Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Autofocus Optical Fiber Microscope - AFM-700
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Shanghai Fibretool Technology Co.,Ltd.
The AFM-700 is an autofocusing optical fiber microscope.
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Product
Atomic Absorption Spectrometer
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Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.
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Product
Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
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The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Force Tensiometers
Sigma 702ET
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The Sigma 702ET Transformer Oil Analyzer has been specifically designed to guide the user through the measurement of interfacial tension of transformer oil according to relevant standards.
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
3-Component Quartz Force Rings
260 Series
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Three-component quartz force ring sensors are capable of simultaneously measuring dynamic force in three orthogonal directions (X, Y, and Z). They contain three sets of quartz plates that are stacked in a preloaded arrangement. Each set responds to the vector component of an applied force acting along its sensitive axis. 3-component ring force sensors must be statically preloaded for optimum performance. Preloading provides the sensing elements with the compressive loading required to allow the proper transmission of shear forces. Versions are available with ranges up to 10k lb (45k N) in the z-axis (perpendicular to the top surface), and up to 4000 lb (18k N) in the x-and y (shear) axes. Both ICP® and charge output styles are available.
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Product
Rugged Conduction Cooled 3U CompactPCI Processor Blade with Quad-Core Intel® Atom™ Processor
CT-3620
Processor Blade
The ADLINK CT-3620 Series is a Rugged Conduction-Cooled 3U CompactPCI processor blade in single-slot (4HP) width form factor featuring a quad-core Intel® Atom™ SoC and soldered DDR3L-1333 ECC memory up to 4GB. Graphics is integrated graphics on the CPU and storage is provided by an onboard 32GB SSD. Rear IO signals include 2x GbE, 1x USB 2.0, VGA, 2x COM, and 1x SATA 3Gb/s, providing for expansion with an optional Rear Transition Module (RTM).
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Microscopes
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Olympus is a leading manufacturer of microscopes for life science and industry. With over 100 years of experience developing microscopes, we offer innovative optical solutions for many applications. Explore our microscopes for education, training, laboratories, and leading-edge research in the life science fields, such as pathology and cytology.
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ForceTest Force Measuring Software
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AMETEK Sensors, Test & Calibration
The ForceTest software interfaces directly with your digital force gauge enabling you to automatically capture tests and graphs on a personal computer. Test results and graph can be monitored directly on the live screen in real time while the test is being performed.
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Hydraulic Force Gauges
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The hydraulic force gauges from Erichsen are a low cost solution for obtaining general force measurements. With a wide range of styles and sizes, these force gauges are popular in many industries ─ particularly for use in hazardous environments. The hydraulic force gauges can be used for occasional force checks, continuous loading, or permanent installation.
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3.5” Embedded SBC With Intel® Atom® X5-E3940 Processor, LVDS, HDMI, 2 GbE LANs And Audio
CAPA310
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The CAPA310 features the onboard quad-core Intel® Atom® x5-E3940 processor (codename: Apollo Lake). The fanless small form factor embedded board is highly reliable with an extended operating temperature range of -40°C to +80°C and a wide range power input of 12V to 24V DC. This industrial-grade 3.5-inch embedded board is feature-rich and expandable, with stunning graphical performance. The CAPA310 is a highly versatile platform designed for Industrial IoT and intelligent systems such as industrial automation, self-service terminals, digital signage, POS/kiosk displays, medical, and more. To ensure flexible configuration and expandability, the CAPA310 has an emphasis on expandability with a full-size PCIe Mini Card slot and an optional ZIO connector for additional PCIe, LPC, USB and SMBus. Additionally, this compact embedded board features the Intel® integrated Gfx graphic engine to deliver high-resolution HD support for display interfaces: HDMI, LVDS and optional VGA. It is perfectly suited for gaming and signage applications.
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COM Express Type 10 Mini Module With Intel® Atom™ E3800 Family
CEM846
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The CEM846 COM Express type 10 Mini module is powered by the Intel® Atom™ processor E3800 family (codename: Bay Trail) with Intel® HD graphics (Gen 7with 4EU) engine. The CEM846 addresses the need for modular and small form factor computing platform that provides flexibility and scalability, and aimed at operating in an extended range of temperature. The computer on module is only 84mm x 55 mm form factor which supports onboard 4 GB DDR3L memory, wide voltage, rich I/O, and four lanes of PCle interfaces. From all these features together, the Intel® Atom™-based COM Express type 10 CPU module can be widely applied to IIoT (Industrial Internet of Things), medical, transportation, security, military, portable device and many more.
