Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Microscopes
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Probing Solutions offers Microscopes made by Azoom, Excelitas, Meiji, Leica, Mitutoyo, and Motic. To order Microscopes, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Compact Hydraulic Vibrator Force Simulator
JF Series
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The JF Series Force Simulator was developed with the emphasis on light weight, compact size and ease-of-use as a general-purpose, compact jack for the Servopulser system. Testing systems installed with the Force Simulator can easily perform endurance, fatigue and simulation tests on small structural members and various other structural members, which helps improve the logical design and reliability of products.
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Intel Atom® Embedded Controller
AMAX-5570E V2
Embedded Controller
Optimized BIOS & Embedded OS for 1ms real-time control (Windows & Linux)Achieves 32-axis motion control with 500 μs EtherCAT cycle time under LinuxOPC UA and Modbus TCP/RTU as IT connectivity enabled by CODESYSEtherCAT, PROFINET, Ethernet I/P, and CANopen are OT connectivity feature enabled by CODESYSIntel Atom® quad-core x6414RE processorSystem I/O with 4 x GbE, 2 x USB, 2 x Isolated COM, 1 x HDMI, 1 x 5 pin terminal (dual power input)AMAX-5000 EtherCAT Slice I/O expansion and AMAX-5400 PCIe modules, optional for left side (max.2)iDAQ-964 modules, optional for left sideEMC compliance for energy management and Battery Energy Storage System (IEC-61000-4 Industrial requirement)
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Thermal Microscope Stage For Petri Dish
TS-4SMP
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With our TS-4SMP Thermal Stage for Petri Dish, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C. The collar on the stage is designed to accommodate a 35mm 'Nunc' petri dish. The collar may also be removed for use with slides.
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Deep Ultraviolet Observation System for Microscope
U-UVF248
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Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Infrared Microscope
DDR200 & DDR300
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The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
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High Force DMA
DMA+ Series
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*The new DMA+ series instruments are dynamic testing machines based on a innovative concept of one-piece high rigidity test frame.*They are dedicated to the accurate analysis of the viscoelastic properties of most advanced materials.
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Force Sensors, Load Cells, Shear Beam
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INELTA Sensorsysteme GmbH & Co. KG
Exact force measurement and weight measurement
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Atomic Absorption Spectrometry
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Is an easy, high-throughput, and inexpensive technology used primarily to analyze elements in solution.
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Stereoscopic Zoom Microscope Automation
SZ-2000
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Applied Scientific Instrumentation
Based on ASI's proven DC servo motor technology, the SZ-2000 automates stereo zoom microscopes. The unit can be configured for motorized focus only, motorized focus with automated zoom control, or motorized focus with automated zoom control and an automated XY translation stage. The Z axis focus resolution varies slightly depending upon the model of the microscope, with 0.8 microns being the smallest step size available on a Nikon SMZ800.
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General Purpose Quartz Force Sensors
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General purpose force sensors are offered in either stud or axial mounted configurations. They are internally pre-loaded and can be used for dynamic compression, tension, and impact force measurements. Tapped mounting holes on both ends of the radial connector style support link, platform, integrated link, and free-standing installations. The axial mounted type offers protection of the electrical connector and sensor cable from potential damage during drop testing and in free-standing installations. Supplied impact caps facilitate impact and drop force measurements.
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Modular Infinity Microscope
MIM
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Force Sensors
FlexiForce
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FlexiForce™ force sensors can measure force between almost any two surfaces and are durable enough to stand up to most environments. Our sensors are available off-the-shelf for prototyping or can be customized to meet the specific needs of your product design and application requirements. See below for sensor specifications.
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Widefield Microscopes
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Widefield microscopes are available in different versions. Choose an upright microscope if your task is to analyze zebrafish embryos, stained tissue selections or brain slices. For tissue culture and quick assessments in routine research, the inverted microscope might be the better choice.
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Microwave Plasma Atomic Emission Spectroscopy / MP-AES Systems
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Agilent’s industry-leading microwave plasma-atomic emission spectrometer (MP-AES) systems are powerful, cost-efficient and easy-to-use for a wide range of applications from routine analysis to complex precious metals analysis. By running on air, Agilent MP-AES systems both cost less and are safer than alternative methods that rely on flammable gases. The innovative Agilent 4210 MP-AES system offers higher sensitivity and faster throughput capabilities than flame atomic absorption.
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Force Tensiometer
K20
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Our Force Tensiometer – K20 is a robust, semi-automatic instrument for the precise measurement of surface tension and interfacial tension. Using the ring and plate method as the main tensiometric methods, it produces reliable measurements for the routine quality assurance of your surfactant solutions and interfacial processes.
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Force Sensors In S-form For Pull/push Direction
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INELTA Sensorsysteme GmbH & Co. KG
With very small space requirement and high breaking force made from tempered stainless steel, suitable for measuring medium to high forces. Easy integration and mounting by threaded bores.
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Toolmakers Microscope
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Sinowon Innovation Metrology Manufacture Ltd.
It is widely used in mechanical, meter, electronic and light industry; university, Institute and metrology department. The measuring profile projector can detect the contour dimension and surface shape of variety complex workpiece, such as templates, punching pieces, cams, threads, gears, molding milling cutters.
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Bond Force Measurement And Calibration Systems
BFS-20
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Based on its design and easy handling it can be used also on other brands to measure the bond force.
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Thermal Microscope Stage For Large Petri Dish
TS-4LMP
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Thermal Microscope Stage For Large Petri Dish
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Near-field Scanning Optical Microscope
NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Digital Microscopes
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Great for capturing and sharing digital information with anyone, anywhere, digital microscopes by Vision Engineering are built with quality to last a lifetime. Powerful and easy to use, their versatile, operator-friendly design means they can be repurposed as your needs change, protecting your return on investment.
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Microscope Automation
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Prior Scientific is the world leader in microscope automation, microscope automated precision components and customized sub-assemblies. We offer a wide range of off-the-shelf components such as XY motorized stages, Z focus motors and translation stages, high-resolution microscope stage controllers and robotic slide loaders as well as high-intensity bright field and fluorescence illumination sources.
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Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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Ultraschallmikroskop And Scanning Acoustic Microscopes
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Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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Light Sheet Microscopes
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Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
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Microscopic Melting Point Meter
DRK8030
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Shandong Drick Instruments Co., Ltd.
Heat transfer material is a silicone oil, in full compliance with USP standard measurement method can simultaneously measure three samples, direct observation of the melting process can be measured colored samples.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
