Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Acoustic Microscope
AMI D9650
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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Compact Inverted Microscope, 1mm Field Of View
Viewing transparent samples from below in a Petri dish, flask, well plate or cavity slide. The microscope is compact and can be put inside most incubators to view experiments without opening the door. Time-lapse images can be saved and viewed remotely.Ideal for use as a Bench Microscope in teaching applications.
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Industrial Microscope Solutions
Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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Compact Hydraulic Vibrator Force Simulator
JF Series
The JF Series Force Simulator was developed with the emphasis on light weight, compact size and ease-of-use as a general-purpose, compact jack for the Servopulser system. Testing systems installed with the Force Simulator can easily perform endurance, fatigue and simulation tests on small structural members and various other structural members, which helps improve the logical design and reliability of products.
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Force Sensors
Custom FlexiForce
With its paper-thin construction, flexibility, and force sensing ability, the FlexiForce FSR Sensor can measure force between almost any two surfaces and is durable enough to stand up to most environments. The unique construction and durability of these FSR sensors enables Tekscan to create custom-designed FSR sensors to meet the specific needs of many OEM customers. We also offer standard off-the-shelf sensor products for prototyping and low-quantity requirements.
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Benchtop Thermal Forcing System
Wewon Environmental Chambers Co, Ltd.
Benchtop thermal forcing system from Wewon Environmental Chambers Co., Ltd. has a mini body structure and affordable machine price. The machine can test a wide temperature range, Since no compressor is required for refrigeration, so the benchtop temperature forcing unit’s energy consumption is very low. The repeated resistance degree of the tested sample in the instantaneous extremely high temperature and extremely low temperature continuous environment can detect the chemical changes and physical damage caused by thermal expansion and cold contraction of the sample in the shortest time, so as to achieve the goal of confirming the quality of the tested sample.https://www.wewontech.com/benchtop-thermal-forcing-system/
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Verification Of Maximum Withdrawal Force Test Apparatus
IEC60884 FIG 18
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG 18 verification of maximum withdrawal force test apparatusThis device complies with the requirements of GB 189.1-2008 Figure 18/19, IEC884 Figure 18/19, VDE0620, etc. It is suitable for checking the maximum force required to pull the plug out of the socket and the single pole pin pulled out from the socket assembly. Whether the minimum force required is within the range specified by
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Scanning Probe Microscope
SPM-9700HT
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Digital Microscopes
Digital microscopes are microscopes without eyepieces. A digital camera acts as a detector. Images are displayed on a screen or monitor, turning the microscopy workstation into an ergonomic digital workplace.
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Push Pull Force Gauge Meter
NK-10
Shenzhen Chuangxin Instruments Co., Ltd.
*This push pull force gauge Easy to be operated and can be installed with all kinds of test stands and clamps.*Peak holding function and continuous.*One year free maintenance.*Compact and artistic packing, easy to transit and stock.*Two kind of unit dual show at the same time,*don't need unit conversion. *NK Series: Newton and Kilogram dual unit; *NLB Series: Newton and Pound dual unit; *ALB: Pound and Kilogram dual unit.*Needle indicates, easy to read, high accuracy.
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Mechanical Force Gauges
AMETEK Sensors, Test & Calibration
The mechanical force gauges from Chatillon offer high precision compression testing (Push) and tensile testing (Pull) at a low cost on a wide range of testing applications.
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Light Sheet Microscopes
Life science research can place high demands on your imaging capabilities: Sometimes you need to image whole living model organisms, tissues and cells as they develop. Or you may want to observe subcellular dynamics in living samples over hours and even days. Light sheet fluorescence microscopy (LSFM) with its unique illumination principle is ideal for fast and gentle imaging of such specimens.
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Crimp Force Monitor
638007950
The crimp force monitor measures the force signature of a crimped terminal and compares it to a reference crimp. Depending on the limits programmed, the measurement will pass, fail, or be suspect.
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Microscope Cameras
Leica microscope cameras are remarkable for their fast live image speeds, short reaction times, high pixel resolution, and clear contrast. They can be installed on many of the Leica microscopes and macroscopes.
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3U CompactPCI Quad-Core Intel Atom® Processor Blade
cPCI-3620
The ADLINK cPCI-3620 Series is a 3U CompactPCI® processor blade featuring a quad-core 4th generation Intel® Atom SOC and soldered DDR3L-1333 ECC memory up to 4GB.
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Centor Star Touch, Advanced touchscreen force gauge
CNR CT
Functionality, accuracy, and precision formerly reserved for expensive and complex material testing equipment are now available with Andilog Force Gauges. The functionality of material testers previously reserved for research or development applications are now available to the production floor with the introduction of the Centor Touch Force Gauge.
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Air Force
Alpha 4314 AF
4314AF introduces an added safety feature that prevents the possibility of having the charging adapter connected while using the instrument for measurements. A 6-pin Mil-Spec circular connector on the front panel of the 4314AF replaces the four-terminal banana jacks and the battery charger jack. Four of the front panel connector pins are used to mate with the measurement adapter cable and the other two pins are for the battery charging cable adapter. By using separate adapter cables for measurements and charging of the batteries, it ensures that the charge circuit cannot be activated at the same time as measurements are being made.
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High Force Type Spring Probes
Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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Pressure / Force Sensors
Panasonic Industrial Devices Sales Company of America
Panasonic offers high precision Pressure Sensors for industrial, medical, clean room and other gauge equipment uses. Some include a built-in amplifier and compensating circuit in a compact, low and high pressure Sensor with high accuracy and reliability.
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Digital Video Inspection Microscope
Contamination is the first reason for troubleshooting optical networks. Proactive inspection and cleaning of fibre connectors can prevent poor signal performance, damage to equipment, and network downtime. DIAMOND’s Video Microscope Kit contains all necessary tools for proper inspection and cleaning of the connector’s front-faces to help ensure optimal connector performance.
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3D Measuring Laser Microscope
LEXT OLS5000
The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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Laser Scanning Microscope
OLS4100
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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ATOM Handler
The ATOM-IC Handler is a benchtop handler designed for use on engineering test floors and in development operations. Its innovative design allows for maximum flexibility and minimum cost and maintenance.
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Fiber Microscope
WL-C200S
The WL-C series fiber microscopes use coaxial illumination to provide users with maximum detail. It easily can detect the finest scratches and contamination, making it ideal for critically inspecting polish quality.
