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Product
Variable Attenuator
VAXE
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The VAXE Variable Attenuators are waveguide components for tunable signal leveling or reflection compensation in waveguide networks. The Attenuators consist of waveguide section with a resistive film evaporated on the mica surface. The Attenuators has 0 ÷30 dB minimum attenuation range. The VAXE Attenuators are available in four waveguide bands between 33 GHz and 170 GHz.
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Product
Deadweight Testers
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AMETEK Sensors, Test & Calibration
We provide the world’s only ball-type deadweight testers, where the ball and weights float on a thin film of air, which is virtually frictionless. This design eliminates the necessity to rotate the weights during testing, and allows the user to concentrate on the instrument itself. Our testers are engineered to offer user-friendly, safe operation, in the field, or in a lab. Both pneumatic and hydraulic testers are available.
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Product
Fully Automatic Non-contact Sheet Resistance Measurement System For Flatpanel Display
NC-60F/RS-1300N
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*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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Product
Pneumatic Flat Grips
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For tensile testing rubbers, plastics, elastomers, textiles, cloth, and paper, in specimen geometries such as plates, films, and wires, a good option is pneumatic flat grips. Quick clamping and a repeatable clamping force are advantages of pneumatic flat grips.
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Product
Piezoelectric
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CTS Corporation develops and manufactures state-of-the-art piezoelectric products, providing custom-made components that meet your exact geometrical, dimensional and performance specifications. Our product portfolio encompasses both bulk and multilayer piezoceramics, single crystals, printed thick film and built-to-print sensors and transducers. Our piezoelectric products are widely used across major industries including med-tech, aerospace/ defense and the industrial sector.
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Product
Ozone Generators & Systems
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MKS offers a wide range of ozone generators and modular delivery systems which produce ultra-pure, reliable ozone gas. In the clean semiconductor environment, Ozone reacts with a wide range of precursor gases resulting in the creation of Al2O3, ZrO2, HfO2, and La2O3 metal oxides to enable thin film deposition processes like Atomic Layer Deposition (ALD) and Etch (ALE). MKS’ generator uses Grade 6 gas, enabling the creation of higher film density improving product yield. Photovoltaic and Display manufacturing leverage semiconductor best practices and utilize ozone to create enhanced thin film barriers, improving product performance and reliability.
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Product
ALD Advantages
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Atomic Layer Deposition (ALD) stands out for one reason: control. The most significant advantages of thin film deposition via Atomic Later Deposition over other methods, are manifest in four distinct areas – film conformality, low temperature processing, stoichiometric control, and inherent film quality associated with the self-limiting, and self-assembled nature of the ALD mechanism ALD is exceptionally effective at coating surfaces that exhibit ultra high aspect ratio topographies, as well as surfaces requiring multilayer films with good quality interfaces technology. This thin-film process builds materials one atomic layer at a time, delivering unmatched uniformity and sub-nanometer precision, even on complex 3D structures. That level of accuracy makes ALD a critical technology for advanced semiconductor manufacturing, flexible electronics, and materials research.
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Product
Micro-spot Spectroscopic Reflectometry
FilmTek 2000M
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Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
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Product
Filters / Splitters / Detectors
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DiCon’s 100 GHz WDM is designed to multiplex and demultiplex signals in multi-wavelength systems based on the ITU 100 GHz grid. The component uses a thin film filter mounted between a pair of GRIN lens collimators. The 100 GHz WDM is housed in a compact, environmentally stable package that offers superior resistance to humidity and temperature and is suitable for mounting on a printed circuit board or within a module.
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Product
Gurley Legality Tester
DRK461A
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Shandong Drick Instruments Co., Ltd.
It can be applied to quality control and research and development of papermaking, textile, non-woven fabric, plastic film, etc
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Product
Air Cooled Femtosecond Laser
FS Series
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The FS Series femtosecond lasers deliver ultra-short pulses (<350 fs) with high energy and repetition rates, ensuring superior precision for thin film processing, medical device manufacturing, and quantum technology development. With up to 200W of power and seamless integration, these compact, high-efficiency lasers provide exceptional speed and accuracy for advanced industrial and scientific applications.
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Product
RF Power Generators
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MKS RF Power Generators provide reliable solid state power for thin films processing equipment. They are vital components of semiconductor fabrication systems, which produce the integrated circuits (ICs) or chips required by modern computers and electronic equipment. MKS RF Generators, combined with our Impedance Matching Network and our V/I Probe form a complete RF Delivery System.
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Product
100GHz/200GHz DWDM Module in LGX Box
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Flyin Optronics’ 100GHz/200 GHz dense wavelength division multiplexer (DWDM module) utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging to achieve optical add and drop at the ITU wavelengths. It provides ITU channel center wavelength, low insertion loss, high channel isolation, wide pass band, low temperature sensitivity and epoxy free optical path . It can be used for wavelength add/drop in telecommunication network system.
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Product
Materials Metrology
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Nova is a market leader for innovative thin film metrology and process control technologies. We develop highly sensitive in-line metrology solutions on high productivity platforms, thereby enabling critical metrology solutions to be closer to a semiconductor fab’s process and integration needs.Our technologies enable customers to accurately detect and quantify small variations in film composition and thickness, thereby influencing better device functionality, and improved manufacturing yield.
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Product
Heat Seal Tester
HST-01
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Jinan Leading Instruments Co., Ltd.
