up and supported. These models are normally carried in stock for fast delivery.
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Mechanical Coating Thickness Gauges
Mechanical Coating Thickness Gauges are suitable for working in high risk areas such as high temperature or flammable atmospheres, underwater or where the risk of explosion is high and could be triggered by the use of an electronic instrument. From the simplest coating thickness gauge Elcometer 101 which will provide you with quick and immediate results to the more accurate coating thickness gauge Elcometer 211, also called the "banana gauge" which is ideal for cold and underwater surfaces.
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Semiconductor Technology, Micro Scriber + Flatness, Bow, Warp, Curvature, Glass Thickness
FLATSCAN
Optik Elektronik Gerätetechnik GmbH
Non contact automated 2D- or 3D measurement of warp, bow, slope and surface curvature with software module for calculation of thin film stress (wafer stress) of wafers and glass substrates.
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Micro-spot Spectroscopic Reflectometry
FilmTek 2000M
Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
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Precious Metal Verifier
Measures completely through the sample.* Measures the sample thickness.* Reads through numismatic cases.* Confirms that the metal density is correct.* Available with external wands: Refiners wand measures 50% deeper. Microwand measures down to 3 mm spot size.
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Analog Output Series Sensors
Shanghai Pubang Sensor Co.,Ltd.
1. Measured distance is linear to output signals, high accuracy, can precisely indicate position of tested objects2. With the change of detection distance, itcan provide 0-10V or 4-20mA of standard analog signals; widely used for distance measurement, thickness measurement,etc
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Measuring Small Antennas
If you have a small PCB with a small antenna you can't use a thick cable and a large connector. Not only is this impractical (how to connect the connector?) but the metal bulk will also affect the antenna and grounding properties of your PCB. The measurement will be useless. MegiQ promotes the use of the small and popular UFL connector and its associated cables. The UFL socket fits on almost any PCB and it can be improvised on a board without a UFL footprint.
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Thickness Gauge
Multigauge 5300 GRP
Designed to check the condition of Glass Reinforced Plastic (GRP) or Engineering Plastics. It can also be used on uncoated metal
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Cross Sections and Metallography
Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
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Surface Resistance Tester
MR – 1
The different specific resistances are specified by selecting one of the pre-programmed materials, or by measuring the specific resistance of unknown materials and entering the result. Preferably the coat thickness is displayed, but the measurement and display of the actual resistance, the square resistance and the specific resistance is possible, too. All measured values can be transmitted into a PC via a serial interface. Controlling the MR-1 on the other hand is not possible.
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2.5” SATA3 – RunCore Consumer SSD "Sprinter Series"
RunCore Innovation Technology Co. Ltd.
Standard 2.5” SATA3 (6Gbps) Solid State Drive (SSD) is a high capacity solid-state flash memory product that complies with the SATA 6Gbps standard and is functionally compatible with a SATA hard disk drive. It is a standard SATA product that supports both 7mm and 9mm thickness.
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Dimension & Displacement Measurement
Ono Sokki Dimension & Displacement Measurement - digital linear gauge, rotary encoder, non-contact thickness meter, laser doppler surface velocity meter.
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ITA, G10, 10 Module, 0.88" Thickness
410104375
ITA, G10, 10 Module, 0.88" ThicknessCompatible with VPC 90-Series modules.
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Film Thickness Mapping Systems
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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Coating Thickness Gauge
Paint Thickness Gauge
Qualitest offers extensive range of advanced coating thickness gauges such as new Positector series and much more.
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Compact Coating Thickness Gauges
MP0R-FP Series
Compact pocket coating thickness gauges with connected cable probe and PC-interface for a convenient, fast and nondestructive coating thickness measurement on virtually all metals
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Process RF Sensors
Process RF (radio frequency) analyzers using penetrating radio waves to determine the moisture content across a full sample thickness. Single point, array and hand-held analyzers provide a variety of sampling options from fully integrated in-process moisture profiling to at-line quality control. RF analyzers are widely used in gypsum, panel board, and other industrial processes.
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Automatic Tablet Weighing System
CIW 7.2/7.3
With the automatic weighing system CIW 7.2 / 7.3 LAB you weigh tablets, dragees, capsules and similar products. Based on the UTS tablet testing systems by Kraemer Elektronik, the standard unit offers a tablet separation system and a special transport star for precise positioning of the test specimen on the integrated scale.The CIW 7.2 / 7.3 LAB in the laboratory version is now equipped with the database-driven, intuitive all-in-one touch software and no longer requires additional software solutions for most areas of application.The functionality of the software can be extended modularly – matching your needs and requirements.Alternatively, you can expand the CIW 7.2 / 7.3 LAB weighing system with a 12-station feeder and/or a 12-station collector to perform multiple defined tests (12-station feeder) in one measuring cycle. All cleaning-related parts can be easily and quickly disassembled without tools.The CIW 7.3 LAB model is nearly identical to the CIW 7.2 LAB, but additionally features a precise measuring device for thickness determination.
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Coking Coal Indices Determinator
CHANGSHA KAIYUAN INSTRUMENTS CO., LTD.
Is used to determine the plastometric indices of bituminous coal (maximum thickness of plastic layer Y, final contraction value of plastic layer X) and describe technical characteristics of coke, which helps to guide coking and coal blending . It is widely applied in coal mining, metallurgy, chemical industry and verification institution of coal quality.
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Matrix Vapor Deposition System
iMLayer
The iMLayer matrix vapor deposition system is sample pretreatment (application of matrix) in order to perform MALDI-MS imaging using an analysis system such as the iMScope imaging mass microscope or the MALDI-7090. With the iMLayer, the deposition method has been adopted as a pretreatment method to achieve high spatial resolution. By using this method, fine matrix crystal can be produced. Also, thanks to automated control, the coating thickness is reproducibly controlled as users configure.
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Materials Metrology
Nova is a market leader for innovative thin film metrology and process control technologies. We develop highly sensitive in-line metrology solutions on high productivity platforms, thereby enabling critical metrology solutions to be closer to a semiconductor fab’s process and integration needs.Our technologies enable customers to accurately detect and quantify small variations in film composition and thickness, thereby influencing better device functionality, and improved manufacturing yield.
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RTX
ROM-3310
ROM-3310 RTX2.0 module integrates an ARM Cortex A8 single core 1 GHz TI AM3352 series ultra low power SoC and I/O solution with Linux. TI AM3352 supports multiple serial ports, 5V~24V wide range power inputs, and wide temperature -40 ~ 85 °C operation for data collection in industrial applications. Based on a thickness of 2 mm board, it uses an anti-oxidization golden finger design
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Ultrasonic Thickness Gauge
72DL PLUS
The Olympus 72DL PLUS™ ultrasonic thickness gauge delivers precision thickness measurements at high speed in a portable, easy-to-use device. With fast scanning, advanced algorithms, and our lowest-ever minimum thickness capability, you can confidently measure the thickness of very thin layers in the most challenging applications.
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Time-Resolved Electrochemical Quartz Crystal Microbalance
400C Series
The quartz crystal microbalance (QCM) is a variant of acoustic wave microsensors that are capable of ultrasensitive mass measurements. Under favorable conditions, a typical QCM can measure a mass change of 0.1-1 ng/cm2. QCM oscillates in a mechanically resonant shear mode under the influence of a high frequency AC electric field which is applied across the thickness of the crystal. Figure 1b below shows an edge view of a QCM crystal undergoing oscillatory shear distortion. The central portions of the top and bottom of the crystal are coated with a typically disk-shaped thin metal film (e.g., gold).
