Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Mechanical Force Gauges
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The mechanical force gauges from Chatillon offer high precision compression testing (Push) and tensile testing (Pull) at a low cost on a wide range of testing applications.
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Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Confocal Raman Microscope
LabRAM HR Evolution
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The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
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MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Microscope Automation
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Prior Scientific is the world leader in microscope automation, microscope automated precision components and customized sub-assemblies. We offer a wide range of off-the-shelf components such as XY motorized stages, Z focus motors and translation stages, high-resolution microscope stage controllers and robotic slide loaders as well as high-intensity bright field and fluorescence illumination sources.
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Microscope Cameras
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Leica microscope cameras are remarkable for their fast live image speeds, short reaction times, high pixel resolution, and clear contrast. They can be installed on many of the Leica microscopes and macroscopes.
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Force Sensors
FlexiForce
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FlexiForce™ force sensors can measure force between almost any two surfaces and are durable enough to stand up to most environments. Our sensors are available off-the-shelf for prototyping or can be customized to meet the specific needs of your product design and application requirements. See below for sensor specifications.
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High-end Transmission Electron Microscope
CryoARM
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JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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Atomic Absorption Spectrophotometer
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Atomic Absorption Spectrophotometer (AAS) is a kind of instrument for the inorganic analysis. It is widely used in environmental protection, medicine, sanitation, metallurgy, geology and petrochemical industry fields for micro and trace analysis. Atomic Absorption Spectrophotometer can analyze more than seventy kinds of elements. With the development of instrument accessories and analyzing technology, more objects, from element to morphology and from nonmetallic anion to gas-phase molecule, could be analyzed directly or indirectly.
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General Purpose Quartz Force Sensors
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General purpose force sensors are offered in either stud or axial mounted configurations. They are internally pre-loaded and can be used for dynamic compression, tension, and impact force measurements. Tapped mounting holes on both ends of the radial connector style support link, platform, integrated link, and free-standing installations. The axial mounted type offers protection of the electrical connector and sensor cable from potential damage during drop testing and in free-standing installations. Supplied impact caps facilitate impact and drop force measurements.
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Air Force
Alpha 4314 AF
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4314AF introduces an added safety feature that prevents the possibility of having the charging adapter connected while using the instrument for measurements. A 6-pin Mil-Spec circular connector on the front panel of the 4314AF replaces the four-terminal banana jacks and the battery charger jack. Four of the front panel connector pins are used to mate with the measurement adapter cable and the other two pins are for the battery charging cable adapter. By using separate adapter cables for measurements and charging of the batteries, it ensures that the charge circuit cannot be activated at the same time as measurements are being made.
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Atomic Absorption Systems
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Agilent leads the industry with innovative atomic absorption (AA) instruments. The entry-level SpectrAA 55B is ideal for labs in remote locations, while the 240FS and 280FS AA systems achieve the productivity of sequential ICP with Agilent’s Fast Sequential technology. The 240Z and 280Z AA systems provide superior performance and accurate background correction with transverse Zeeman technology. Our AA Duo systems feature unique simultaneous operation of both the flame and graphite furnace.
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Fluorescence Microscopes
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Bruker’s suite of fluorescence microscopy systems provides a full range of solutions for life science researchers. Our multiphoton imaging systems provide the imaging depth, speed and resolution required for intravital imaging applications in neuroscience, oncology and immunology. Our confocal systems enable cell biologists to study function and structure using live-cell imaging in cell cultures and invertebrate model organisms at speeds and durations previously not possible. Bruker’s super-resolution microscopes are setting new standards with quantitative single molecule localization which allows for the direct investigation of the molecular positions and distribution of proteins within the cellular environment. Our latest addition, Luxendo light-sheet microscopes, are revolutionizing long-term studies in developmental biology and investigation of dynamic processes in cell culture and small animal models.
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Inverted Microscope Systems
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Below you can see examples types for an inverted microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications. Many other automated microscopy systems are possible using our components.
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Fluorescence Microscopes
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We develop epifluorescence microscopes with a single fluorescence up to 16 fluorescences in a few seconds. Realized with standard cameras or highly sensitive sensors.
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Force Sensors
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HBK Force Sensors and Force Transducers with strain gauge or piezo technology measure static and dynamic tensile and compressive loads up to 20 MN - with virtually no displacement.
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Microscope Spectrophotometer
508 PV
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The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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Ergonomics Force Gauges
Series E
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Series E push / pull force gauges make job task analysis and ergonomics analysis simple and accurate, ideal for workplace design, strength assessment, and ergonomic studies. Series E presents the ergonomist and other professionals with a simple and economical testing solution. 100 lbF, 200 lbF and 500 lbF (500, 2,500, and 5,000 N) capacity force gauges are available, along with a wide range of attachments for various applications.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Portable Measuring Microscope
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Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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Universal ZIF (Zero-Insertion-Force) DIP Test Socket
Series X55X
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Universal Zero Insertion Force DIP Test Socket. All pin count sockets go into PCB with either .300 or .600 [7.62 to 15.24] centers. Sockets can be soldered into PCBs or plugged into any socket. Socket fits into Aries or any competitive test socket receptacle.
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Microscope Cameras
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High-performance USB microscope cameras with the latest SONY global and rolling-shutter sensors and advanced feature sets such as external trigger and readout functions.
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Economical Load and Force Measurement
ELF
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Tekscan's ELF force and load measurement system matches the market's need for an inexpensive load and force measurement system with Tekscan's ability to deliver innovative load and force measurement solutions. The system consists of data acquisition hardware, software, and FlexiForce B201 sensors.
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COM Express basic Type 7 with Intel Atom processor
COMe-bDV7
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The COM Express module COMe-bDV7 based on the Intel Atom processor C3000 series extends Kontron's product family of server-grade COM platforms. The COMe-bDV7 as an entry level platform is as a complementary product to the high performance class COMe-bBD7 equipped with the Intel Xeon processor D-1500 series. The COMe-bDV7 module features scalable CPU performance with up to 16 cores.
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Binocular Stereo Zoom Microscope Systems
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Our ELZ Series is not only a great choice for an entry level binocular microscope, but it’s cost effective and compact, as well as have a zoom range of 3.5x – 120x with options and a FOV of 67mm – 6mm with options. Our SSZ-II Series, which is a user friendly stereo zoom microscope, has a zoom range of 2x – 180x with options and a FOV of 109mm – 1.3mm with options.
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Rapid Automated Modular Microscope
RAMM
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Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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High Power Temperature Forcing System
MaxTC G4
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NEW G4– MaxTC is our premium Temperature Forcing System product, specifically designed for industry needs as a result of customer´s feedback from the Flex-TC. Its powerful cooling force (90W @ -40°C), rapid transition rates (75°C /min) and remote control capabilities will provide solutions to all semiconductor testing needs. MaxTC is compact, ultra quiet (55 d BA) and fits into any laboratory. A premium product at amazing value.
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Sapphire 3D Microscope
WDI-2000
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The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
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Digital Microscope
VHX-6000 Series
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Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
