Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Nanomechanical Test Instruments for Microscopes
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Widefield Confocal Microscope
Smartproof 5
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The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Quartz Impact Force Sensors
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Impact-style sensors are specifically designed for impact force measurements. The sensor is typically mounted in a free-standing manner with the installed impact cap directed toward the oncoming object with which it will collide.
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Force Gauge
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Shenzhen Graigar Technology Co.,Ltd.
A force gauge is a small measuring instrument used across all industries to measure the force during a push or pull test. Applications exist in research and development, laboratory, quality, production and field environment.
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Load Cells & Force Transducers
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BLH and Nobel Weighing Systems offer a wide variety of load cells and force transducers, ranging from the unique KIS load cell and weigh module to the VPG transducers range of products. Our many years of experience, our state-of-the-art instruments, and the exceptionally broad range of components that go into our systems allow us to deliver high-quality solutions tailored to your needs.
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Microscope Software
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Choosing the right software for your Vision Engineering microscope is just as important choosing the hardware. Whatever you need and however you like to work, you’ll find the right application software here.
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Breaking Force Testers
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Break Force Tester is applied for break force test of the ampoule, lipstick, lip cream and other materials.
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Imaging Mass Microscope
iMScope QT
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Inheriting the concept of a mass spectrometer equipped with an optical microscope from the iMScope series, the iMScope QT is also Shimadzu's flagship model for MS imaging with a Q-TOF MS(LCMS-9030).
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Rubidium Atomic Audio Clock
PERF10
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Stanford Research Systems, Inc.
Perfection is a high standard - but your studio clocks deserve nothing less. That''s why we designed the PERF10, to offer audio professionals and demanding audiophiles a frequency reference of staggering accuracy and unmatched stability.
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Closing Force Meter
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Maschinenbau Haldenwang GmbH & Co. KG.
Is used to conveniently and reliably determine the closing force of externally operated service doors and locking devices.
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Forced Air Cryogenic Cooling
FixTreme TE
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FixTremeTE is a cost-effective standalone alternative to mechanical or forced air cryogenic cooling. When paired with a Testforce dbGuard Series RF shielding test enclosure, performing at temperature RF & microwave functional testing is simple.
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Force Transducers
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Metra Mess- und Frequenztechnik in Radebeul e.K.
Piezoelectric force transducers are suited for the measurement of tensile and compression force.
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Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Force Calibration
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Trescal provides full Force Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Force Calibration services can be delivered at your site or at our lab. Accreditations for our force calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Metallurgical Microscope
BXJ900 Series
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Nanjing Kozo Optical and Electronical Instrument Co., Ltd.
LCD Metallurgical microscope is one new microscope, it is suitable to observe the sample while with the sharp image.
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Microscope Software
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Discover more with Olympus microscope software. With intuitive operations that offer a seamless workflow, Olympus microscope software supports your ever-evolving research needs.
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Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Acoustic Microscope
AMI D9650Z
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The D9650Z incorporates the latest C-SAM technology with enhanced features to accommodate the testing of Power Modules as well as performing standard C-SAM operations. This new system configuration is optimized for inspection of heatsink bond integrity, thickness of bond layer and wire bond welds. Powered by our Sonolytics software platform with PolyGate technology, the D9650Z is ideal for failure analysis, process development and QC screening in low-volume production environments.
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Force Load Cells
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TE Connectivity (TE) offers load cell assemblies for test and measurement applications that require high performance or unique packaging. Our broad range of packaged load cells feature foil strain gages enabling OEM's to measure force with low cost and high reliability. The gages produce a high level of output signal for a low operating stain using inorganic materials to offer long term stability. Load cells are gaged in a variety of materials from high strength stainless steel to special alloys.
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400x Bench-Top Optical Fiber Microscope
FTM-400X
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Shanghai Fibretool Technology Co.,Ltd.
With coaxial illumination optic magnify system, FTM-400X can easily find the slight defects and scratches on fiber endface. High resolution image sensor and 8"pure black and white digital TFT LCD can show the most real details of fiber endface.This is an integrated fiber endface inspector, it combines optical microscope and monitor in a body other than separate designs. It has clear images and long life time. it has series of adaptors for various kinds of connectors such as multi fiber connectors, optical components. It is an essential instrument for optical manufacturing.
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Temperature Controlled Microscope Stages
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Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
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Standard Flexiforce Sensors for Force Measurement
FlexiForce
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FlexiForce force sensors are ultra-thin and flexible printed circuits, which can be easily integrated into force measurement applications. These sensors are available for purchase in our online store.
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Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Inverted Raman Microscope
XploRA INV
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The XploRA INV inverted Raman microscope combines the automation features and small footprint of the standard XploRA™ Raman microscope with the unique sampling capabilities of an inverted microscope, especially important for demanding biological applications.
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Spectroscopy Upgrade for Any Microscope
SMS
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Get a simple upgrade to your existing microscope, or a turnkey microspectrophotometer system that works out-of-the-box.
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48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
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High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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Shear Beam Force Sensors For Pull/push Direction
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INELTA Sensorsysteme GmbH & Co. KG
Inelta Force Sensors operate with foil strain gauges