HST-01Heat Seal Tester seals the specimen to determine the seal parameters of basicfilm, laminated films, coating paper and other heat sealing laminated filmsaccording to the requirement of relative standards. The seal parameters includeheat seal temperature, dwell time, and the pressure of heat seal. Heat sealmaterials that have different melting point, heat stability, fluidness, andthickness of could show various heat seal properties, which cause obviouslydifferent seal technique.
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Product
Standard Step Tablets, Gray Scales & Density Reference Charts
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Standard Step Tablets, Gray Scales & Density Reference Charts are available in a wide variety of patterns, designs and sizes to fit a multitude of today’s application needs. Our gray scales and density patches are measured on a variety of NIST traceable instrumentation, including some of the most sophisticated microdensitometers available to the industry. They are imaged on either Photo Paper (RM) or Film (TM) to function for reflective or transmissive applications.
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Product
Microwave Dielectric Measurement Systems
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This system enables fast and non-destructive measurements of materials having various shapes, including thin films. Enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials using the evanescent mode of an open coaxial resonator.
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Product
Plastic Wet Film Combs
154
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Metric and Imperial values are on the same comb, 50 to 800μm on one side, 2 to 32mils on the other.
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Product
DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
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Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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Product
Global Hematology Solution
HELO Solution
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An innovative design solution covering all the needs of a high throughput automated hematology platform.Flexible and efficient, HELO* is the optimum answer to the constant evolution of your laboratory.The HORIBA advanced technologies embedded in the Yumizen H2500/H1500 associated with over 30 years experience in Hematology diagnosis offer the highest analytical performances.Thanks to its data, tube managment, waste, blood film and digitalization management capability, HELO not only addresses your needs, but helps you to optimize your TAT, your floor space and your reagent storage.HELO comes along with our accreditation assistance program which has been developed in accordance with ISO-15189 certification.
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Product
Precision Thick Film Chip Resistors
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Panasonic Industrial Devices Sales Company of America
An AEC-Q200 Compliant SeriesPanasonic components specified as AEC-Q200 Compliant are consistently designed into automotive systems. However, today’s Design Engineers are specifying AEC-Q200 components to meet the high-quality standards of devices beyond automotive applications.
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Product
Ellipsometry And Reflectometry Systems
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Based on non-contact optical techniques, FilmTek tools simultaneously measure multiple-angle and multi-modal data to determine film thickness and refractive index. By measuring multiple angles of incidence, a wavelength shift is introduced between spectra collected at different angles. The wavelength shift between the spectra is only a function of the refractive index of the film and the angle difference between the spectra. By independently determining refractive index from a wavelength shift (as opposed to extracting index information from amplitude changes), FilmTek tools have best-in-class performance for film thickness and refractive index measurement. This level of performance allows FilmTek tools to address applications that otherwise may not be possible with more conventional ellipsometry or reflectometry methods.
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Product
Motorized Force Test System
MT Series
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In the past, film extruders, paper producers, converters, and woven/non-woven fabric producers have had the choice of test stands and universal test machines which are either value-priced peak-force-only machines, or expensive computer-operated integral-load cell machines. Now you can have the best of both worlds in a single instrument. The series MT-1500, a simple to use computer operated tester, with Quality Control software for automatic calculation and graphical display of break, elongation, yield, modulus, and other, tension and compression force information.
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Product
Dew Point Analyzer
CI-IN36
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Shanghai ChangAi Electronic Science & Technology Co.,Ltd
CI-IN36 adopts the sensor that is made of thin polymer film, which can test the dew point with good stability. It will not influenced by condensed water and most compounds. This analyzer has received automatic zero point calibration and gain return patents with wide measure range, high accuracy, good stability and high performance cost ratio. - See more at: http://en.ci-ele.com/470baa2f-f4d7-af3b-c88b-b26356a1660d/8e93bc9f-4658-e0c4-2205-0be00b504269.shtml#sthash.KzPqj2sw.dpuf
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Product
Thin Films, Plasma and Surface Engineering
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A residual gas analyser for vacuum process analysis. Measures the vacuum process gas composition, contamination and leak detection.
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Product
Analytical Services
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IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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Product
Water Vapor Transmission Rate Tester (infrared method)
DRK311
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Shandong Drick Instruments Co., Ltd.
DRK311 water vapor transmission rate tester (infrared method), the instrument is suitable for the determination of water vapor transmission rate of plastic films, composite films and other films and sheet materials. Through the measurement of water vapor transmission rate, the technical indicators of control and adjustment of packaging materials and other products can be achieved to meet the different needs of product applications.
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Product
Benchtop Models For Best Film Metrology
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Fixed, high-precision laboratory instruments used to accurately measure properties like film thickness, refractive index, and roughness.
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Product
SINE Sinusoidal Vision Demonstration Array
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The Sinusoidal Visual Demonstration Array is designed to demonstrate the Modulation Transfer Function (MTF) of the human eye. Its transmittance varies sinusoidally and increases in spatial frequency from 0.2 to 20 c/mm, following a logrithmic scale. The modulation increases linearly from top to bottom. One can see, in the image, where the visual contrast contour disappears which is the MTF of the eye. Ideally suited for teaching and demonstration, the Array is available on film mounted in glass (-G), or mounted in a 2″x 2″ projection slide.(-SL)
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Product
Non-contact Inline Sheet Resistance Measurement Module For Flat Panel Display
NC-600
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*Non-stop and non-contact sheet resistance measuring of thin film on glass runs through on conveyer*1 to 10 number of probe by sizes of glass is attachable*Glass collision prevention function*Continuous test data report to the host computer