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Digital Microscope Accessories
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Variety of extra accessories , such as macro lenses, remote control consoles, illuminations, image/video capture, software, stands and stages are available for Inspectis digital microscopes.
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IC-3120, 1.91 GHz Intel Atom Quad-Core Processor, 2-GigE Port Industrial Controller
784959-01
Controller
The IC‑3120 is a compact and rugged industrial controller that withstands the harsh environments common in automation, supervisory control, distributed control, and industrial embedded OEM applications. The IC‑3120 offers two Gigabit Ethernet ports with Power over Ethernet (PoE) technology, FPGA-based I/O capabilities, and network connectivity for distributed control applications. The advanced features include the ability to synchronize image inspection results with industrial I/O and configure hardware-timed network triggers to trigger camera acquisition, motion control, or data acquisition. You can use the advanced FPGA personality that is shipped with the system or customize the FPGA functionality using the LabVIEW FPGA Module.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Rack Mounted SolsTiS System for Cold Atom Experiments
SolsTiS-Rack Mounted
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The rack mounted SolsTiS system is designed for the operation of portable cold atom experiments, although it is equally at home in a laboratory where space is limited. The pre-mounted system enables rapid set-up of desired experiments and investigations, minimising downtime due to laser assembly and integration. The system can be customised to your requirements with additional optics packages.
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Force Balanced Accelerometer
PA-23, PA-23BH, S-230
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The Geotech Model S-230 is a high resolution, 1-component, force balanced accelerometer capable of meeting the noise and stability requirements of the most demanding seismic studies. It features a very wide frequency response (DC to 90 Hz) and an internal calibration coil. Three S-230 accelerometers are packaged as a borehole 3-component unit (Model PA-23BH) and as a surface 3-component unit (Model PA-23). PA-23BH can be submerged up to 100 m depth.
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1U Rackmount Network Appliance Platform With Intel® Atom® Processor C3558/C3758 And Up To 14 LAN
NA363R
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The NA363R is a reliable 1U rackmount network appliance platform offering Intel® QuickAssist technology and high processing performance through the Intel® Atom® processor C3558/C3758 (Denverton). It comes with six 10/100/1000 Mbps LAN ports using Intel® i210 Ethernet controller and one expandable LAN module slot for a maximum of fourteen LAN ports. It features two pairs of latch-type LAN bypass functions to protect important communications during power outages as well as BIOS console redirection for efficient management. The network security appliance provides high security and reliability with power-efficient for VPN, network bandwidth controller, firewall and UTM applications.
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SC6-TANGO cPCI® Serial Intel® Atom™ E3900 Series SBC
SC6-TANGO
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The SC6-TANGO is a low power CompactPCI® Serial CPU board, based on an Intel® Atom™ E39xx-series System-on-Chip processor (Apollo Lake APL-I).
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Portable Microscope With XY Stage, X150 2mm Field Of View
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*Veterinary Worm Egg Counting*Counting of algae and other samples*Easy positioning of the sample*Methodically scanning of slides and counting chambers*Works with standard microscope slides and counting chambers (25x75mm or 1”x2”) and with 32mm wide counting chambers*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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Fluorescence Microscope
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Our range of products include classic fl fluorescence microscope, optima fl led fluorescence microscope, optima fl fluorescence microscope, ultima fl fluorescent microscope, zoomstar fl fluorescence microscope and crown fl led trinocular medical microscope.
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Carton Force Analyser
CFA
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By measuring the stiffness of the substrate and crease bending resistance the user can optimise cartons for faster running and packaging speeds. The instrument allows individual creases to be analysed identifying problem areas in packaging design or manufacture. Industry research indicates that the packaging speeds of pre-glued skillets is governed by the energy required to open creases. The Hanatek CFA is the first instrument to isolate and accurately measure this key parameter The instrument measures: Bending resistance, bending moment, board stiffness, crease recovery stiffness, crease folding force, crease opening force.
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Product
Manual Test Shell For Push And Pull Force Gauge
HST-S
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Shenzhen Chuangxin Instruments Co., Ltd.
HST Manual Test Stand have HST-J and HST-S model, is specially designed to match all kinds of Push Pull Gauge and applied in tension, compression, insertion, withdraw and fracture test.
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Product
Verification Of Maximum Withdrawal Force Test Apparatus
IEC60884 FIG 18
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Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG 18 verification of maximum withdrawal force test apparatusThis device complies with the requirements of GB 189.1-2008 Figure 18/19, IEC884 Figure 18/19, VDE0620, etc. It is suitable for checking the maximum force required to pull the plug out of the socket and the single pole pin pulled out from the socket assembly. Whether the minimum force required is within the range specified by
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
